Patent Application
20080122464
The present invention relates to a test probe and particularly to a replaceable test probe that has an anchoring sleeve on the periphery of a probe body.
Probes are commonly used for testing finished electronic elements and circuit boards. A probe is mounted onto a test feature to be in contact with an electronic element or circuit board to send test results through a conductive wire to a computer to detect whether defects exist on a testing object.
R.O.C. patent No. M271159 entitled “Improved test feature” discloses a probe and a test feature. It mainly includes a base on the test feature that has a needle panel, a clipping plate, a top plate and a plurality of probes mounted thereon. The needle panel has needle openings corresponding to testing spots of a testing object (such as printed circuit board). The probes include a probe body, a spring and a needle. The probe body is inserted into the needle opening, and has a conductive wire on one end to transmit signals to a computer. The spring provides an extensible force to give the needle an elastic returning force in the probe body. Hence the probe can be anchored on the needle panel. The clipping plate and top plate have respectively apertures corresponding to the needle openings of the needle panel. The needles run through the apertures of the clipping plate and top plate, and extended outside the top plate. The testing object is located above the top plate. A test machine moves the test spots of the testing object in contact with the needles. Electric signals are transmitted through the conductive wire connecting to the probe body to the test machine to finish test operation.
After the probe has been used for testing and operation for a period of time, the needle tends to be worn out. The entire probe has to be replaced. The base of the test feature has to be disassembled to do replacement. After disassembly of the test feature, technicians have to find out damage locations of the probe to replace and anchor the entire probe. Then the test feature has to be assembled again. Such a replacement process for the probe is tedious and time-consuming. Disassembly and assembly of the teat feature are especially troublesome. It lowers the total efficiency of test operation.
It is an object of the present invention to provide a replaceable probe that can be replaced quickly. In the event that a probe body is damaged, it can be removed from a test feature without disassembling the test feature. Therefore replacement of the probe body can be done rapidly.
To achieve the foregoing object, the invention includes a hollow probe body, an elastic element located in the probe body, and at least one needle inserting into the probe body. The needle presses the elastic element and is retractable in the probe body. The probe body is surrounded by a hollow sleeve which has an inner wall to form an anchoring relationship with the probe body. The sleeve has an opening on one end to receive the needle and an open side on other end to allow the probe to escape the sleeve. The probe body is anchored in a test feature through the sleeve, and can be removed from the sleeve to be replaced rapidly.
The foregoing, as well as additional objects, features and advantages of the invention will be more readily apparent from the following detailed description, which proceeds with reference to the accompanying drawings.
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While the preferred embodiment of the invention has been set forth for the purpose of disclosure, modifications of the disclosed embodiment of the invention as well as other embodiments thereof may occur to those skilled in the art. Accordingly, the appended claims are intended to cover all embodiments which do not depart from the spirit and scope of the invention.
