CPC
G01R3/00
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Patent Grant
National Technology & Engineering Solutions of Sandia, LLC
Felipe Wilches Bernal
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
SK hynix Inc.
Hyun Seung Kim
G01 - MEASURING TESTING
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Patent Grant
POET Technologies, Inc.
Lucas Soldano
G01 - MEASURING TESTING
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Patent Grant
Palitronica Inc.
Carlos Moreno
G01 - MEASURING TESTING
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Patent Grant
Robert Bosch GmbH
Christoph Klee
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Robert Bosch GmbH
Christian Simonis
G01 - MEASURING TESTING
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Southeast University
Long Zhang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Rensselaer Polytechnic Institute
Sufei Shi
G01 - MEASURING TESTING
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Hyperfine Operations, Inc.
Eddy B. Boskamp
G01 - MEASURING TESTING
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Patent Grant
Novocure GmbH
Reuven Ruby Shamir
G06 - COMPUTING CALCULATING COUNTING
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Volvo Truck Corporation
Faisal Altaf
B60 - VEHICLES IN GENERAL
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Patent Grant
Dell Products L.P.
Sandor Farkas
G01 - MEASURING TESTING
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Texas Instruments Incorporated
Weibing Jing
G01 - MEASURING TESTING
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Patent Grant
Sonera, Inc.
Dominic Labanowski
G01 - MEASURING TESTING
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SIEMENS HEALTHINEERS AG
Yan Tu Huang
G01 - MEASURING TESTING
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Patent Grant
Altera Corporation
Shiva Rao
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Viavi Solutions Inc.
Chang-Hyun Park
G01 - MEASURING TESTING
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BEIJING GMINE VISION TECHNOLOGIES LTD.
Wei Chen
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
The Hong Kong Polytechnic University
Jing Cai
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Pine River Innovations, LLC
Andrew Vincent Johnson
G01 - MEASURING TESTING
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Patent Grant
Toyota Jidosha Kabushiki Kaisha
Yu Sasaki
G01 - MEASURING TESTING
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Patent Grant
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
G01 - MEASURING TESTING
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SAFRAN ELECTRICAL & POWER
Frédéric Meer
G01 - MEASURING TESTING
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Yokogawa Electric Corporation
Kazuma Takenaka
G01 - MEASURING TESTING
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Patent Grant
Infineon Technologies AG
Milan Agrawal
G01 - MEASURING TESTING
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Patent Grant
Olea Medical
Benoît Gy
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Tatsuya Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Infineon Technologies AG
Rainer Markus Schaller
G01 - MEASURING TESTING
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Patent Grant
Siemens Healthineers AG
Michael Köhler
G01 - MEASURING TESTING
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Patent Grant
Infineon Technologies Austria AG
Diego Raffo
G01 - MEASURING TESTING
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Patent Application
Holobeam Technologies Inc.
Gene Dolgoff
G01 - MEASURING TESTING
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Patent Application
SEIKO EPSON CORPORATION
Kiminori NAKAJIMA
G01 - MEASURING TESTING
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Patent Application
Huawei Digital Power Technologies Co., Ltd.
Chen Wang
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Application
ALLEGRO MICROSYSTEMS, LLC
Rémy Lassalle-Balier
G01 - MEASURING TESTING
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Patent Application
Wisconsin Alumni Research Foundation
Aviad Hai
G01 - MEASURING TESTING
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Patent Application
Micron Technology, Inc.
Kunal R. Parekh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
KONE Corporation
Mikko Paakkinen
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Application
Taiwan Semiconductor Manufacturing company Ltd.
Ming Jun Li
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Korea Research Institute of Standards and Science
Kwon-Kyu YU
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
United Microelectronics Corp.
Yi-Fang Ting
G01 - MEASURING TESTING
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Patent Application
ASAHI KASEI MICRODEVICES CORPORATION
Masato INOUE
G01 - MEASURING TESTING
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Patent Application
Hyundai Motor Company
Wook Il JANG
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
International Business Machines Corporation
Allen HALL
G01 - MEASURING TESTING
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Patent Application
LG ENERGY SOLUTION, LTD.
Jun-Cheol Park
G01 - MEASURING TESTING
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Patent Application
TEXAS INSTRUMENTS INCORPORATED
Charles Parkhurst
G01 - MEASURING TESTING
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Patent Application
TEXAS INSTRUMENTS INCORPORATED
Keith Ryan Green
G01 - MEASURING TESTING
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Patent Application
ALLEGRO MICROSYSTEMS, LLC
Santiago Serrano Guisan
G01 - MEASURING TESTING
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Patent Application
The Medical College of Wisconsin, Inc.
Nikolai Jonas Mickevicius
G01 - MEASURING TESTING
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Patent Application
LitePoint Corporation
Chen Cao
G01 - MEASURING TESTING
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Patent Application
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
Rae Young KIM
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Board of Regents of the University of Texas System
Nitin TANDON
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Cisco Technology, Inc.
George Allan Zimmerman
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
New Power Plasma Co., Ltd.
Moon Que LEE
G01 - MEASURING TESTING
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Patent Application
CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
Xin LI
G01 - MEASURING TESTING
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Patent Application
Nanyang Technological University
Srikanth NARASIMALU
G01 - MEASURING TESTING
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Patent Application
Hong Kong Metropolitan University
Panpan Hu
G01 - MEASURING TESTING
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Patent Application
Garrett Transportation I Inc.
Abhijith Vikraman Pillai Santhamma
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Canon Medical Systems Corporation
Hidekazu TANAKA
G01 - MEASURING TESTING
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Patent Application
ELESTA GMBH
Raphael Möhr
G01 - MEASURING TESTING
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Patent Application
Toyota Jidosha Kabushiki Kaisha
Minoru HIDA
G01 - MEASURING TESTING
