Number | Date | Country | Kind |
---|---|---|---|
2000-259868 | Aug 2000 | JP |
Number | Name | Date | Kind |
---|---|---|---|
4320344 | Nicholas | Mar 1982 | A |
4542345 | Tomasulo | Sep 1985 | A |
4920319 | Viertl | Apr 1990 | A |
5126813 | Takahashi et al. | Jun 1992 | A |
5441343 | Pylkki et al. | Aug 1995 | A |
6251696 | Ikeya et al. | Jun 2001 | B1 |
6570390 | Hirayama et al. | May 2003 | B2 |
Entry |
---|
Tomozane, Mamoru et al, “Analysis of Thermally Stimulated Current Spectroscopy in Semiinsulation GaAs. I. Initialization”, Japanese Journal of Applied Physics, Feb. 1988, pp. 260-268, 27 (2), Japan. |
Reber, Jr., Richard et al., “Thermally stimulated current measurements of SiO2 defect density and energy in irradiated metal-oxide-semiconductor capacitors”, Rev. Sci. Instrum., Dec., 1992, pp. 5714-5725, 63 (12), USA. |