BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a view showing an example for temperature characteristic correction;
FIG. 2 is a view showing operation of each section in the example of FIG. 1;
FIGS. 3A to 3B are views showing examples of a resolver;
FIG. 4 is a view showing an example for self-checking;
FIG. 5 is a view showing of operation of each section in the example of FIG. 4;
FIG. 6 is a view showing an example of a test pattern and an expected value;
FIG. 7 is a view showing an example where the example of FIG. 1 is made in a self-checking type;
FIG. 8 is a view showing operation of each section in the example of FIG. 7;
FIG. 9 is a view showing an example of a test control function section;
FIG. 10 is a view showing an example of setting information;
FIG. 11 is a view showing an example of test operation shown in a time sequential manner;
FIG. 12 is a view showing an example of time-sequential mode change in test operation;
FIG. 13 is a view showing an example where selectors are placed in stages previous to a phase shift circuit and an addition/subtraction function section;
FIG. 14 is a view showing operation of each section in the example of FIG. 12;
FIG. 15 is a view showing an example where selectors are placed in stages previous to separately provided, phase shift circuits and addition/subtraction function sections;
FIG. 16 is a view showing operation of each section in the example of FIG. 14;
FIG. 17 is a view showing an example for making a method of the literature 2 to be in a self-checking type;
FIG. 18 is a view showing operation of each section in the example of FIG. 16;
FIG. 19 is a view showing an example where selectors are placed in stages previous to a phase shift circuit and an addition/subtraction function section;
FIG. 20 is a view showing operation of each section in the example of FIG. 18;
FIG. 21 is a view showing an example where selectors are placed in stages previous to separately provided, phase shift circuits and addition/subtraction function sections;
FIG. 22 is a view showing operation of each section in the example of FIG. 20;
FIG. 23 is a view showing an example for detecting a phase short fault;
FIG. 24 is a view showing operation of each section in the example of FIG. 22;
FIG. 25 is a view showing phases of signals in the example of FIG. 22;
FIGS. 26A to 26B are views of resolvers for the example of FIG. 22;
FIG. 27 is a view showing an example for making the example of FIG. 22 to be in a self-checking type;
FIG. 28 is a view showing operation of each section in the example of FIG. 26;
FIG. 29 is a view showing an example where a phase-short-fault detection function is added to the example of FIG. 26;
FIG. 30 is a view showing operation of each section in the example of FIG. 28;
FIG. 31 is a view showing an example of a motor controller and a system being applied with the invention;
FIG. 32 is a view showing an example of a motor controller and a system being applied with the invention;
FIG. 33 is a view showing an example of a test result 657;
FIG. 34 is a view showing an example of a test result 657;
FIG. 35 is a view showing an example of a test result 657;
FIG. 36 is a view showing an example of an electric power steering being applied with the invention;
FIG. 37 is a view showing an example of an embodiment of the invention;
FIG. 38 is a view showing an example of an embodiment of the invention;
FIG. 39 is a view showing an example of temperature characteristic correction by feedback;
FIG. 40 is a view showing an example for making the example of FIG. 39 to be in a self-checking type;
FIG. 41 is a view showing an example of temperature characteristic correction by feedback; and
FIG. 42 is a view showing an example for making the example of FIG. 41 to be in a self-checking type.