Claims
- 1. A recording material comprising a support and a thermosensitive element comprising silver palmitate, an organic reducing agent therefor in thermal working relationship therewith and a binder, wherein said silver palmitate is not associated with mercury and/or lead ions and when said recording material is irradiated with a copper K.alpha..sub.1 X-ray source the ratio of the sum of the peak heights of the X-ray diffraction lines attributable to silver palmitate at Bragg angles, 2.THETA., of 4.01.degree., 6.049.degree., 8.031.degree., 10.06.degree., 12.08.degree. and 14.09.degree. to the sum of the peak heights of the X-ray diffraction lines at Bragg angles, 2.THETA., of 25.60.degree., 35.16.degree. and 43.40.degree. of NIST standard 1976, rhombohedral Al.sub.2 O.sub.3, determined with the same X-ray diffractometer in the same state of adjustment on a sample of said recording material and a sample of said NIST standard 1976 cut to fit a sample holder of said X-ray diffractometer, divided by the square root of the quantity of silver in the recording material, expressed in g per m.sup.2, is greater than 3.09 m/g.sup.0.5.
- 2. Recording material according to claim 1, wherein said ratio, divided by the square root of the quantity of silver in the recording material expressed in g per m.sup.2 is greater than 3.3 m/g.sup.0.5.
- 3. Recording material according to claim 1, wherein said thermosensitive element is provided with a protective layer.
- 4. Recording material according to claim 1, wherein said thermosensitive element further comprises a photosensitive species capable upon exposure of forming a species capable of catalyzing reduction of said silver palmitate.
- 5. A recording process comprising the steps of: (i) bringing an outermost layer of a recording material, including a support and a thermosensitive element containing silver palmitate, an organic reducing agent therefor in thermal working relationship therewith and a binder, into proximity with a heat source; and (ii) applying heat from said heat source imagewise to said recording material while maintaining proximity to said heat source to produce an image; and (iii) removing said recording material from said heat source, wherein said silver palmitate is not associated with mercury and/or lead ions and when said recording material is irradiated with a copper K.alpha..sub.1 X-ray source the ratio of the sum of the peak heights of the X-ray diffraction lines attributable to silver palmitate at Bragg angles, 2.THETA., of 4.01.degree., 6.049.degree., 8.031.degree., 10.06.degree., 12.08.degree. and 14.09.degree. to the sum of the peak heights of the X-ray diffraction lines at Bragg angles, 2.THETA., of 25.60.degree., 35.16.degree. and 43.40.degree. of NIST standard 1976, rhombohedral Al.sub.2 O.sub.3, determined with the same X-ray diffractometer in the same state of adjustment on a sample of said recording material and a sample of said NIST standard 1976 cut to fit a sample holder of said X-ray diffractometer, divided by the square root of the quantity of silver in the recording material, expressed in g per m.sup.2, is greater than 3.09 m/g.sup.0.5.
- 6. Recording process according to claim 5, wherein said heat source is a thin film thermal head.
Priority Claims (1)
Number |
Date |
Country |
Kind |
98201961 |
Jun 1998 |
EPX |
|
Parent Case Info
This application claims benefits of Provisional Application No. 60/096,562 filed Aug. 14, 1998.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
5891616 |
Gilliams et al. |
Apr 1999 |
|
Foreign Referenced Citations (2)
Number |
Date |
Country |
754969 |
Mar 1979 |
EPX |
848286 |
Jul 1981 |
EPX |