"Surface Analysis of Clinically-Used Expanded PTFE Endoscopic Tubing Treated By the STERIS Process", Tucker, et al., ASAIO Journal, 1995 Abstracts, 41st Annual Conference May 4-6, 1995 p. 17. |
"Surface Analysis of Clinically-Used Expanded PTFE Endoscopic Tubing Treated By the STERIS Process", Tucker, et al., ASAIO Journal 1996, May 10, 1996, pp. 001-008. |
"Predicting Technology Advances for Wafer Surface Inspection Systems", Pirooz, et al., Microcontamination V. 11, No. 10, Nov. 1993, (Abstract Only). |
"Laser Induced Infrared Signature: The Stepping Stone to Statistical Process Control for PTH, SMT, FPT, AND TAB", Vanzetti, et al., 3rd Int. SAMPE Electronics Conference, Los Angeles, CA Jun. 20, 1989, (Abstract Only). |
"Contamination Control For the MSX: An Overview", Cranmer, et al. Johns Hopkins APL Technical Digest, vol. 17, No. 1, 1996, (Abstract Only). |
"Reconvergent Specular Detection of Material Defects on Silicon", Ferrara, et al., IEEE/SEMI 1995, ASMC '95 Proceedings, Jan. 1995 (Abstract Only). |
"Using an Advanced Particle Analysis System for Process Improvement", Uritsky, et al., Microcontamination, vo. 12, No. 5, May 1994, (Abstract Only). |
"NIR For Noncontact Measurement of Moisture and Protein Content", Scott, Sensor Review, vol. 11, No. 4, 1991, Jan. 1991, (Abstract Only). |
"A New Stereo Laser Triangulation Device for Specular Surface Inspection", Samson, et al., Proceedings of the SPIE, vol. 1332, Pt. 1, 1990, (Abstract Only), Jan. 1990. |
"Particle-Detection on Glass Substrates and Thin Film Magnetic Storage Disks", Lenhart, IEEE Trans. on Magnetics, vol. 26, No. 1, 1990, Jan. 1990, (Abstract Only). |
"Total Internal Reflection Microscopy: A Surface Inspection Technique", Temple, Applied Optics, vol. 20, No. 15, 1981, Jan. 1981. (Abstract Only). |
"Contamination Detection NDE for Cleaning Process Inspection", NASA Marshall Space Flight Center, Aerospace Env. Technology Conference, Mar. 1995, (Abstract Only). |
"Surface Contamination Analysis Technology Team Overview", NASA Marshall Space Flight Center, Aerospace Env. Technology Conference, Mar. 1995, (Abstract Only), |
"How Clean is Clean: Non-Destructive/Direct Methods of Flux, Residue Detection", Welsh, et al., Dept. of Energy, International Conference on Solder Fluxes and Pastes, Jun. 1994, (Abstract Only). |
"Resolution of Contamination Problems Affecting Laser-Surface-Certification Inspection", Jackson, Dept. of Energy, Mar. 1982, (Abstract Only). |