Converters having special provisions for facilitating access for testing purposes

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H03M1/108

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HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M1/00Analogue/digital conversion Digital/analogue conversion

Current Industry

H03M1/108Converters having special provisions for facilitating access for testing purposes

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Patents Grantslast 30 patents

Information Patent Grant
Failure determination device, control device, and failure determina...
- Patent number 11,909,412
- Issue date Feb 20, 2024
- Honda Motor Co., Ltd.
- Yasunari Sato
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
System and method of performing discrete frequency transform for re...
- Patent number 11,601,133
- Issue date Mar 7, 2023
- Silicon Laboratories Inc.
- Anant Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in harmonic prediction method for embedded segmented-data-con...
- Patent number 11,296,715
- Issue date Apr 5, 2022
- INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
- Byoungho Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing device and testing method for testing a device under test
- Patent number 11,280,833
- Issue date Mar 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Stefan Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 11,218,159
- Issue date Jan 4, 2022
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 11,211,939
- Issue date Dec 28, 2021
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit arrangement comprising a microprocessor and a voltage gener...
- Patent number 11,067,626
- Issue date Jul 20, 2021
- Vitesco Technologies GmbH
- Andreas Wunderlich
- G01 - MEASURING TESTING
Information Patent Grant
Digital-to-analog converter waveform generator
- Patent number 11,018,681
- Issue date May 25, 2021
- Analog Devices International Unlimited Company
- David James Hamilton
- G01 - MEASURING TESTING
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 10,931,293
- Issue date Feb 23, 2021
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for measuring frequency of signal
- Patent number 10,931,294
- Issue date Feb 23, 2021
- Agency for Defense Development
- Sang Won Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to determine non linearity in analog-to-digit...
- Patent number 10,897,262
- Issue date Jan 19, 2021
- Texas Instruments Incorporated
- Akhilesh Kesavanunnithan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low noise and low distortion test method and system for analog-to-d...
- Patent number 10,892,768
- Issue date Jan 12, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system to enhance accuracy and resolution of system inte...
- Patent number 10,735,115
- Issue date Aug 4, 2020
- NXP B.V.
- Gernot Hueber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for spectral leakage removal in DAC testing
- Patent number 10,630,306
- Issue date Apr 21, 2020
- Advantest Corporation
- Ming Lu
- G01 - MEASURING TESTING
Information Patent Grant
Equalization of sub-DAC frequency response misalignments in time-in...
- Patent number 10,355,706
- Issue date Jul 16, 2019
- Guzik Technical Enterprises
- Anatoli B. Stein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency-domain ADC flash calibration
- Patent number 10,056,914
- Issue date Aug 21, 2018
- Analog Devices Global
- Zhao Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of digital-to-analog converter mismatch calibration in a suc...
- Patent number 10,027,339
- Issue date Jul 17, 2018
- Stichting IMEC Nederland
- Ming Ding
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital-to-analog converter waveform generator
- Patent number 9,998,133
- Issue date Jun 12, 2018
- Analog Devices, Inc.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method of self-healing data converters
- Patent number 9,813,075
- Issue date Nov 7, 2017
- Yuan-Ju Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in-self-test circuit for sigma-delta modulator
- Patent number 9,748,970
- Issue date Aug 29, 2017
- NXP USA, INC.
- Zhou Fang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built in self-test
- Patent number 9,705,523
- Issue date Jul 11, 2017
- Ateeda Limited
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method of self-healing data converters
- Patent number 9,667,263
- Issue date May 30, 2017
- Yuan-Ju Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built in self-test
- Patent number 9,246,503
- Issue date Jan 26, 2016
- ATEEDA LTD.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for angular measurement with compensation of non-...
- Patent number 9,207,080
- Issue date Dec 8, 2015
- Sagem Defense Securite
- Vincent Ragot
- G01 - MEASURING TESTING
Information Patent Grant
Close-in tones
- Patent number 9,160,358
- Issue date Oct 13, 2015
- Texas Instruments Incorporated
- Sthanunathan Ramakrishnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor circuit, D/A converter, mixer circuit, radio communic...
- Patent number 9,083,423
- Issue date Jul 14, 2015
- Kabushiki Kaisha Toshiba
- Masamichi Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing of analog-to-digital converters
- Patent number 8,558,726
- Issue date Oct 15, 2013
- STMicroelectronics Asia Pacific PTE Ltd.
- Chee Weng Cheong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing system
- Patent number 8,386,209
- Issue date Feb 26, 2013
- University Of Limerick
- Brendan Mullane
- G01 - MEASURING TESTING
Information Patent Grant
Pipeline A/D converter
- Patent number 8,203,474
- Issue date Jun 19, 2012
- Panasonic Corporation
- Shinichi Ogita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Residual Fourier-padding interpolation for instrumentation and meas...
- Patent number 8,046,396
- Issue date Oct 25, 2011
- Teradyne, Inc.
- Fang Xu
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...
- Publication number 20240313795
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Kan TAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD OF PERFORMING DISCRETE FREQUENCY TRANSFORM FOR RE...
- Publication number 20220131548
- Publication date Apr 28, 2022
- Anant Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN
- Publication number 20210203342
- Publication date Jul 1, 2021
- SEAGATE TECHNOLOGY LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN
- Publication number 20210203341
- Publication date Jul 1, 2021
- SEAGATE TECHNOLOGY LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING FREQUENCY OF SIGNAL
- Publication number 20210013897
- Publication date Jan 14, 2021
- AGENCY FOR DEFENSE DEVELOPMENT
- Sang Won KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...
- Publication number 20210011081
- Publication date Jan 14, 2021
- Vitesco Technologies GMBH
- Andreas Wunderlich
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND SYSTEM TO ENHANCE ACCURACY AND RESOLUTION OF SYSTEM INTE...
- Publication number 20200044754
- Publication date Feb 6, 2020
- NXP B.V.
- Gernot Hueber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...
- Publication number 20190081634
- Publication date Mar 14, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUS TO DETERMINE NON-LINEARITY IN ANALOG-TO-DIGIT...
- Publication number 20180269889
- Publication date Sep 20, 2018
- TEXAS INSTRUMENTS INCORPORATED
- AKHILESH KESAVANUNNITHAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD OF DIGITAL-TO-ANALOG CONVERTER MISMATCH CALIBRATION IN A SUC...
- Publication number 20180167078
- Publication date Jun 14, 2018
- Stichting IMEC Nederland
- Ming Ding
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT IN SELF-TEST
- Publication number 20170324422
- Publication date Nov 9, 2017
- Analog Devices, Inc.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT IN SELF-TEST
- Publication number 20160218730
- Publication date Jul 28, 2016
- Ateeda Limited
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOSE-IN TONES
- Publication number 20150263747
- Publication date Sep 17, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Sthanunathan Ramakrishnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR CIRCUIT, D/A CONVERTER, MIXER CIRCUIT, RADIO COMMUNIC...
- Publication number 20140227989
- Publication date Aug 14, 2014
- Kabushiki Kaisha Toshiba
- Masamichi SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING OF ANALOG-TO-DIGITAL CONVERTERS
- Publication number 20130169456
- Publication date Jul 4, 2013
- STMicroelectronics Asia Pacific Pte. Ltd.
- Chee Weng Cheong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR ANGULAR MEASUREMENT WITH COMPENSATION OF NON-...
- Publication number 20120324999
- Publication date Dec 27, 2012
- Vincent Ragot
- G01 - MEASURING TESTING
Information Patent Application
Digital-to-Analog Converter circuit with Rapid Built-in Self-test a...
- Publication number 20120274493
- Publication date Nov 1, 2012
- Shun-Hsun Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING SYSTEM
- Publication number 20110098964
- Publication date Apr 28, 2011
- Brendan Mullane
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PIPELINE A/D CONVERTER
- Publication number 20110025536
- Publication date Feb 3, 2011
- PANASONIC CORPORATION
- Shinichi Ogita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor integrated circuit, liquid crystal driver circuit, an...
- Publication number 20100182299
- Publication date Jul 22, 2010
- SONY CORPORATION
- Kenji Hyoudou
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
FAST FOURIER TRANSFORMATION-BASED ANALOG-TO-DIGITAL CONVERTER CALIB...
- Publication number 20100103007
- Publication date Apr 29, 2010
- Shuenn-Yuh LEE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Self-Testing Digital-to-Analog Converter
- Publication number 20100033358
- Publication date Feb 11, 2010
- Biranchinath Sahu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AD CONVERTER, DATA RECEIVER AND DATA RECEPTION METHOD
- Publication number 20100014607
- Publication date Jan 21, 2010
- FUJITSU LIMITED
- Masaya Kibune
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A/D CONVERTER-INCORPORATED SOLID-STATE IMAGING DEVICE
- Publication number 20090284629
- Publication date Nov 19, 2009
- Toshinobu NAKAO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Residual Fourier-Padding Interpolation for Instrumentation and Meas...
- Publication number 20080243983
- Publication date Oct 2, 2008
- Fang Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF SCREENING CONFORMING DI...
- Publication number 20080238741
- Publication date Oct 2, 2008
- Koji Horisaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device
- Publication number 20080007440
- Publication date Jan 10, 2008
- Masaya Hirose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method of Generating a Digital Signal that is Representative of Mat...
- Publication number 20070247344
- Publication date Oct 25, 2007
- Patrick Gremillet
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Resolver/digital-converter and control system using the resolver/di...
- Publication number 20070201171
- Publication date Aug 30, 2007
- HITACHI, LTD.
- Nobuyasu Kanekawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device
- Publication number 20070164890
- Publication date Jul 19, 2007
- Masaya Hirose
- H03 - BASIC ELECTRONIC CIRCUITRY

Converters having special provisions for facilitating access for testing purposes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Failure determination device, control device, and failure determina...

System and method of performing discrete frequency transform for re...

Built-in harmonic prediction method for embedded segmented-data-con...

Testing device and testing method for testing a device under test

Transform domain analytics-based channel design

Transform domain analytics-based channel design

Circuit arrangement comprising a microprocessor and a voltage gener...

Digital-to-analog converter waveform generator

Transform domain analytics-based channel design

Apparatus and method for measuring frequency of signal

Methods and apparatus to determine non linearity in analog-to-digit...

Low noise and low distortion test method and system for analog-to-d...

Method and system to enhance accuracy and resolution of system inte...

Method and system for spectral leakage removal in DAC testing

Equalization of sub-DAC frequency response misalignments in time-in...

Frequency-domain ADC flash calibration

Method of digital-to-analog converter mismatch calibration in a suc...

Digital-to-analog converter waveform generator

Apparatus and method of self-healing data converters

Built-in-self-test circuit for sigma-delta modulator

Built in self-test

Apparatus and method of self-healing data converters

Built in self-test

Method and device for angular measurement with compensation of non-...

Close-in tones

Semiconductor circuit, D/A converter, mixer circuit, radio communic...

Testing of analog-to-digital converters

Testing system

Pipeline A/D converter

Residual Fourier-padding interpolation for instrumentation and meas...

Patents Applicationslast 30 patents

REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...

SYSTEM AND METHOD OF PERFORMING DISCRETE FREQUENCY TRANSFORM FOR RE...

TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN

TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN

APPARATUS AND METHOD FOR MEASURING FREQUENCY OF SIGNAL

CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...

METHOD AND SYSTEM TO ENHANCE ACCURACY AND RESOLUTION OF SYSTEM INTE...

LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...

METHODS AND APPARATUS TO DETERMINE NON-LINEARITY IN ANALOG-TO-DIGIT...

METHOD OF DIGITAL-TO-ANALOG CONVERTER MISMATCH CALIBRATION IN A SUC...

BUILT IN SELF-TEST

BUILT IN SELF-TEST

CLOSE-IN TONES

SEMICONDUCTOR CIRCUIT, D/A CONVERTER, MIXER CIRCUIT, RADIO COMMUNIC...

TESTING OF ANALOG-TO-DIGITAL CONVERTERS

METHOD AND DEVICE FOR ANGULAR MEASUREMENT WITH COMPENSATION OF NON-...

Digital-to-Analog Converter circuit with Rapid Built-in Self-test a...

TESTING SYSTEM

PIPELINE A/D CONVERTER

Semiconductor integrated circuit, liquid crystal driver circuit, an...

FAST FOURIER TRANSFORMATION-BASED ANALOG-TO-DIGITAL CONVERTER CALIB...

Self-Testing Digital-to-Analog Converter

AD CONVERTER, DATA RECEIVER AND DATA RECEPTION METHOD

A/D CONVERTER-INCORPORATED SOLID-STATE IMAGING DEVICE

Residual Fourier-Padding Interpolation for Instrumentation and Meas...

SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF SCREENING CONFORMING DI...

Semiconductor device

Method of Generating a Digital Signal that is Representative of Mat...

Resolver/digital-converter and control system using the resolver/di...

Semiconductor device