Patent Application
20220157587
The present disclosure relates to a sample support, an ionization method, and a mass spectrometry method.
Conventionally, a laser desorption ionization method is known as a method of ionizing a sample such as a biological sample for mass spectrometry or the like. As a sample support used in a laser desorption ionization method, Patent Document 1 discloses a sample support including a substrate in which a plurality of through holes are formed and a conductive layer provided on at least one surface of the substrate.
[Patent Document 1] Japanese Patent No. 6093492
As a measurement method using the sample support, there is a method in which a sample solution of a measurement target (ionization target) is dropped into a surface of the sample support on which a conductive layer is formed, and after the sample solution is dried, the surface is irradiated with an energy beam such as laser light. In this method, the dropping of the sample solution may be performed using a pipette tip. Here, in order to dry the sample solution in as short a time as possible, the dropping amount of the sample solution may be set to a very small amount (for example, 50 nL to 100 nL). In this case, it is necessary to bring the tip of the pipette tip as close to the measurement region as possible in order to reliably drop the sample solution into the measurement region (region for arranging the sample) of the sample support.
However, when the pipette tip is manually moved closer to the measurement region, the tip of the pipette tip may unintentionally contact the measurement region. Even when the above operation is mechanically performed, it is not easy to position the tip of the pipette tip with high accuracy. In particular, when a sample solution is simultaneously dropped into a plurality of measurement regions provided on a sample support by simultaneously operating a plurality of pipette tips, the height positions of the tips of the plurality of pipette tips are required to be aligned with high accuracy, but such control is not easy. As described above, even if the operation of dropping the sample solution using the pipette tip is performed manually or mechanically, the tip of the pipette tip may come into contact with the measurement region. Further, since the substrate constituting the sample support is a membrane-shaped thin film, if the tip of the pipette tip and the measurement region come into contact with each other, the substrate may be damaged in the measurement region.
Therefore, an object of the present disclosure is to provide a sample support, an ionization method, and a mass spectrometry method capable of preventing breakage of a substrate caused by contact between the substrate and a pipette tip.
A sample support according to an aspect of the present disclosure is a sample support for ionization of a sample contained in a sample solution dropped using a pipette tip. The sample support includes: a substrate having a first surface and a second surface opposite to the first surface and having a plurality of first through holes opened in the first surface and the second surface; and a frame having a second through hole penetrating in a thickness direction of the substrate so as to overlap a measurement region of the substrate for ionizing a component of the sample when viewed from the thickness direction. The frame is bonded to the first surface of the substrate. The second through hole includes a narrow portion having a width smaller than an outer diameter of a tip of the pipette tip.
In the sample support, in a frame, a first through hole including a narrow portion having a width smaller than an outer diameter of a tip of a pipette tip for dropping a sample solution is formed in a portion overlapping a measurement region for ionizing a component of a sample in a substrate in which a plurality of second through holes are formed. Therefore, even if the tip of the pipette tip is moved closer to the first surface in order to drop the sample solution into the first surface of the measurement region, the tip of the pipette tip does not pass through the second through hole. That is, the narrow portion of the second through hole reliably prevents the tip of the pipette tip from penetrating the second through hole and contacting the first surface of the measurement region. Therefore, according to the sample support, it is possible to prevent the substrate from being damaged due to the contact between the substrate and the pipette tip.
The second through hole may be formed in a cylindrical shape having a width smaller than the outer diameter. Accordingly, the contact between the tip of the pipette tip and the first surface of the measurement region may be reliably prevented by the second through hole having a relatively simple shape.
The second through hole may be formed in a tapered shape in which an inner diameter decreases toward the first surface along the thickness direction, and an opening of the second through hole on a side opposite to the first surface side may have a size including the tip of the pipette tip when viewed from the thickness direction. Thus, the tip of the pipette tip can be easily introduced into the second through hole. That is, even if the position of the tip of the pipette tip is slightly shifted in the direction orthogonal to the thickness direction, the tip of the pipette tip can be guided into the second through hole. Further, since the tip of the pipette tip can be brought closer to the first surface of the measurement region, the sample solution can be suitably dropped into the measurement region.
The second through hole may have a cylindrical portion including the narrow portion, and a bowl-shaped portion connected to an end portion of the cylindrical portion opposite to the first surface side and having an inner diameter increasing with distance from the first surface along the thickness direction, and an opening of the bowl-shaped portion opposite to the cylindrical portion may have a size including the tip of the pipette tip when viewed from the thickness direction. Thus, the tip of the pipette tip can be easily introduced into the second through hole. That is, even if the position of the tip of the pipette tip is slightly shifted in the direction orthogonal to the thickness direction, the tip of the pipette tip can be introduced into the second through hole. Further, since the tip of the pipette tip can be brought closer to the first surface of the measurement region, the sample solution can be suitably dropped into the measurement region. Further, there is an advantage that such a second through hole can be formed by relatively easy processing such as etching.
The second through hole may further include an inner bowl-shaped portion connected to an end portion of the cylindrical portion on the first surface side and having an inner diameter increasing toward the first surface along the thickness direction. In this case, the area of the first surface exposed to the second through hole can be increased as compared with the case where the second through hole does not have the inner bowl-shaped portion. Accordingly, in the case where the frame and the first surface of the substrate are bonded to each other with an adhesive, even if the adhesive slightly drips to the measurement region side, ionization of the sample using the measurement region can be performed without any problem.
The sample support may further include an adhesive layer disposed between the frame and the first surface to adhere the frame to the first surface, and the frame may be formed with a recessed portion in which a portion of the adhesive layer is accommodated on a surface of the frame facing the adhesive layer in a vicinity of the second through hole. Accordingly, in the vicinity of the second through hole, that is, in the peripheral portion of the measurement region, the adhesive forming the adhesive layer can be released to the recessed portion, and thus it is possible to suppress the adhesive from dripping to the measurement region side. As a result, the sample ionization using the measurement region can be suitably performed.
The sample support may further include a magnetic substrate formed of a magnetic material and provided on the second surface of the substrate. For example, when the sample support is fixed in order to drop the sample solution onto the sample support, by using the mounting portion having magnetism, the magnetic substrate can be appropriately fixed to the mounting portion by the magnetic force acting between the magnetic substrate and the mounting portion.
The frame may be formed of a magnetic material, and the magnetic substrate may be fixed to the second surface of the substrate by a magnetic force between the frame and the magnetic substrate. If the magnetic substrate is bonded to the second surface of the substrate with an adhesive, not only the sample to be measured but also a component of the adhesive provided on the second surface of the measurement region may be ionized at the time of measurement (ionization of the sample dropped on the measurement region), and the measurement may not be appropriately performed. On the other hand, according to the above configuration, the above problem can be solved, and the magnetic substrate can be easily fixed to the substrate.
A peripheral portion of the frame and a peripheral portion of the magnetic substrate, which do not overlap the substrate when viewed from the thickness direction, may be bonded to each other. Accordingly, the frame provided on the first surface side of the substrate and the magnetic substrate provided on the second surface side of the substrate can be appropriately fixed.
The sample support may further include a conductive layer provided on the first surface so as not to block the first through hole. Thus, even when an insulating substrate is used, a voltage can be applied to the first surface side of the substrate via the conductive layer. Thus, after the sample solution is dropped into the first surface and the sample solution is dried, the first surface is irradiated with the energy beam while applying a voltage to the conductive layer, whereby the components of the sample can be favorably ionized.
A width of the first through hole may be 1 nm to 700 nm, and a width of the narrow portion of the second through hole may be 500 μm or less. Accordingly, the component of the sample contained in the sample solution dropped into the first surface of the substrate can be appropriately retained on the first surface side of the substrate. Further, by setting the width of the narrow portion to 500 μm or less, the width of the narrow portion can be reliably made smaller than the outer diameter of the tip of a general pipette tip.
A plurality of measurement regions may be formed in the substrate, and the frame may have a plurality of second through holes corresponding to the plurality of measurement regions. Accordingly, for example, by simultaneously operating a plurality of pipette tips, it is possible to simultaneously drop the sample solution to a plurality of measurement regions. As a result, the efficiency of measurement work can be improved.
A hydrophilic coating layer may be provided on an inner surface of the second through hole. Accordingly, the sample solution dropped from the tip of the pipette tip is easily transferred to the inner surface of the second through hole. As a result, the movement of the sample solution to the first surface side in the second through hole is promoted, and the sample solution can be moved to the first surface more smoothly.
According to an aspect of the present disclosure, there is provided an ionization method including: a first step of preparing the sample support; a second step of placing the sample support on a mounting surface of a mounting portion such that the second surface faces the mounting surface; a third step of bringing the tip of the pipette tip close to the second through hole from a side opposite to the first surface side of the frame and then dropping the sample solution from the tip of the pipette tip into the measurement region through the second through hole; and a fourth step of ionizing a component of the sample by irradiating the first surface of the measurement region with an energy beam after the sample solution dropped on the substrate is dried.
In the above ionization method, in the third step in which the sample solution is dropped, even if the tip of the pipette tip is moved closer to the first surface in order to drop the sample solution into the first surface of the measurement region, the tip of the pipette tip does not pass through the second through hole. That is, the narrow portion of the second through hole reliably prevents the tip of the pipette tip from penetrating the second through hole and contacting the first surface of the measurement region. Accordingly, it is possible to prevent the substrate from being damaged due to the contact between the substrate and the pipette tip.
The ionization method may include a step of performing a surface treatment for improving hydrophilicity on an inner surface of the second through hole before the third step. Accordingly, in the third process, the sample solution dropped from the tip of the pipette tip is easily transferred to the inner surface of the second through hole. As a result, the movement of the sample solution to the first surface side in the second through hole is promoted, and the sample solution can be moved to the first surface more smoothly.
A mass spectrometry method according to an aspect of the present disclosure includes each step of the above ionization method, and a fifth step of detecting the component ionized in the fourth step.
According to the mass spectrometry method, by including the respective steps of the above-described ionization method, the same effects as those of the above-described ionization method are exhibited.
According to the present disclosure, it is possible to provide a sample support, an ionization method, and a mass spectrometry method capable of preventing breakage of a substrate caused by contact between the substrate and a pipette tip.
Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. In the drawings, the same or corresponding portions are denoted by the same reference numerals, and redundant description will be omitted. In the drawings, some portions are exaggerated for easy understanding of characteristic portions according to the embodiments, and the dimensions may be different from actual dimensions. In the following description, terms such as “upper” and “lower” are used for convenience based on the state shown in the drawings.
A sample support 1A according to the first embodiment will be described with reference to
The substrate 2 has a first surface 2a and a second surface 2b opposite to the first surface 2a. As shown in
The substrate 2 is formed of, for example, an insulating material in a rectangular plate shape. The length of one side of the substrate 2 when viewed from the thickness direction D is, for example, about several cm. The thickness of the substrate 2 is, for example, about 1 μm to 50 μm. In the present embodiment, as an example, the thickness of the substrate 2 is about 5 μm. The shape of the through hole 2c when viewed from the thickness direction D is, for example, substantially circular. The width of the through hole 2c is, for example, about 1 nm to 700 nm.
The width of the through hole 2c is a value obtained as follows. First, images of the first surface 2a and the second surface 2b of the substrate 2 are acquired.
As shown in
The frame 3 is provided on the first surface 2a of the substrate 2 and supports the substrate 2 on the first surface 2a side. As shown in
Each measurement region R is a region including a plurality of through holes 2c. The aperture ratio of the through holes 2c in the measurement region R (the ratio of the through holes 2c to the measurement region R when viewed from the thickness direction D) is practically 10% to 80%, and particularly preferably 60% to 80%. The through holes 2c may have different sizes, or the through holes 2c may be partially connected to each other.
The frame 3 is formed of, for example, a magnetic metal material (for example, a stainless steel material (SUS 400 series) or the like) in a rectangular plate shape. The length of one side of the frame 3 when viewed from the thickness direction D is, for example, about several cm to 200 cm, and the thickness of the frame 3 is, for example, 3 mm or less. In the present embodiment, as an example, the thickness of the frame 3 is 0.2 mm. The shape of the through holes 3a when viewed from the thickness direction D is, for example, circular, and the distance (pitch) between the centers of adjacent through holes 3a is, for example, about several mm to several 10 of mm. According to the frame 3, handling of the sample support 1A can be facilitated, and deformation of the substrate 2 due to a temperature change or the like is suppressed.
The tape 5 is a fixing member for fixing the sample support 1A to a mounting surface 8a (see
The conductive layer 4 is provided on the first surface 2a of the substrate 2. As shown in
The conductive layer 4 is formed of a conductive material. In the present embodiment, the conductive layer 4 is formed of Pt (platinum) or Au (gold). As described above, as the material of the conductive layer 4, a metal having low affinity (reactivity) with the sample and high conductivity is preferably used for the following reason.
For example, when the conductive layer 4 is formed of metals such as Cu having high affinity with a sample such as proteins, the sample is ionized in a state in which Cu atom is attached to sample molecules in a process of sample ionization described later, and there is a concern that a detection result is deviated in mass spectrometry described later by the amount of attachment of Cu atom. Therefore, as the material of the conductive layer 4, a metal having low affinity with the sample is preferably used.
On the other hand, the higher the conductivity of a metal is, the easier it is to apply a constant voltage easily and stably. Therefore, when the conductive layer 4 is formed of a highly conductive metal, a voltage can be uniformly applied to the first surface 2a of the substrate 2 in the measurement region R. In addition, a metal having higher conductivity tends to have higher thermal conductivity. Therefore, when the conductive layer 4 is formed of a metal having high conductivity, the energy of laser light (energy beam) applied to the substrate 2 can be efficiently transmitted to the sample through the conductive layer 4. Therefore, a metal having high conductivity is preferably used as the material of the conductive layer 4.
From the above viewpoint, as the material of the conductive layer 4, for example, Pt, Au, or the like is preferably used. The conductive layer 4 is formed to be about 1 nm to 350 nm thick by, for example, plating, atom layer deposition (ALD: Atomic Layer Deposition), vapor deposition, sputtering, or the like. As a material of the conductive layer 4, for example, Cr (chromium), Ni (nickel), Ti (titanium), or the like may be used.
Next, a detailed configuration of the through hole 3a will be described with reference to
Although the conductive layer 4 is formed on the inner surface of the through hole 3a as described above, a hydrophilic coating layer C may be further provided on the conductive layer 4 as shown in
[Mass Spectrometry Method using Sample Support 1A]
Next, a mass spectrometry method (including an ionization method) using the sample support 1A will be described with reference to
First, as shown in (A) of
Subsequently, as shown in (B) of
Subsequently, as shown in
Subsequently, as shown in
In this manner, by irradiating the first surface 2a of the substrate 2 with the laser light L while applying a voltage to the conductive layer 4, the component S1 of the sample remaining in the through hole 2c of the substrate 2 (particularly, on the first surface 2a side) is ionized, and the sample ion S2 (ionized component S1) is discharged (fourth step). Specifically, the energy is transferred from the conductive layer 4 (see
The released sample ion S2 moves while accelerating toward a ground electrode (not shown) provided between the sample support 1A and the ion detection unit 24 of the mass spectrometer 20. That is, the sample ion S2 moves toward the ground electrode while being accelerated by the potential difference generated between the conductive layer 4 to which the voltage is applied and the ground electrode. Then, the sample ion S2 is detected by the ion detection unit 24 (fifth step). In the present embodiment, the mass spectrometer 20 is a scanning mass spectrometer using time-of-flight mass spectrometry (TOF-MS). The first step to the fifth step described above correspond to the mass spectrometry method using the sample support 1A.
In the above ionization method, before the third step (i.e., before dropping the sample solution S), a step of performing surface treatment for improving hydrophilicity on the inner surface of the through hole 3a (in the present embodiment, the surface of the coating layer C provided on the conductive layer 4) may be further performed. For example, a surface treatment in which excimer irradiation or plasma irradiation is performed on the inner surface of the through hole 3a may be performed. Accordingly, in the third step, the sample solution S dropped from the tip Pa of the pipette tip P is easily transferred to the inner surface of the through hole 3a. As a result, the movement of the sample solution S to the first surface 2a side in the through hole 3a is promoted, and the sample solution S can be more smoothly moved to the first surface 2a.
[Effects of First Embodiment]
As described above, in the sample support 1A, the through hole 3a including the narrow portion 3n having the width 3r smaller than the outer diameter Pr of the tip Pa of the pipette tip P is formed in the portion of the frame 3 overlapping the measurement region R. Therefore, even if an operation of bringing the tip Pa of the pipette tip P close to the first surface 2a is performed in order to drop the sample solution S into the first surface 2a of the measurement region R, the tip Pa of the pipette tip P does not pass through the through hole 3a. That is, the narrow portion 3n of the through hole 3a reliably prevents the tip Pa of the pipette tip P from passing through the through hole 3a and contacting the first surface 2a of the measurement region R. Therefore, according to the sample support 1A, it is possible to prevent the substrate 2 from being damaged due to the contact between the substrate 2 and the pipette tip P.
The through hole 3a is formed in a tubular shape (cylindrical shape in the present embodiment) having a width 3r smaller than the outer diameter Pr of the tip Pa of the pipette tip P. Accordingly, the through hole 3a having a relatively simple shape can reliably prevent the tip Pa of the pipette tip P from contacting the first surface 2a of the measurement region R. In this case, the distance between the tip Pa of the pipette tip P and the first surface 2a (i.e., the distance in a state where the tip Pa and the first surface 2a are closest to each other) can be appropriately and easily defined by the length of the through hole 3a in the thickness direction D (i.e., the thickness of the frame 3).
The sample support 1A includes a conductive layer 4 provided so as not to block the through hole 2c in the first surface 2a. As a result, even when the insulating substrate 2 is used as in the present embodiment, a voltage can be applied to the first surface 2a side of the substrate 2 via the conductive layer 4. Thus, after the sample solution S is dropped into the first surface 2a and the sample solution S is dried, the first surface 2a is irradiated with the laser light L while applying a voltage to the conductive layer 4, whereby the component S1 of the sample can be favorably ionized.
The width of the through hole 2c is 1 nm to 700 nm, and the width 3r of the narrow portion 3n of the through hole 3a is 500 μm or less. By setting the width of the through hole 2c to the above range, the component S1 of the sample contained in the sample solution S dropped into the first surface 2a of the substrate 2 can be appropriately retained on the first surface 2a side of the substrate 2. Further, by setting the width 3r of the narrow portion 3n to 500 μm or less, the width 3r of the narrow portion 3n can be reliably made smaller than the outer diameter of the tip of a general pipette tip.
A plurality of (here, nine) measurement regions R are formed in the substrate 2, and a plurality of through holes 3a corresponding to the plurality of measurement regions R are formed in the frame 3. Accordingly, for example, by simultaneously operating a plurality of pipette tips P, it is possible to simultaneously drop a sample solution S (for example, a sample solution S having a different component or component ratio for each measurement region R) to a plurality of measurement regions R. As a result, the efficiency of measurement work can be improved. For example, by forming a number (for example, 1536) of measurement regions R suitable for the HTS application in the sample support 1A, it is possible to use the sample support in the HTS application (that is, to use the sample support in an apparatus that performs HTS).
A hydrophilic coating layer C is provided on the inner surface of the through hole 3a. As a result, the sample solution S dropped from the tip Pa of the pipette tip P is easily transferred to the inner surface of the through hole 3a. As a result, the movement of the sample solution S to the first surface 2a side in the through hole 3a is promoted, and the sample solution S can be moved to the first surface 2a more smoothly.
In addition, in the ionization method (first step to fourth step) and the mass spectrometry method (first step to fifth step) using the sample support 1A, even if an operation of bringing the tip Pa of the pipette tip P close to the first surface 2a is performed in order to drop the sample solution S into the first surface 2a of the measurement region R in the third step in which the sample solution S is dropped, the tip Pa of the pipette tip P does not pass through the through hole 3a. That is, the narrow portion 3n of the through hole 3a reliably prevents the tip Pa of the pipette tip P from passing through the through hole 3a and contacting the first surface 2a of the measurement region R. Accordingly, it is possible to prevent the substrate 2 from being damaged due to the contact between the substrate 2 and the pipette tip P.
Next, a modification of the frame 3 will be described with reference to
[First Modification of Frame 3]
With reference to (A) of
According to the frame 3A, the tip Pa of the pipette tip P can be easily introduced into the through hole 3a. That is, since the opening diameter of the through hole 3a on the surface 3b side is larger than the outer diameter Pr of the tip Pa, even if the position of the tip Pa of the pipette tip P is slightly shifted in the direction orthogonal to the thickness direction D, the tip Pa of the pipette tip P can be guided into the through hole 3a. Further, according to the frame 3A, the tip Pa of the pipette tip P can be brought closer to the first surface 2a of the measurement region R as compared with the frame 3. That is, in the frame 3, the tip Pa of the pipette tip P can be brought close to the first surface 2a only up to the position where the tip Pa abuts on the surface 2b, whereas in the frame 3A, the tip Pa of the pipette tip P can be brought close to the first surface 2a up to the upper end position of the narrow portion 3n (position below the surface 2b). This makes it possible to suitably drop the sample solution S into the measurement region R.
[Second Modification of Frame 3]
With reference to (B) of
The cylindrical portion 3a1 is a portion having a width 3r smaller than the outer diameter Pr of the tip Pa of the pipette tip P. In the present embodiment, the cylindrical portion 3a1 is formed in a cylindrical shape, and the narrow portion 3n is constituted by the entire region of the cylindrical portion 3a1 in the thickness direction D.
The bowl-shaped portion 3a2 is connected to the end portion of the cylindrical portion 3a1 opposite to the first surface 2a side. The bowl-shaped portion 3a2 is a portion in which the inner diameter increases in a bowl shape (curved surface shape) as it goes away from the first surface 2a along the thickness direction D. When viewed from the thickness direction D, the opening of the bowl-shaped portion 3a2 on the side opposite to the cylindrical portion 3a1 (that is, the opening of the through hole 3a on the surface 3b side) has a size including the tip Pa of the pipette tip P. That is, the opening diameter of the through hole 3a on the surface 3b side is larger than the outer diameter Pr of the tip Pa. In the frame 3B, the opening diameter of the through hole 3a on the surface 3b side is, for example, about 0.5 mm to 5.0 mm
According to the frame 3B, like the frame 3A, the tip Pa of the pipette tip P can be easily introduced into the through hole 3a. That is, even if the position of the tip Pa of the pipette tip P is slightly shifted in the direction orthogonal to the thickness direction D, the tip Pa of the pipette tip P can be introduced into the through hole 3a (specifically, into the bowl-shaped portion 3a2). Further, the tip Pa of the pipette tip P can be brought closer to the first surface 2a of the measurement region R. Specifically, in the frame 3B, the tip Pa of the pipette tip P can be brought close to the first surface 2a to the upper end position (position below the surface 2b) of the cylindrical portion 3a1. This makes it possible to suitably drop the sample solution S into the measurement region R. Further, the through hole 3a (i.e., the cylindrical portion 3a1 and the bowl-shaped portion 3a2) can be formed by relatively easy processing such as etching.
[Third Modification of Frame 3]
A third modification (frame 3C) of the frame 3 will be described with reference to (A) of
According to the frame 3C, the same effects as those of the above-described frame 3B are exhibited, and the following effects are exhibited. That is, according to the frame 3C, the area of the first surface 2a exposed to the through hole 3a can be increased as compared with the case where the through hole 3a does not have the inner bowl-shaped portion 3a3. Accordingly, in the case where the frame 3C and the first surface 2a of the substrate 2 are bonded to each other with an adhesive (adhesive layer 6) as in the present embodiment, even if the adhesive slightly drips to the measurement region R side, the ionization of the sample using the measurement region R can be performed without any problem. Specifically, since the surplus space SS described above is formed, the adhesive dripping from the end portion of the adhesive layer 6 does not immediately enter the measurement region R. As described above, according to the frame 3C, it is possible to suppress the liquid dripping from the adhesive layer 6 from affecting the measurement using the measurement region R.
When the frame 3C is used, it is necessary to continuously form the conductive layer 4 on the inner surface of the inner bowl-shaped portion 3a3 surrounding the surplus space SS, the surface of the adhesive layer 6, and the first surface 2a so that the conductive layer 4 provided on the surface 3b of the frame 3C is electrically connected to the conductive layer 4 provided on the first surface 2a of the measurement region R. Therefore, when the frame 3C is used, the conductive layer 4 may be formed by atom layer deposition (ALD).
[Fourth Modification of Frame 3]
With reference to (B) of
According to the frame 3D, in the vicinity of the through hole 3a, that is, in the peripheral portion of the measurement region R, the adhesive constituting the adhesive layer 6 can be released to the recessed portion 3e. That is, even if there is an excess adhesive in the vicinity of the through hole 3a, the excess adhesive can be released to the recessed portion 3e. As a result, the adhesive can be prevented from dripping to the measurement region R side. As a result, sample ionization using the measurement region R can be suitably performed.
When the frame 3d is used, a clearance may be formed between the surface 3d of the frame 3D and the first surface 2a in the vicinity of the through hole 3a as shown in (B) of
A sample support 1B according to the second embodiment will be described with reference to
Like the frame 3, the frame 13 is formed in a rectangular plate shape. The frame 13 is made of a magnetic material. For example, the frame 13 is formed of Kovar or an alloy such as 42 alloy. The length of one side of the frame 13 when viewed from the thickness direction D is, for example, about several cm to 200 cm, and the thickness of the frame 13 is, for example, 3 mm or less. In the present embodiment, as an example, the thickness of the frame 13 is about 0.1 mm to 0.2 mm Like the frame 3, the frame 13 is bonded to the first surface 2a of the substrate 2 by the adhesive layer 6 (see
The magnetic substrate 14 is formed of a magnetic material. For example, the magnetic substrate 14 is formed in a rectangular plate shape by a stainless steel material (SUS 430 or the like) or the like. The thickness of the magnetic substrate 14 is, for example, about 1 mm When viewed from the thickness direction D, both the frame 13 and the magnetic substrate 14 are formed in a rectangular plate shape larger than the substrate 2.
The frame 13 and the magnetic substrate 14 are both formed of a magnetic material and are configured to attract each other by magnetic force. The substrate 2 is sandwiched between the frame 13 and the magnetic substrate 14 that attract each other. That is, the magnetic substrate 14 is fixed to the second surface 2b of the substrate 14 by the magnetic force between the frame 13 and the magnetic substrate 2. As described above, the magnetic substrate 14 is fixed to the second surface 2b of the substrate 2 by the magnetic force, and is not bonded to the second surface 2b by an adhesive or the like.
The peripheral portion 13c of the frame 13 and the peripheral portion 14a of the magnetic substrate 14, which do not overlap the substrate 2 when viewed from the thickness direction D, are joined to each other. The peripheral portion 13c of the frame 13 and the peripheral portion 14a of the magnetic substrate 14 are, for example, welded. Thus, a rectangular annular welded part W is formed between the peripheral portion 13c and the peripheral portion 14a when viewed from the thickness direction D.
[Effects of Second Embodiment]
The same effects as those of the above-described sample support 1A are also achieved by the above-described sample support 1B. That is, in the sample support 1B, a through hole 13a including a narrow portion having a width smaller than the outer diameter Pr of the tip Pa of the pipette tip P (that is, a through hole having a narrow portion 13n similar to the through hole 3a) is formed in a portion overlapping the measurement region R in the frame 13. Therefore, even if an operation of bringing the tip Pa of the pipette tip P close to the first surface 2a is performed in order to drop the sample solution S into the first surface 2a of the measurement region R, the tip Pa of the pipette tip P does not pass through the through hole 13a. That is, the narrow portion of the through hole 13a reliably prevents the tip Pa of the pipette tip P from penetrating the through hole 13a and contacting the first surface 2a of the measurement region R. Therefore, according to the sample support 1B, it is possible to prevent the substrate 2 from being damaged due to the contact between the substrate 2 and the pipette tip P.
The sample support 1B further includes a magnetic substrate 14 formed of a magnetic material and provided on the second surface 2b of the substrate 2. Accordingly, for example, when the sample support 1B is fixed in order to drop the sample solution into the sample support 1B, the magnetic substrate 14 can be appropriately fixed to the mounting portion by the magnetic force acting between the magnetic substrate 14 and the mounting portion by using the mounting portion having magnetism. Accordingly, a fixing member such as a tape for fixing the sample support 1B to the mounting portion can be omitted.
The frame 13 is made of a magnetic material. The magnetic substrate 14 is fixed to the second surface 2b of the substrate 14 by the magnetic force between the frame 13 and the magnetic substrate 2. If the magnetic substrate 14 is bonded to the second surface 2b of the substrate 2 with an adhesive, not only the sample to be measured but also a component of the adhesive provided on the second surface 2b of the measurement region R is ionized at the time of measurement (ionization of the sample dropped on the measurement region R), and there is a concern that the measurement cannot be appropriately performed. On the other hand, according to the sample support 1B, the above-described problem can be solved, and the magnetic substrate 14 can be easily fixed to the substrate 2.
The peripheral portion 13c of the frame 13 and the peripheral portion 14a of the magnetic substrate 14, which do not overlap the substrate 2 when viewed from the thickness direction D, are welded (joined) to each other. Accordingly, the frame 13 provided on the first surface 2a side of the substrate 2 and the magnetic substrate 14 provided on the second surface 2b side of the substrate 2 can be appropriately fixed.
In the second embodiment described above, the through hole 13a of the frame 13 has the same shape as the through hole 3a of the frame 3 of the first embodiment, but the through hole 13a of the frame 13 may have the same shape as the through hole 3a of the frames 3A, 3B, 3C, and 3D according to the modifications of the first embodiment described above.
Although an embodiment of the present disclosure has been described above, the present disclosure is not limited to the above-described embodiment. For example, the material and shape of each component are not limited to those described above, and various materials and shapes can be adopted.
For example, in the above embodiment, a plurality of (nine as an example) measurement regions R are defined by the plurality of through holes 3a and 13a provided in the frames 3, 3A, 3B, 3C, 3D, and 13, but only one measurement region R may be provided.
The conductive layer 4 provided on the substrate 2 may be provided at least on the first surface 2a. Therefore, the conductive layer 4 may be provided on, for example, the second surface 2b in addition to the first surface 2a, or may be provided on the whole or a part of the inner surface of each through hole 2c.
The substrate 2 may have conductivity. For example, the substrate 2 may be formed of a conductive material such as a semiconductor. In this case, the conductive layer 4 for applying a voltage to the first surface 2a side of the substrate 2 may be omitted. However, even when substrate 2 has conductivity, conductive layer 4 may be provided to suitably apply a voltage to the first surface 2a side of substrate 2.
Although the sample support 1A includes the tape 5 for fixing the sample support 1A to the glass slide 8, the sample support 1A may not include the tape 5. In this case, the opening part 3c of the frame 3 may also be omitted. In this case, in the second step of the mass spectrometry method using the sample support 1A described above, the sample support 1A may be fixed to the glass slide 8 by a tape prepared separately from the sample support 1A or a means other than the tape (for example, a means using an adhesive, a fixing tool, or the like).
In the above embodiment, the hydrophilic coating layer C is provided on the inner surface of the through hole 3a, but the coating layer C may be omitted if the sample solution S can be sufficiently guided to the first surface 2a without the coating layer C.
In the fourth step of the mass spectrometry method, the object to which the voltage is applied by the voltage application unit 22 is not limited to the mounting surface 8a. For example, the voltage may be directly applied to the frame 3 or the conductive layer 4. In this case, the glass slide 8 (or the mounting portion 8A) and the tape 5 may not have conductivity.
In the fourth step of the mass spectrometry method, the laser light irradiation unit 23 may irradiate the measurement region R with the laser light L at once. That is, the mass spectrometer 20 may be a projection mass spectrometer. The ionization method described above can also be used for other measurements and experiments such as ion mobility measurement.
Further, the use of the sample supports 1A and 1B is not limited to the ionization of the sample by the irradiation of the laser light L. The sample supports 1A and 1B can be used for sample ionization by irradiation with energy beams such as laser light, ion beams, and electronic beams. In the above-described ionization method and mass spectrometry method, the sample can be ionized by irradiation with an energy beam.
1A, 1B sample support
2 substrate
2
a first surface
2
b second surface
2
c through hole (first through hole)
3, 3A, 3B, 3C, 3D, 13 frame
3
a,
13
a through hole (second through hole)
3
a
1 cylindrical portion
3
a
2 bowl-shaped portion
3
a
3 inner bowl-shaped portion
3
n narrow portion
3
r width
4 conductive layer
8 glass slide (mounting portion)
8
a mounting surface
14 magnetic substrate
C coating layer
D thickness direction
P pipette tip
Pa tip
Pr outer diameter,
R measurement region
S sample solution
S1 component.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2019-051232 | Mar 2019 | JP | national |
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2019/048568 | 12/11/2019 | WO | 00 |
