1. Field of the Invention
This invention relates to electronic component structures, and, more particularly, to a resistor component having high reliability.
2. Description of Related Art
With the development of technology, the life cycle of electronic products gradually shorten. Electronic components manufacturers always pursue the minimization, low cost, high efficiency, or fast production process during the development of electronic components so that their products may be competitive in the market.
During the development of electronic components, except committing to upgrade the product efficacy, the manufacturers further prefer to occupy the market before others, therefore, product with cheap price and low cost becomes the objective people pursue no matter what kind of electronic components such as capacitor or resistor. As shown in
Therefore, how to find a simple production structure of a resistor component to provide a resistor component with high yield and low cost, particularly, present resistor components all have iron caps inlaid to provide heat diffusion, but there may be issues, for example, poor heat conductivity and incompletely sealed, thus how to solve the possible issues caused by electronic components with iron cap inlaid is a substantial objective to pursue.
In view of the above-mentioned problems of the prior art, the objective of the present invention is to provide a resistor component structure, which forms a structure by using a barrel plating method having the same effect with the prior iron cap method.
In order to achieve previous mentioned and other objectives, the present invention provides a resistor component, comprising: a ceramic bar having a film applied thereon, a protection layer formed on the film in a middle portion of the ceramic bar, an end plating layer formed on the film at two ends of the ceramic bar, an insulation layer formed on the protection layer; and a color coded marking formed on the insulation layer.
In an embodiment, the end plating layer comprises copper, tin, nickel, or a combination thereof, and is formed by the barrel plating method.
In another embodiment, the insulation layer is formed before the protection layer, and the resistance of the resistor component is adjusted by cutting the film, which is performed by a laser cutting machine or a laser slicer.
Compared with the prior art, the resistor component of the present invention does not apply the method with iron caps inlaid, but by barrel slating to form end slating having the same effect with the prior iron caps method. Not only has higher yield but decrease the cost, furthermore, by using barrel plating the present invention solves issues in the prior method including the joint between iron cap and ceramic bar may have a spacing and an incomplete sealed joint which may influence the electricity or cause the mismatch of thermal expansion. Therefore, the proposed resistor component with high yield and low cost in the present invention, simultaneously simplify the production process, is substantially beneficial to the structure and production of resistor components.
The invention can be more fully understood by reading the following detailed description of the preferred embodiments, with reference made to the accompanying drawings, wherein:
The following illustrative embodiments are provided to illustrate the disclosure of the present invention, these and other advantages and effects can be apparently understood by those in the art after reading the disclosure of this specification. The present invention can also be performed or applied by other different embodiments. The details of the specification may be on the basis of different points and applications, and numerous modifications and variations can be devised without departing from the spirit of the present invention.
It should be advised that the structure, ratio, and size as illustrated in this context are only used for the disclosure of this specification, provided for those in the art to understand and read, do not have substantial meaning technically. Any modification of the structure, change of the ratio relation, or adjustment of the size should be involved in the scope of the disclosure in the present invention without influencing the producible efficacy and the achievable objective of the present invention.
Please refer to
The structure of the resistor component in the present invention is shown in
In an embodiment, the end plating layer 23 comprises copper, tin, nickel, or a combination thereof, which is different from the prior inlaid iron caps method. In an embodiment, the end plating layer 23 is formed by the barrel plating method where the described barrel plating is one of the plating methods to form copper, tin, and nickel on the surface of two ends of the ceramic bar 20 by using the barrel plating method, and is advantageous to reduce the occurrence of pores or incompletely sealed joint to promote the resistor component yield and the product reliability.
In order to fully describe the forming method of the structure of the resistor component in the present invention, the following will specify the production process of the resistor component in the present invention with reference made to the accompanying
As shown in
As shown in
As shown in
As shown in
After the formation of the protection layer 22 in the middle portion of the ceramic bar 20 and the end plating layer 23 at the two ends of the ceramic bar 20, a resistance cutting process is performed on the resistor component. By the method using a laser cutting machine or a laser slicer to cut the film, the resistance of the resistor component can be adjusted to a certain value, and the protection layer 22 can be directly destroyed during the resistance cutting process without influencing the structure of the resistor component.
As shown in
As shown in
Compared with the prior art, the resistor component in this invention applies barrel plating method to form end plating layer which has the same effect with the prior iron caps method. Since the end plating layer is formed by barrel plating method, occurrence such as pores or incompletely sealed joint may be avoided, thus electricity influence, iron caps dropping out, or thermal expansion mismatch issues caused by incompletely sealed joint may be solved. Furthermore, the formation of pores will make the moisture easily enter and resistor component have poor heat diffusion causing the resistance shift at high temperature, therefore, the formation method of end plating layer in the present invention not only increase the yield of resistor component but also barrel plating has a lower cost than using iron caps. Simultaneously the possible defect of using iron caps can be avoided, thus the resistor component in the present invention substantially has high product reliability and value.
The foregoing descriptions of the detailed embodiments are only illustrated to disclose the features and functions of the present invention and not restrictive of the scope of the present invention. It should be understood to those in the art that all modifications and variations according to the spirit and principle in the disclosure of the present invention should fall within the scope of the appended claims.
Number | Date | Country | Kind |
---|---|---|---|
101224141 U | Dec 2012 | TW | national |
Number | Name | Date | Kind |
---|---|---|---|
2313853 | Veley | Mar 1943 | A |
2405449 | Robinson et al. | Aug 1946 | A |
3539309 | Helgeland | Nov 1970 | A |
3880609 | Caddock | Apr 1975 | A |
3881162 | Caddock | Apr 1975 | A |
3921119 | Caddock | Nov 1975 | A |
3982218 | Adler et al. | Sep 1976 | A |
4132971 | Caddock, Jr. | Jan 1979 | A |
4146957 | Toenshoff | Apr 1979 | A |
4159459 | Sease et al. | Jun 1979 | A |
4176336 | Van Den Berk et al. | Nov 1979 | A |
4213113 | Brandt et al. | Jul 1980 | A |
4665377 | Harpaintner | May 1987 | A |
4727350 | Ohkubo | Feb 1988 | A |
4866411 | Caddock | Sep 1989 | A |
4992772 | Kubota et al. | Feb 1991 | A |
5889459 | Hattori et al. | Mar 1999 | A |
5990781 | Kambara | Nov 1999 | A |
6070787 | Harada et al. | Jun 2000 | A |
6317024 | Orii | Nov 2001 | B1 |
6356184 | Doi et al. | Mar 2002 | B1 |
6647779 | Ishiguro et al. | Nov 2003 | B2 |
6943662 | Tanimura | Sep 2005 | B2 |
8203422 | Naito et al. | Jun 2012 | B2 |
20100134235 | Yoshioka | Jun 2010 | A1 |
Number | Date | Country | |
---|---|---|---|
20140167911 A1 | Jun 2014 | US |