Claims
- 1. A scanning probe microscope comprising a probe approaching or contacting a substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is chemically reacted between the substance surface and molecules or atom groups which act as a sensor are fixed on the probe, and the probe is scanned at an atomic level of precision, wherein the scanning probe microscope is a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
- 2. A method for processing molecules of a substance surface at the molecular or atomic level comprising chemically reacting molecules or atom groups of the substance surface with molecules or atom groups fixed to the scanning probe and detecting a physical quantity which is measured through the probe by approaching or contacting the substance surface, wherein the molecules are processed with a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
- 3. A scanning probe microscope according to claim 1, wherein the molecules, which act as a sensor, and the probe are covalently bonded to each other.
- 4. A scanning probe microscope according to claim 3, wherein the molecules which act as a sensor form a chemically adsorbed film.
- 5. A scanning probe microscope according to claim 1, wherein the molecules which act as a sensor are contained in a metal electrodeposited on the surface of the probe.
- 6. A method according to claim 2, wherein the molecules, which act as a sensor, and the probe are covalently bonded to each other.
- 7. A method according to claim 6, wherein the molecules which act as a sensor form a chemically adsorbed film.
- 8. A method according to claim 2, wherein the molecules which act as a sensor are contained in a metal electrodeposited on the surface of the probe.
Priority Claims (2)
Number |
Date |
Country |
Kind |
3-098919 |
Apr 1991 |
JPX |
|
3-098920 |
Apr 1991 |
JPX |
|
Parent Case Info
This application is a division of application Ser. No. 08/875,694, filed Apr. 29, 1992, now U.S. Pat. No. 5,363,697.
US Referenced Citations (7)
Foreign Referenced Citations (5)
Number |
Date |
Country |
A-0404682 |
Sep 1989 |
EPX |
A-0397416 |
Nov 1990 |
EPX |
A-0410618 |
Jan 1991 |
EPX |
63-304103 |
Dec 1988 |
JPX |
A-2235049 |
Feb 1991 |
GBX |
Non-Patent Literature Citations (2)
Entry |
Burnham, N. et al; "Measuring the nanomechanical properties and surface forces . . . ", J. Vac. Sci. Techn. A, vol. 7, No. 4 Jul./Aug. 1989 pp. 2906-2913. |
Burnham, N. et al; "Probing the Surface Forces of Monolayer Films . . . ", Physical Review Letters, vol. 64, No. 16, Apr. 16, 1990 pp. 1931-1934. |
Divisions (1)
|
Number |
Date |
Country |
Parent |
875694 |
Apr 1992 |
|