Number | Name | Date | Kind |
---|---|---|---|
4433951 | Koch | Feb 1984 | |
4552505 | Gorman | Nov 1985 | |
4553069 | Purser | Nov 1985 | |
4584045 | Richards | Apr 1986 | |
4643627 | Bednorz et al. | Feb 1987 | |
4654106 | Davis et al. | Mar 1987 | |
4657618 | Spencer et al. | Apr 1987 | |
4657620 | Davis et al. | Apr 1987 | |
4659413 | Davis et al. | Apr 1987 | |
4687542 | Davis et al. | Aug 1987 | |
4694776 | Sandbach et al. | Sep 1987 | |
4705951 | Layman et al. | Nov 1987 | |
4715921 | Maher et al. | Dec 1987 | |
4717461 | Strahl et al. | Jan 1988 | |
4724621 | Hobson et al. | Feb 1988 | |
4764076 | Layman et al. | Aug 1988 | |
4770590 | Hugues et al. | Sep 1988 | |
4778331 | Kimata et al. | Oct 1988 | |
4789294 | Sato et al. | Dec 1988 | |
4816116 | Davis et al. | Mar 1989 | |
4827954 | Layton | May 1989 | |
4842680 | Davis et al. | Jun 1989 | |
4909701 | Hardegen et al. | Mar 1990 | |
4917556 | Stark et al. | Apr 1990 | |
4923054 | Ohtani et al. | May 1990 | |
4966519 | Davis et al. | Oct 1990 | |
5013385 | Maher et al. | May 1991 | |
5015177 | Iwata | May 1991 | |
5020475 | Crabb et al. | Jun 1991 | |
5044752 | Thurfjell et al. | Sep 1991 | |
5044871 | Davis et al. | Sep 1991 | |
5046992 | Tamai et al. | Sep 1991 | |
5049029 | Mitsui et al. | Sep 1991 | |
5064340 | Genov et al. | Nov 1991 | |
5083896 | Uehara et al. | Jan 1992 | |
5092728 | Crabb et al. | Mar 1992 | |
5096364 | Messer et al. | Mar 1992 | |
5102495 | Maher et al. | Apr 1992 | |
5123804 | Ishii et al. | Jun 1992 | |
5156521 | Crabb et al. | Oct 1992 | |
5178512 | Skrobak | Jan 1993 | |
5236295 | Ishii et al. | Aug 1993 | |
5248886 | Asakawa et al. | Sep 1993 | |
5253663 | Tanaka et al. | Oct 1993 | |
5258047 | Tokisue et al. | Nov 1993 | |
5277579 | Takanabe | Jan 1994 | |
5288333 | Tanaka et al. | Feb 1994 | |
5324155 | Goodwin et al. | Jun 1994 | |
5513946 | Sawada et al. | May 1996 |
Entry |
---|
IBM Technical Disclosure Bulletin vol. 32 No. 3A dated Aug. 1989, pp. 443-445. |
G.S. Mathad, Review Wafer Reactor Technolody for Device Processing, Solid State Technology dated Apr. 1985, pp. 221-225. |