using photoionisation

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H01J49/161

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

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H01J49/161using photoionisation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imaging mass spectrometer
- Patent number 12,154,772
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Kenichi Mishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for laser-assisted micro mass spectroscopy
- Patent number 12,080,532
- Issue date Sep 3, 2024
- Chemring Sensors and Electronic Systems, Inc.
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid droplet introduction interface (RDII) for mass spectrometry
- Patent number 11,651,945
- Issue date May 16, 2023
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 11,640,903
- Issue date May 2, 2023
- Kioxia Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple gas flow ionizer
- Patent number 11,631,578
- Issue date Apr 18, 2023
- PerkinElmer U.S. LLC
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for loading an ion trap
- Patent number 11,538,674
- Issue date Dec 27, 2022
- Duke University
- Geert Vrijsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for measuring the chirality of molecules
- Patent number 11,404,257
- Issue date Aug 2, 2022
- Centre National de la Recherche Scientifique
- Yann Mairesse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,355,333
- Issue date Jun 7, 2022
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,264,221
- Issue date Mar 1, 2022
- Fluidigm Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low power photoionization detector (PID)
- Patent number 11,193,909
- Issue date Dec 7, 2021
- Honeywell International Inc.
- Peter Hsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of mass spectrometry surface
- Patent number 11,164,733
- Issue date Nov 2, 2021
- The Regents of the University of California
- Jian Gao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple gas flow ionizer
- Patent number 11,094,520
- Issue date Aug 17, 2021
- PerkinElmer Health Sciences Canada, Inc.
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum resolution device for measuring laser ablation ion sp...
- Patent number 11,087,966
- Issue date Aug 10, 2021
- Dalian University of Technology
- Hongbin Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 11,062,894
- Issue date Jul 13, 2021
- Kabushiki Kaisha Toshiba
- Reiko Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analyzer and sample analysis method
- Patent number 11,043,369
- Issue date Jun 22, 2021
- TOSHIBA MEMORY CORPORATION
- Akira Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing device, analytical device, analyzing method, and computer...
- Patent number 11,024,493
- Issue date Jun 1, 2021
- Shimadzu Corporation
- Takushi Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 10,971,349
- Issue date Apr 6, 2021
- Shimadzu Corporation
- Kei Kodera
- G01 - MEASURING TESTING
Information Patent Grant
System and method for loading an ion trap
- Patent number 10,923,335
- Issue date Feb 16, 2021
- Duke University
- Geert Vrijsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of detecting biological prints, fluids or analytes therein...
- Patent number 10,877,041
- Issue date Dec 29, 2020
- Hilton Kobus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface layer disruption and ionization utilizing an extreme ultrav...
- Patent number 10,665,446
- Issue date May 26, 2020
- Rapiscan Systems, Inc.
- Udo H. Verkerk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple gas flow ionizer
- Patent number 10,658,168
- Issue date May 19, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum processing apparatus and mass spectrometer
- Patent number 10,643,831
- Issue date May 5, 2020
- Shimadzu Corporation
- Tomoyoshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Frequency scan linear ion trap mass spectrometry
- Patent number 10,504,713
- Issue date Dec 10, 2019
- Academia Sinica
- Chung-Hsuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical device
- Patent number 10,410,852
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Kosuke Hosoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for treating a cancer patient based on atomic therapeutic in...
- Patent number 10,302,661
- Issue date May 28, 2019
- Atomic Oncology Pty Ltd
- George L. Gabor Miklos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample loading apparatus for laser ablation
- Patent number 10,281,377
- Issue date May 7, 2019
- Northwest University
- Honglin Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aerosol ionizer
- Patent number 10,261,049
- Issue date Apr 16, 2019
- Brechtel Manufacturing, Inc.
- Fredrick J Brechtel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for measuring ion mobility of harmful material and refere...
- Patent number 10,209,220
- Issue date Feb 19, 2019
- Korea Basic Science Institute
- Myoung Choul Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus for ultraviolet light ionization of neu...
- Patent number 10,163,618
- Issue date Dec 25, 2018
- NATIONAL INSTITUTE OF METROLOGY CHINA
- Xingchuang Xiong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...
- Publication number 20250006482
- Publication date Jan 2, 2025
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Xiaoyun GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD
- Publication number 20240404816
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...
- Publication number 20240304433
- Publication date Sep 12, 2024
- The Regents of the University of Michigan
- David ANDERSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND COMPOSITIONS FOR LOW SALINITY ENHANCED OIL RECOVERY
- Publication number 20230358694
- Publication date Nov 9, 2023
- BP CORPORATION NORTH AMERICA INC.
- Huang Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LINEAR ION TRAP AND METHOD FOR OPERATING THE SAME
- Publication number 20230335388
- Publication date Oct 19, 2023
- Shimadzu Corporation
- Kei KODERA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP SYSTEM AND ION TRAPPING METHOD
- Publication number 20230178355
- Publication date Jun 8, 2023
- HUAWEI TECHNOLOGIES CO., LTD.
- Weimin Lv
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR THE MOLECULAR ATOMIC ANALYSIS OF A FLUID I...
- Publication number 20230154739
- Publication date May 18, 2023
- ISTITUTO NAZIONALE DI FISICA NUCLEARE
- Giovanni CARUGNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230114331
- Publication date Apr 13, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Devices and Methods for Laser-Assisted Micro Mass Spectroscopy
- Publication number 20230012777
- Publication date Jan 19, 2023
- Chemring Sensors and Electronic Systems, Inc.
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20220326181
- Publication date Oct 13, 2022
- SHIMADZU CORPORATION
- Kenichi MISHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20220277946
- Publication date Sep 1, 2022
- KIOXIA Corporation
- Jiahong WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20220223399
- Publication date Jul 14, 2022
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20220223398
- Publication date Jul 14, 2022
- FLUIDIGM CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20220157587
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THE CHIRALITY OF MOLECULES
- Publication number 20210257199
- Publication date Aug 19, 2021
- Centre National de la Recherche Scientifique
- Yann MAIRESSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRUM RESOLUTION DEVICE FOR MEASURING LASER ABLATION ION SP...
- Publication number 20210249244
- Publication date Aug 12, 2021
- DALIAN UNIVERSITY OF TECHNOLOGY
- Hongbin DING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE FOR MASS SPECTROMETER AND ION SOURCE USING SAME
- Publication number 20210233759
- Publication date Jul 29, 2021
- Bioneer Corporation
- Taeman KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Loading an Ion Trap
- Publication number 20210217598
- Publication date Jul 15, 2021
- DUKE UNIVERSITY
- Geert VRIJSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE SUPPORTING BODY, METHOD FOR IONIZING SAMPLE, AND MASS SPECTR...
- Publication number 20210028002
- Publication date Jan 28, 2021
- Hamamatsu Photonics K.K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20200395205
- Publication date Dec 17, 2020
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING DEVICE, ANALYTICAL DEVICE, ANALYZING METHOD, AND COMPUTER...
- Publication number 20200098553
- Publication date Mar 26, 2020
- Shimadzu Corporation
- Takushi Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20190341241
- Publication date Nov 7, 2019
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20190341242
- Publication date Nov 7, 2019
- KABUSHIKI KAISHA TOSHIBA
- Reiko SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Loading an Ion Trap
- Publication number 20190287782
- Publication date Sep 19, 2019
- DUKE UNIVERSITY
- Geert VRIJSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD
- Publication number 20190279855
- Publication date Sep 12, 2019
- Toshiba Memory Corporation
- Akira KURAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE PRESENCE OF IONS IN A SAMP...
- Publication number 20190259596
- Publication date Aug 22, 2019
- The University of Manchester
- Kieran FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW POWER PHOTOIONIZATION DETECTOR (PID)
- Publication number 20190170691
- Publication date Jun 6, 2019
- HONEYWELL INTERNATIONAL INC.
- Peter HSI
- G01 - MEASURING TESTING
Information Patent Application
VACUUM PROCESSING DEVICE AND MASS ANALYZING DEVICE
- Publication number 20190066990
- Publication date Feb 28, 2019
- SHIMADZU CORPORATION
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL DEVICE
- Publication number 20190051505
- Publication date Feb 14, 2019
- Shimadzu Corporation
- Kosuke HOSOI
- H01 - BASIC ELECTRIC ELEMENTS

using photoionisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging mass spectrometer

Devices and methods for laser-assisted micro mass spectroscopy

High resolution imaging apparatus and method

Rapid droplet introduction interface (RDII) for mass spectrometry

Analysis apparatus and analysis method

Multiple gas flow ionizer

System and method for loading an ion trap

Method and system for measuring the chirality of molecules

Sample support body

High resolution imaging apparatus and method

Low power photoionization detector (PID)

Fabrication of mass spectrometry surface

Multiple gas flow ionizer

Mass spectrum resolution device for measuring laser ablation ion sp...

Mass spectrometer and mass spectrometry method

Sample analyzer and sample analysis method

Analyzing device, analytical device, analyzing method, and computer...

Ion analyzer

System and method for loading an ion trap

Methods of detecting biological prints, fluids or analytes therein...

Surface layer disruption and ionization utilizing an extreme ultrav...

Multiple gas flow ionizer

Vacuum processing apparatus and mass spectrometer

Frequency scan linear ion trap mass spectrometry

Analytical device

Method for treating a cancer patient based on atomic therapeutic in...

Sample loading apparatus for laser ablation

Aerosol ionizer

Apparatus for measuring ion mobility of harmful material and refere...

Mass spectrometry apparatus for ultraviolet light ionization of neu...

Patents Applicationslast 30 patents

NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...

SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...

METHODS AND COMPOSITIONS FOR LOW SALINITY ENHANCED OIL RECOVERY

LINEAR ION TRAP AND METHOD FOR OPERATING THE SAME

ION TRAP SYSTEM AND ION TRAPPING METHOD

METHOD AND APPARATUS FOR THE MOLECULAR ATOMIC ANALYSIS OF A FLUID I...

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

Devices and Methods for Laser-Assisted Micro Mass Spectroscopy

IMAGING MASS SPECTROMETER

ANALYSIS APPARATUS AND ANALYSIS METHOD

MULTIPLE GAS FLOW IONIZER

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

METHOD AND SYSTEM FOR MEASURING THE CHIRALITY OF MOLECULES

MASS SPECTRUM RESOLUTION DEVICE FOR MEASURING LASER ABLATION ION SP...

ION GUIDE FOR MASS SPECTROMETER AND ION SOURCE USING SAME

System and Method for Loading an Ion Trap

SAMPLE SUPPORTING BODY, METHOD FOR IONIZING SAMPLE, AND MASS SPECTR...

MULTIPLE GAS FLOW IONIZER

ANALYZING DEVICE, ANALYTICAL DEVICE, ANALYZING METHOD, AND COMPUTER...

MULTIPLE GAS FLOW IONIZER

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

System and Method for Loading an Ion Trap

SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD

METHOD AND APPARATUS FOR DETERMINING THE PRESENCE OF IONS IN A SAMP...

LOW POWER PHOTOIONIZATION DETECTOR (PID)

VACUUM PROCESSING DEVICE AND MASS ANALYZING DEVICE

ANALYTICAL DEVICE