Number | Date | Country | Kind |
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89 16338 | Dec 1989 | FRX |
This is a continuation of application Ser. No. 07/625,846, filed Dec. 11, 1990, now abandoned.
Number | Name | Date | Kind |
---|---|---|---|
4601019 | Shah et al. | Jul 1986 | |
5107464 | Sahara et al. | Apr 1992 | |
5140597 | Araki | Aug 1992 |
Number | Date | Country |
---|---|---|
0104120 | Mar 1984 | EPX |
2611301 | Aug 1988 | FRX |
9003033 | Mar 1990 | WOX |
Entry |
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Nishimura et al, "A Redundancy Test-Time Reduction Technique in 1-Mbit DRAM with a Multibit Test Mode", IEEE Journal of Solid-State Circuits, vol. 24, No. 1, Feb. 1989, pp. 43-49, IEEE, New York, USA. |
Number | Date | Country | |
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Parent | 625846 | Dec 1990 |