SCALABLE EMBEDDED DRAM ARRAY

Abstract

A method and apparatus for scaling an embedded DRAM array from a first process to a second process, wherein the scaling involves reducing the linear dimensions of features by a constant scale factor. From the first process to the second process, DRAM cell capacitor layout area is reduced by the square of the scale factor, while cell capacitance is reduced by the scale factor. The voltage used to supply the logic transistors is scaled down from the first process to the second process. However, the voltage used to supply the sense amplifiers remains constant in both processes. Thus, in an embedded DRAM array of the second process, sense amplifiers are supplied by a greater voltage than the logic transistors. This allows the sensing voltage of DRAM cells to be maintained from one process generation to another, while allowing memory size to scale with the square of the process scale factor.

Description

FIELD OF THE INVENTION

The present invention is applicable to Dynamic Random Accessible Memory (DRAM). More specifically, it relates to a method and apparatus for increasing the sensing speed of sense-amplifiers in an embedded DRAM system. The present invention further relates to the scaling of DRAM cells using trench or stack capacitors in embedded memory applications.

RELATED ART

FIG. 1 is a schematic diagram of a conventional DRAM cell 100 which consists of a PMOS pass-gate select transistor 101 coupled to a storage capacitor 102. DRAM cell 100 is written, read and refreshed in a manner known to those of ordinary skill in the art, by applying access voltages to bit line 103, word line 104, the counter-electrode of storage capacitor 102, and the n-well region 105 in which PMOS transistor 101 is fabricated.

As the process technology continues to advance and device geometry continues to scale down, the lateral or planar dimensions of DRAM cell 100 are required to scale down in order to keep up with the technology scaling. Scaling down DRAM cell 100 advantageously reduces the required area-per-bit and thus the cost-per-bit of the memory. The general practice in DRAM scaling has been to reduce the area of DRAM cell 100, without substantially decreasing the capacitance of storage transistor 102 from one process generation to another.

Note DRAM cell 100 is typically fabricated using a process optimized for a DRAM system, and typically includes capacitor structures fabricated with multiple polysilicon and insulator layers, or in deep trenches, such that a standard DRAM cell has a capacitance greater than 20 fF (and typically about 30 fF).

For example, in the DRAM described in “A 1-Mbit CMOS Dynamic RAM with a Divided Bitline Matrix Architecture” by R. T. Taylor et al, IEEE JSSC, vol. SC-20, No. 5, pp. 894-902 (1985), a DRAM cell having a cell storage capacitance of 32 fF is fabricated using a process with critical dimensions of 0.9 um; in “Dual-Operating-Voltage Scheme for a Single 5-V 16-Mbit DRAM”, by M. Horiguchi et al, IEEE JSSC, vol. 23, No. 5, pp. 1128-1132 (1988), a DRAM cell having a cell storage capacitance of 33 fF is fabricated using a 0.6 um process; and in “A Mechanically Enhanced Storage Node for Virtually Unlimited Height (MESH) Capacitor Aiming at sub 70 nm DRAMs”, by D. H. Kim et al, IEDM Tech. Dig., pp. 69-72 (2004), a DRAM cell having a cell storage capacitance of 30 fF is fabricated using a 70 nm process. Thus, a DRAM cell storage capacitance of approximately 30 fF has been maintained through many generations of process scaling.

The reasoning for maintaining a constant DRAM cell storage capacitance is described below. In general, a constant storage capacitance has been deemed necessary to maintain a relatively constant bit-line sensing voltage (V_S) across advancing processes.

The bit lines associated with DRAM cell 100 (i.e., bit line 104 and a reference bit line that is not shown) are typically pre-charged to voltage equal to V_CC/2 prior to a sensing operation (wherein V_CC is the supply voltage). Under these conditions, the bit line sensing voltage (V_S) can be approximated by the following equation, wherein C_C is the storage capacitance of DRAM cell 100 and C_P is the parasitic bit line capacitance. V_S=V_CC(C_C)/[2(C_C+C_P)]  (1)

In general, the cell capacitance C_C is significantly smaller than the bit line capacitance C_P. For example, the cell capacitance C_C is typically at least three times smaller than the bit line capacitance C_P. Equation (1) can therefore be approximated by the following equation. V_S=V_CC(C_C)/2C_P   (2)

The bit line capacitance C_P has two components, including a metal capacitance C_M and a junction capacitance C_J.

The metal capacitance C_M, in turn, has two components, including an area capacitance C_A and a side-wall capacitance C_SW. The area capacitance C_A represents the capacitances that exist between the bit line and the underlying and overlying layers. The side-wall capacitance C_SW represents the capacitance that exists between the bit line and the neighboring bit lines. Downward scaling from one process generation to another usually scales the linear dimensions of the feature sizes by a scale factor, for example ‘S’. This downward process scaling causes the area capacitance C_A to be reduced as the square of the process scaling-factor S. However, downward scaling also decreases the distance between neighboring bit lines, thereby causing the side-wall capacitance C_SW to increase by the same scale factor S. The combined scaling effects of the area capacitance C_A and the side-wall capacitance C_SW results in the metal capacitance C_M being reduced by approximately the scale factor S.

The junction capacitance C_J is dependent on the drain junction area of the select transistor 101 (which is coupled to bit line 104), and the dopant concentration of this drain junction. Downward scaling causes the drain junction area to be reduced by a the square of the scale factor S. However, the drain junction dopant concentration increases in successive generations of process technology. These combined scaling effects result in the junction capacitance C_J being reduced by approximately the scale factor S.

Because the metal capacitance C_M and the junction capacitance C_J both scale downward by a constant scale factor, the bit line capacitance C_P also scales downward by the same scale factor. As transistors scale down from one process generation to another, the V_CC supply voltage from which the transistors can reliably operate decreases. For example, the nominal V_CC supply voltages for typical 0.25 um, 0.18 um, and 0.13 um processes are 2.5 Volts, 1.8 Volts, and 1.3 Volts, respectively. Thus, the V_CC supply voltage scales downward by the same process scale from one process generation to another.

The downward scaling factor of the V_CC supply voltage offsets the downward scaling factor of the bit line capacitance C_P. Thus, equation (2) can be approximated as follows for process scaling purposes (wherein ‘k’ is a constant). V_s=k(C_C)   (3)

Thus, the sensing voltage V_S can be maintained at a relatively constant level with process advancement, as long as the storage capacitance C_C remains constant with process advancement. However, it is difficult to maintain a constant storage capacitance C_C across advancing processes.

FIG. 2 is a cross sectional view of simple planar DRAM cell 200, which includes PMOS pass-gate select transistor 201 and storage capacitor 202. DRAM cell 200 is considered a planar cell because both select transistor 201 and storage capacitor 202 are located substantially at the surface of silicon substrate 220 (i.e., the surface of n-well region 221). Select transistor 201 includes drain 211, source 212, gate oxide 213 and gate electrode 214. Storage capacitor 202 is formed by a planar PMOS structure that includes source 212, capacitor dielectric layer 215 and counter-electrode 216. The charge stored by the planar storage capacitor 202 determines the logic state of the bit stored by DRAM cell 200. Field oxide 230 isolates DRAM cell 200 from other DRAM cells fabricated in N-well 221. DRAM cell 200 is described in more detail in U.S. Pat. No. 6,075,720 by Wingyu Leung and Fu-Chieh Hsu, entitled “Memory Cell For DRAM Embedded In Logic”.

The downward scaling of planar storage capacitor 202 causes the cell capacitance C_C to be reduced by a factor equal to the square of the process scaling factor S. This is because both the length and width of the planar storage capacitor 202 are reduced by the scale factor S. For this reason, it has been difficult to maintain a constant cell capacitance C_C across advancing processes using planar storage capacitors.

Thus, maintaining a constant cell capacitance C_C while scaling down the lateral or planar dimensions of a DRAM cell has been achieved with the introduction of complex capacitor structures and non-standard dielectric materials. For example, the cell capacitance of DRAM cells has been improved using stacked capacitor structures and trench capacitor structures.

FIG. 3 is a cross sectional view of a stacked DRAM cell 300, which includes select transistor 301 and stacked cell capacitor 302. Stacked cell capacitor 302 includes conductive elements 321-323. Conductive elements 321 and 322 form the electrode and counter-electrode, respectively, of cell capacitor 302, while conductive element 323 connects capacitor electrode 321 to the source of select transistor 301. Stacked cell capacitor 302 has a metal-insulator-metal (MIM) structure, wherein a dielectric material is located between electrode 321 and counter-electrode 322. Stacked cell capacitor 302 is formed at least partially over select transistor 301 to minimize layout area of DRAM cell 300. The capacitance of stacked capacitor 302 largely depends on the vertical height of electrode 321 and counter-electrode 322. Thus, the capacitance of stacked capacitor 302 can be increased by increasing the vertical dimensions of electrode 321 and counter-electrode 322. However, increasing these vertical dimensions such that a constant capacitance is maintained across advancing processes further complicates the process required to fabricate DRAM cell 300. DRAM cell 300 is described in more detail in U.S. Patent Application Publication No. US2005/0082586 A1 by Kuo-Chi Tu et al, entitled “MIM Capacitor Structure and Method of Manufacture”.

FIG. 4 is a cross sectional view of a folded (trench) capacitor DRAM cell 400, which includes PMOS select transistor 401 and folded capacitor structure 402. Note that folded capacitor structure includes a portion that is ‘folded’ along the side-wall of a trench formed in field oxide region (FOX). The capacitance of trench capacitor 402 largely depends on the depth of this trench. Thus, the capacitance of trench capacitor 402 can be increased by increasing the depth of the trench. However, increasing this depth such that a constant capacitance is maintained across advancing processes further complicates the process required to fabricate DRAM cell 400. DRAM cell 400 is described in more detail in U.S. Pat. No. 6,642,098 B2 by Wingyu Leung and Fu-Chieh Hsu, entitled “DRAM Cell Having A Capacitor Structure Fabricated Partially In A Cavity And Method For Operating The Same”.

Stack capacitor 302 and trench capacitor 402 each has two main capacitive components: a vertical or side-wall component and a horizontal or lateral component. In deep submicron processes such as processes with 0.13 um or smaller features, the vertical component is substantially larger than the horizontal component. The vertical component of the cell capacitance is determined by the side-wall area, which includes both a vertical dimension and a planar dimension. Process scaling tends to decrease the planar feature sizes so as to decrease the overall size of the semiconductor device. (Note that it not generally necessary to reduce the vertical feature size to reduce the overall size of the semiconductor device.) As a result, the side-wall area (and therefore the vertical component of the cell capacitance) is scaled down directly with process scale factor. Because the vertical component of the cell capacitance dominates the cell capacitance, the cell capacitance is also scaled approximately by the process scale factor.

Process scaling therefore causes both the cell capacitance and the bit line capacitance to scale down with the process scale factor for DRAM cells using stack capacitor 302 or trench capacitor 402. Consequently, it is easier to scale stack capacitor 302 and trench capacitor 402 than planar capacitor 202. However, stacked capacitor structure 302 and folded capacitor structure 402 will still exhibit a relatively low capacitance of about 1.5 to 10 femto-Farads (fF) if fabricated in accordance with a conventional CMOS process. Thus, scaling stacked capacitor structure 302 and folded capacitor structure 402 requires process modifications that provide for higher sidewalls and deeper trenches, respectively. In general, the higher the stack or the deeper the trench, the more complicated the processing steps required to form the cell capacitor.

Non-standard dielectric materials (i.e., dielectric materials other than silicon oxide) used in DRAM capacitors include silicon oxy-nitride, tantalum pentoxide and zirconium oxide. An example of a tantalum pentoxide cell is described in “A 2.5V 333 Mb/s/pin 1 Gb Double Data Rate SDRAM”, by H. Yoon et al, Digest of ISSCC, 1999, pp. 412-412. The non-standard dielectric materials exhibit higher dielectric constants, which tend to increase the capacitance of the DRAM cell capacitor, thereby compensating for the reduction in capacitance due to lateral down scaling. However, the use of non-standard dielectric materials adds cost and complexity to the associated process. Note that planar capacitor 202, stacked capacitor 302 and trench capacitor 402 each includes only one dielectric layer located between the electrode and counter-electrode.

It would therefore be desirable to have a DRAM cell that is readily scalable, and can be fabricated using a CMOS process, without exhibiting the shortcomings described above.

SUMMARY

The present invention provides an improved method for scaling an embedded DRAM array from a first process to a second (advanced) process. The layout area of the DRAM cell capacitors is reduced from the first process to the second process. In a particular embodiment, the DRAM cell capacitance is scaled down directly with the process scale factor. Such DRAM cell capacitance scaling can be achieved by using a folded capacitor structure, a stacked (MIM) capacitor structure, or a trench capacitor structure.

A first V_CC supply voltage is used to operate the embedded circuits fabricated in accordance with the first process, and a second (reduced) V_CC supply voltage is used to operate the embedded circuits fabricated in accordance with the second process. The first V_CC supply voltage is used to operate both logic transistors and sense amplifier transistors fabricated using the first process. However, the second V_CC supply voltage is only used to operate the logic transistors fabricated using the second process. A voltage greater than the second V_CC supply voltage is used to operate the sense amplifier transistors fabricated using the second process. In a particular embodiment, a voltage corresponding with the first V_CC supply voltage is used to operate the sense amplifier transistors fabricated using the second process. Stated another way, the voltage used to operate the sense amplifier transistors remains constant from the first process to the second process. As a result, a constant sensing voltage V_S is maintained from the first process to the second process.

The present invention will be more fully understood in view of the following description and drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a conventional DRAM cell which includes a PMOS select transistor coupled to a storage capacitor.

FIG. 2 is a cross sectional view of conventional planar DRAM cell, which includes a PMOS select transistor coupled to a planar storage capacitor.

FIG. 3 is a cross sectional view of a conventional DRAM cell, which includes a select transistor coupled to a stacked cell capacitor.

FIG. 4 is a cross sectional view of a conventional DRAM cell, which includes a PMOS select transistor coupled to a folded (trench) capacitor structure.

FIG. 5 is a block diagram of an integrated circuit chip fabricated using a 0.13 micron (130 nanometer) process, and a corresponding integrated circuit chip fabricated using a 65 nanometer (nm) process, in accordance with one embodiment of the present invention.

FIG. 6 is a block diagram illustrating various device parameters implemented by the integrated circuit chips of FIG. 5 in accordance with one embodiment of the present embodiment.

FIG. 7 is a circuit diagram of a sense amplifier for use in the integrated circuit chip of FIGS. 5 and 6 fabricated with the 65 nanometer (nm) process.

FIG. 8 is a circuit diagram of a voltage translation circuit for use in the sense amplifier circuit of FIG. 7.

FIG. 9 is a block diagram of a boosted voltage generator used to generate a boosted sense amplifier enable signal for use in the present invention.

FIG. 10 is a circuit diagram of a voltage comparator including a step down circuit, which can be used in the boosted voltage generator of FIG. 9.

DETAILED DESCRIPTION

In accordance with the present invention, the sensing voltage V_S of embedded DRAM arrays in advancing processes is maintained at a constant level by applying the same supply voltage to the DRAM sense amplifiers across these advancing processes. This is in contrast with the above-described prior art, in which the sensing voltage V_S of embedded DRAM arrays in advancing processes is maintained at a constant level by maintaining a constant cell capacitance C_C across these advancing processes.

In the present specification, the constant supply voltage applied to the sense amplifiers across advancing processes is designated V_CCS. Although the sense amplifier supply voltage V_CCS remains constant, the V_CC supply voltage continues to be reduced across advancing processes. The V_CC supply voltage is still used to supply the rest of the on-chip circuitry (e.g., embedded logic circuits).

Substituting the constant sense amplifier supply voltage V_CCS into equation (2) provides the following equation for the sensing voltage V_S. V_S=V_CCS(C_C)/2C_P   (4) Because V_CCS is constant, equation (4) can be simplified as follows (where K is a constant). V_S=K(C_C)/C_P   (5)

As described above, the bit line capacitance C_P decreases linearly with advancing processes. Thus, the cell capacitance C_C is also allowed to decrease linearly with advancing processes without changing the sensing voltage V_S.

Stated another way, because the sensing voltage V_S is maintained at a constant level across advancing processes by controlling the sense amplifier supply voltage V_CCS, the cell capacitance C_C does not need to be maintained at a constant value (e.g., 30 fF) across advancing processes. That is, the cell capacitance C_C may decrease across advancing processes, thereby allowing the memory cell size to be scaled. More specifically, the memory cell size may be scaled down without incurring the higher processing cost of increasing substantially the trench depth or stack height of the cell capacitor.

In accordance with one embodiment of the present invention, a DRAM array is embedded in a logic process such that the additional process steps required to construct the DRAM cells has no significant effect on the performance of the logic transistors. In one embodiment, the embedded DRAM array is fabricated in an ASIC or logic process that has critical dimensions of 0.13 microns or less. The logic transistors in this process therefore have a gate oxide thickness of approximately 20 Angstroms or less. If these logic transistors were used to construct DRAM cells as shown in FIG. 4, the gate oxide leakage would be undesirably high, thereby causing the DRAM cells to have a very short data retention time. Thus, in accordance with the described embodiments of the present invention, the gate oxide thickness of MOS devices used to form the embedded DRAM cells is modified to be approximately 26 Angstroms. A gate oxide thickness of 26 Angstroms advantageously minimizes the gate leakage of the DRAM cells, without unduly complicating the associated process. As described in more detail below, the gate oxide thickness of the DRAM cells is kept constant, and is not scaled with the process. As a result, the voltage stored in the capacitor of the DRAM cell (i.e., the sensing voltage V_S) can be kept substantially constant across advancing processes, without affecting the reliability of the DRAM cells.

In accordance with one embodiment of the present invention, the cell capacitor structure is selected such that the capacitance of this structure decreases linearly with advancing processes. Examples of such cell capacitor structures include folded (trench) capacitors, stacked capacitors, and normal trench capacitors such as those described in “Cosmic Ray Soft Error Rates of 16-Mb DRAM Memory Chips”, by J. F. Ziegler et al, IEEE JSSC vol. 33, No. 2, February 1998, pp. 246-251.

An embedded DRAM cell structure that may be used in accordance with one embodiment of the present invention is described in more detail in commonly owned U.S. Pat. No. 6,573,548 B2 by Wingyu Leung and Fu-Chieh Hsu, entitled “DRAM cell having a capacitor structure fabricated partially in a cavity and method for operating the same”, which is hereby incorporated by reference in its entirety. This DRAM cell implements a folded (trench) capacitor cell structure as illustrated in FIG. 4.

Another embedded DRAM cell that may be used in accordance with the present invention is described in more detail in U.S. Patent Application Publication No. US2005/0082586 A1 by Kuo-Chi Tu et al., entitled “MIM Capacitor Structure and Method of Manufacture”. This DRAM cell implements a stacked metal-insulator-metal (MIM) capacitor cell structure as illustrated in FIG. 3.

These embedded DRAM cells will have a relatively small cell capacitance of about 1.0 to 5.0 fF (even when using an oxide thickness of 26 Angstroms). To compensate for this small cell capacitance, relatively short bit lines, having a relatively small bit line capacitance C_P, are used in the DRAM array. In one embodiment, the bit lines are kept short by limiting the number of word lines (i.e., the number of DRAM cells per column) in the DRAM array to 64 or less. To limit the amount of loading on the circuitry generating the sense amplifier supply voltage V_CCS, the DRAM array may also use relatively short word lines, wherein the DRAM array has less than 700 columns. Within the DRAM array, a sense amplifier is required for every column. By limiting the number of columns in an array to a relatively small number, the number of sense amplifiers that are turned on during each access is limited, and therefore the power requirements of the sense amplifier voltage supply is limited for a memory operation. The short bit line and word line array organization also provides the benefits of fast memory cycle time and low operating power.

FIG. 5 is a block diagram of an integrated circuit chip 500 fabricated using a 0.13 micron (130 nanometer) process, and a corresponding integrated circuit chip 600 fabricated using a 65 nanometer (nm) process, in accordance with one embodiment of the present invention. Integrated circuit chip 500 includes embedded DRAM array 501 and logic 502, while integrated circuit chip 600 includes embedded DRAM array 601, logic circuit 602 and voltage boosting circuit 603. Embedded DRAM array 501 includes N DRAM banks 510₁-510_N, each having a corresponding sense amplifier circuit 520₁-520_N, and a memory controller 530. Similarly, embedded DRAM array 601 includes N DRAM banks 610₁-610_N, each having a corresponding sense amplifier circuit 620₁-620_N, and a memory controller 630. In the described embodiments, each of DRAM banks 510₁-510_N and 610₁-610_N includes a 32 row by 512 column array of DRAM memory cells.

In one embodiment, DRAM arrays 501 and 601 can be implemented using a 32 k×32 memory macro similar to the one described in commonly owned U.S. Pat. No. 6,504,780 B2, “Method and Apparatus For Completely Hiding Refresh Operations In a DRAM Device Using Clock Division”, by Wingyu Leung. This memory macro consists of 64 DRAM banks (i.e., N=64), wherein each of these DRAM banks is organized into 32 rows and 512 columns. Two separate versions of the memory macro using the same memory architecture and memory cell structure are used to design DRAM array 501 and DRAM array 601.

Within the 130 nm integrated circuit chip 500, an external V_CC power supply, which provides a nominal V_CC1 supply voltage of 1.2 Volts, is used to operate sense amplifier circuits 520₁-520_N and logic circuit 502. However, in the 65 nm integrated circuit chip 600, an external V_CC power supply, which provides a reduced nominal V_CC2 supply voltage of 1.0 Volts, is used to operate logic circuit 602. Voltage boosting circuit 603 generates a boosted voltage V_CCS, which is used to operate sense amplifier circuits 620₁-620_N. In the described embodiment, the boosted voltage V_CCS is selected to be equal to the V_CC1 supply voltage of integrated circuit chip 500 (i.e., 1.2 Volts).

FIG. 6 is a block diagram illustrating various device parameters implemented by integrated circuit chips 500 and 600 in accordance with the present embodiment. More specifically, FIG. 6 illustrates: (1) DRAM cells 550 and 650, which are representative of the DRAM cells included in memory banks 510₁ and 610₁, respectively; (2) sense amplifier transistors 521 and 621, which are representative of the transistors implemented by sense amplifier circuits 520₁ and 620₁, respectively; and (3) logic transistors 512 and 612, which are representative of the transistors implemented in logic circuits 502 and 602, respectively. DRAM cell 550 includes access transistor 551 and cell capacitor 552, while DRAM cell 650 includes access transistor 651 and cell capacitor 652.

On 130 nm integrated circuit chip 500, logic transistor 512 and sense amplifier transistor 521 each has a gate oxide thickness G_OX1 of approximately 20 Angstroms. This thickness is selected to optimize the performance of logic transistor 512 and sense amplifier transistor 521 in response to the V_CC1 supply voltage of 1.2 Volts.

Within DRAM cell 550, access transistor 551 has a gate oxide thickness G_OX3 of about 26 Angstroms. Similarly, the thickness of the capacitor oxide C_OX of cell capacitor 552 has a thickness of about 26 Angstroms. As described above, these increased oxide thicknesses advantageously increase the data retention time of DRAM cell 550. In the described example, cell capacitor 552 has a capacitance C_C1 of about 3.2 fF. DRAM cell 550 has a layout area of about 0.52 micron², and an associated bit line capacitance C_P1 of about 11 fF.

On 65 nm integrated circuit chip 600, logic transistor 612 and sense amplifier transistor 621 each has a gate oxide thickness G_OX2 of about 16 Angstroms. This thickness is selected to optimize the performance of logic transistor 612 in response to the V_CC2 supply voltage of 1.0 Volt. The channel length of logic transistor 612 corresponds with the minimum line width of the 65 nm process, thereby allowing this transistor to exhibit a fast switching time.

Sense amplifier transistor 621 operates in response to the boosted V_CCS voltage of 1.2 Volts. To allow sense amplifier transistor 621 to operate at this higher voltage without reliability degradation, the channel length of this transistor 621 is made longer than the minimum line width of the 65 nm process. For example, sense amplifier transistor 621 may have a channel length of about 90 nm.

As mentioned above, the sense amplifier supply voltage V_CCS of 1.2 Volts is generated by voltage boosting circuit 603 in response to the V_CC2 supply voltage of 1.0 Volt. The internally generated V_CCS voltage has a much smaller variation (±50 mv) than the external V_CC2 supply voltage (±100 mV). This smaller variation exists because the V_CCS voltage is used exclusively to supply the sense amplifier circuits, and because there are only 512 sense amplifier circuits in a memory block (as compared to 1024 or more in a standard DRAM array). Thus, the amount of switching current and consequently the voltage noise is minimized. The tighter voltage regulation together with the use of slightly longer channel length in the sense amplifier transistors (e.g., sense amplifier transistor 621) allows the use of a higher supply voltage in the sense-amplifier transistors without compromising the reliability of the sense-amplifier circuit.

Within DRAM cell 650, access transistor 651 has a gate oxide thickness G_OX3 of about 26 Angstroms. Similarly, the thickness of the capacitor oxide C_OX of cell capacitor 652 has a thickness of about 26 Angstroms. In the described example, cell capacitor 652 has a capacitance C_C2 of about 1.6 fF. DRAM cell 650 has a layout area of about 0.13 micron², and an associated bit line capacitance C_P2 of about 5.5 fF.

Substituting the above-described values of V_CC1, C_C1 and C_P1 in equation (1) yields a sensing voltage V_S for memory bank 510₁ of about 0.135 Volts. Substituting the above-described values of V_CCS, C_C2 and C_P2 in equation (1) yields a sensing voltage V_S for memory bank 610₁ of about 0.135 Volts. Thus, the sensing voltage V_S is not reduced when scaling from the 130 nm process to the 65 nm process. However, the bit line capacitance C_P and cell capacitance C_C are scaled down by half, and the DRAM cell size is scaled down in square fashion by a factor of four. This result of memory array scaling is achieved without changing the trench depth (3500 Angstroms) of the cell capacitor.

FIG. 7 is a circuit diagram of a sense amplifier 700 used in accordance with one embodiment of the present invention. For example, sense amplifier 700 may be present in sense amplifier circuit 620₁ of FIG. 6. Sense amplifier 700 is similar to the sense amplifier shown in FIG. 1 of commonly owned U.S. Pat. No. 6,324,110 B1 ; “High-speed Read-write Circuitry For Semi-conductor Memory,” by Wingyu Leung and Jui-Pin Tang, except that sense amplifier uses a sense amplifier power supply voltage V_CCS, which is different than the V_CC2 supply voltage used by logic circuitry within or outside the memory macro.

The bi-stable sense-amplifier 700 consists of a cross-coupled pair of PMOS transistors P1-P2 and a cross-coupled pair of NMOS transistors N1-N2. The sources of the PMOS cross-coupled pair are connected to the virtual supply line VSL. The virtual supply line VSL is common to the other sense amplifiers of the same memory block (e.g., sense amplifier 701 and the other sense amplifiers in sense amplifier circuit 620₁). The sources of the NMOS cross-coupled pair are connected to the virtual ground line VGL. The virtual ground line VGL is common to other sense amplifiers of the same memory block. The cross-coupled transistor pairs P1-P2 and N1-N2 form a regenerative sense-amplifier, which amplifies the differential signal present on the complementary bit line pair BL and BL#. The amplified signal on the bit line pair BL and BL# is coupled to the data line pair DL and DL# through NMOS transistors N4 and N5 during a read or write access to the memory block.

NMOS transistors N6 and N7 couple bit lines BL and BL#, respectively, to a internally generated voltage which is approximately equal to half of the sense amplifier supply voltage V_CCS. The gates of transistors N6 and N7 are coupled to receive the equalization (or pre-charge) control signal EQ. When the memory block is not accessed, the equalization signal EQ is activated high, thereby pre-charging the bit lines BL and BL# to V_CCS/2. The virtual supply line VSL is coupled to the sense amplifier supply voltage V_CCS by PMOS transistor P3. The gate of transistor P3 is coupled to receive sense amplifier enable signal SE#, which is an active low signal. Similarly, the virtual ground line VGL is coupled to the ground voltage supply by NMOS transistor N3. The gate of transistor N3 is coupled to receive sense amplifier enable signal SE, which is an active high signal (and the complement of SE#).

During a memory access, the sense amplifier enable signals SE/SE# are activated, and the regenerative latch formed by transistors P1-P2 and N1-N2 amplifies the small sense signal on bit line pair BL/BL#. The regenerative latch also performs data restoration, so that the storage capacitor of the selected DRAM cell is charged substantially close to ground or the V_CCS supply voltage at the end of a sensing operation. The charge stored in the cell capacitor is directly proportional to the restore voltage. For a logic ‘1’ data value the restored voltage is close to the V_CCS sense amplifier supply voltage, and for a logic ‘0’ data value the restored voltage is close to ground. Because the bit lines BL/BL# are pre-charged to V_CCS/2 the stored charges representing a logic ‘1’ value and a logic ‘0’ value are equal, but opposite in polarity. In both cases, the amount of stored charge (Q) is defined by equation (6) below. Q=V_CCS*C_C/2   (6)

By using the internally generated sense-amplifier supply voltage V_CCS, which has a higher voltage than the external power supply V_CC2, the charge stored in the DRAM cell capacitor is increased, and thus the sensing voltage (V_S) generated on the bit line pair BL/BL# is also increased.

The sensing time required for sense amplifier 700 to amplify the sensing voltage (V_S) on bit line pair BL/BL# to the full V_CCS voltage is dominated by the initial sensing current in the regenerative latch formed by transistors P1-P2 and N1-N2 when the sense amplifier enable signals SE and SE# are activated. This initial sensing current is proportional to the square of the difference between the bit-line pre-charge voltage V_CCS/2 and the absolute threshold voltage (V_T) of the transistors, or (V_CCS/2−V_T)².

In sense amplifier 700 (which was fabricated using the 65 nm process), the minimum value of V_CCS/2 is 0.575 Volts (i.e., (1.2 Volts−50 millivolt variation)/2). The absolute threshold voltage is about 0.4 Volts, such that the initial sensing current is equal to 0.03 k, where k is a proportional constant.

In contrast, if sense amplifier 700 were supplied by the V_CC2 supply voltage of 1.0 Volt, the minimum pre-charge voltage would be equal to 0.45 Volts (i.e., (1.0 Volt−0.1 Volt variation)/2). Again, the absolute threshold voltage is about 0.4 Volts, such that the initial sensing current would be equal to 0.0025 k. Boosting the sense amplifier supply voltage V_SSC to 1.2 Volts in the present embodiment therefore increases the initial sensing current of sense amplifier 700 by a factor of 12, thereby increasing the sensing speed of sense amplifier 700.

In another embodiment, the transistors of sense amplifier 700 are modified to have an increased gate oxide thickness of 26 Angstroms (i.e., the same thickness as the oxide used in the DRAM cells). In this embodiment, the channel lengths of the transistor gates are all increased to 0.18 microns. The longer gate lengths and the increased gate oxide thickness allow sense amplifier supply voltage V_CCS to be increased to 2.0 Volts, without compromising the long-term reliability of the sense amplifier 700. Increasing the channel length of the transistors to 0.18 microns increases the overall layout area of sense amplifier 700 by less than 10 percent because the layout area is dominated by interconnect structures associated with the transistors and the channel widths of these transistors, which have dimensions substantially greater than 0.18 microns. A sense amplifier supply voltage V_CCS of 2.0 Volts allows 67 percent more charge to be stored in the DRAM cell capacitor than a sense amplifier supply voltage V_CCS of 1.2 Volts. As a result, the cell capacitance of the memory cell can be reduced by 67 percent without affecting the sensing voltage V_S.

The folded capacitor shown in FIG. 4 includes both a planar component and a side-wall component. The side-wall component dimension is limited by the minimum lateral design rules and the trench depth of the process. Therefore, side-wall capacitance cannot be reduced further. The planar component, however, can be reduced to design rules minimum.

This results in a cell size reduction of less than 10 percent, because the lateral dimension of the original cell capacitor is already quite close the design rule limit. The benefit of this scheme is more prominent if a planar capacitor structure is used instead of trench or stack capacitor structure. This is because, as illustrated in FIG. 2, when using a planar capacitor structure, the cell size is pre-dominantly occupied by the lateral storage capacitance.

Because logic circuit 602 has a voltage swing of V_CC2 to ground, the logic signals used to activate equalization circuit EQ, column select signal CS and sense amplifier enable signals SE and SE# must be translated to a voltage swing of V_CCS to ground. FIG. 8 is a circuit diagram of a voltage translation circuit 800 that can be used for this purpose. Voltage translation circuit 800, which includes PMOS transistors 801-802, NMOS transistors 803-804 and inverter 805, generates the sense amplifier enable signals SE/SE# in response to a SENSE logic signal, which has a voltage swing of V_CC2 to 0. The equalization signal EQ and column select signal CS can be generated in a similar manner. Because voltage translation is well known in the art of memory and logic design, this circuit is not elaborated further in this disclosure.

In accordance with one embodiment, voltage boosting circuit 603 (FIG. 6) is a charge pump regulator, which generates the sense-amplifier supply voltage V_CCS of 1.2 Volts in response to the 1 Volt external power supply V_CC2. Charge pump regulators are well known in the art. FIG. 9 is a block diagram of a boosted voltage generator 603 used in one embodiment of the present invention. Boosted voltage generator 603 includes a ring oscillator 901, a charge pump 902 and a voltage comparator 903, which compares the output voltage V_CCS of the generator with a reference voltage V_REF. If the reference voltage V_REF is higher than V_CCS, then the output (INHIBIT) of voltage comparator 903 is driven low and ring oscillator 901 and charge pump 902 are enabled. When enabled, charge pump 902 causes the sense amplifier supply voltage V_CCS to increase. When the sense amplifier supply voltage V_CCS becomes slightly higher than the reference voltage V_REF, the INHIBIT output of voltage comparator 903 is driven high, thereby disabling ring oscillator 901 and charge pump 902. Ring oscillator 901 and charge pump 902 are conventional elements that are well documented in references such as U.S. Pat. Nos. 5,703,827 and 5,267,201. The reference voltage V_REP can be generated external to the memory using a band-gap reference circuit such as those described in “Analysis and Design of Analog Integrated Circuits”, by P. R. Gray and R. G. Meyer, John Wiley and Sons Inc. 3^rd edition, 1993, pp. 338-346.

FIG. 10 is a circuit diagram of voltage comparator 903, as used in one embodiment of the present invention. Voltage comparator 903 includes PMOS transistors 1001-1003, NMOS transistors 1011-1019 and resistor R1. Transistors 1001-1003 and 1015-1018 form a conventional two-stage differential amplifier, which amplifies the differential signal applied to the gates of transistors 1015 and 1016. The small differential signal is amplified and converted into a full swing digital output signal, INHIBIT. Because the voltages V_REF and V_CCS received by comparator 903 are normally greater than V_CC2, a voltage step down circuit is used to ensure that the two stage amplifier stays in a high gain operating region. Transistors 1011-1014 form a source-follower that translates both the reference voltage V_REF and sense amplifier supply voltage V_CCS to values about one threshold voltage drop (V_T ˜0.4 Volts) lower than their respective values. Resistor R1 and transistor 1019 form a biasing circuit setting transistors 1013, 1014, 1017 and 1018 in the saturation region. By using a band-gap voltage reference with low temperature coefficient and a high gain comparator, the V_CCS voltage can be regulated with high precision. Because the loading on the V_CCS voltage supply is minimized by using a small bank size, with a relatively small number of sense amplifiers turning on at one time, the switching noise amplitude is minimized.

Although the present invention has been described in connection with several embodiments, it is understood that this invention is not limited to the embodiments disclosed, but is capable of various modifications, which would be apparent to one of ordinary skill in the art. Thus, the invention is limited only by the following claims.

Claims

1. An integrated circuit comprising: a first voltage supply terminal configured to receive a first supply voltage; logic circuitry configured to operate in response to the first supply voltage; a second voltage supply terminal configured to receive a second supply voltage, which is greater than the first supply voltage; and a dynamic random access memory (DRAM) array having a plurality of sense amplifiers, wherein the sense amplifiers are configured to operate in response to the second supply voltage.

2. The integrated circuit of claim 1, wherein the DRAM array has 64 rows or less.

3. The integrated circuit of claim 1, wherein the DRAM array includes a plurality of DRAM cells, each having a cell capacitor with a capacitance of 6 femto-Farads or less.

4. The integrated circuit of claim 1, wherein the DRAM array includes a plurality of DRAM cells, each having a cell capacitor with a folded capacitor structure.

5. The integrated circuit of claim 1, wherein the DRAM array includes a plurality of DRAM cells, each having a cell capacitor with a trench capacitor structure.

6. The integrated circuit of claim 1, wherein the DRAM array includes a plurality of DRAM cells, each having a cell capacitor with a stacked capacitor structure.

7. The integrated circuit of claim 6, wherein the stacked capacitor structure comprises a metal-insulator-metal (MIM) structure.

8. The integrated circuit of claim 1, wherein the DRAM array has 700 columns or less.

9. The integrated circuit of claim 1, wherein the logic circuitry includes logic transistors having a gate oxide with a first thickness, and the DRAM array includes a plurality of DRAM cells, each having a cell capacitor with an oxide layer of a second thickness, wherein the second thickness is greater than the first thickness.

10. The integrated circuit of claim 9, wherein the second thickness is about 26 Angstroms.

11. The integrated circuit of claim 1, wherein the logic circuitry includes logic transistors having a gate oxide with a first thickness, and wherein each of the sense amplifiers includes a plurality of sense amplifier transistors having a gate oxide with a second thickness, wherein the second thickness is greater than the first thickness.

12. The integrated circuit of claim 11, wherein the logic transistors have a first channel length and the sense amplifier transistors have a second channel length, wherein the second channel length is greater than the first channel length.

13. The integrated circuit of claim 1, wherein the logic circuitry includes logic transistors having a gate oxide with a first thickness, and wherein each of the sense amplifiers includes a plurality of transistors having a gate oxide with a second thickness, wherein the second thickness is equal to the first thickness.

14. The integrated circuit of claim 13, wherein the logic transistors have a first channel length and the sense amplifier transistors have a second channel length, wherein the second channel length is greater than the first channel length.

15. The integrated circuit of claim 13, wherein the second supply voltage is at least about 20 percent greater than the first supply voltage.

16. The integrated circuit of claim 15, wherein the second supply voltage is at least about twice the first supply voltage.

17. The integrated circuit of claim 1, further comprising a boosted voltage generator configured to generate the second supply voltage in response to the first supply voltage.

18. A method of operating a dynamic random access memory (DRAM) array having a plurality of sense amplifiers embedded on the same chip as a logic circuit, the method comprising: operating the logic circuit in response to a first supply voltage; and operating the sense amplifiers of the DRAM array in response to a second supply voltage, which is greater than the first supply voltage.

19. The method of claim 18, further comprising generating the second supply voltage in response to the first supply voltage.

20. The method of claim 19, further comprising controlling the second supply voltage to be at least about 20 percent greater than the first supply voltage.

21. The method of claim 19, further comprising controlling the second supply voltage to be at least about twice the first supply voltage.

22. The method of claim 18, further comprising: fabricating transistor and capacitor structures in the DRAM array with gate oxide having a first thickness; and fabricating transistors in the logic circuit with gate oxide having a second thickness, wherein the first thickness is greater than the second thickness.

23. A method for scaling a DRAM array embedded on the same chip as a logic circuit comprising: applying a first supply voltage to logic transistors of a first logic circuit; applying a second supply voltage to sense amplifier transistors of a first DRAM system, wherein the first logic circuit and the sense amplifier transistors of the first DRAM array are located on first chip fabricated using a first generation process; applying a third supply voltage, less than the first supply voltage, to logic transistors of a second logic circuit; and applying a fourth supply voltage, greater than the third supply voltage, to sense amplifier transistors of a second DRAM system, wherein the second supply voltage and the fourth supply voltage are substantially the same.

24. The method of claim 23, wherein the fourth supply voltage is equal to the first supply voltage.

25. A method for scaling an embedded DRAM array from a first process to a second process, wherein the DRAM array includes a plurality of DRAM cells and a plurality of sense amplifier transistors, the method comprising: reducing the linear dimensions of features from the first process to the second process by a scaling factor; and reducing the layout area of a capacitor structure present in each of the DRAM cells from the first process to the second process, wherein a capacitance associated with each DRAM cell is scaled down by the scaling factor, and the area of each DRAM cell is scaled down by the square of the scaling factor.

26. The method of claim 25, further comprising: reducing a first supply voltage from the first process to the second process, wherein the first supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array; and maintaining a constant sense amplifier supply voltage from the first process to the second process, wherein the sense amplifier supply voltage is used to operate the sense amplifier transistors of the DRAM array.

27. The method of claim 25, further comprising: reducing a first supply voltage in the first process to a second supply voltage in the second process, wherein the first supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array in the first process, and wherein the second supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array in the second process; and using a third supply voltage, greater than the second supply voltage, to operate sense amplifier transistors of the embedded DRAM array in the second process.