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SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor
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G01Q60/60
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G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
G01Q60/00
Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof
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G01Q60/60
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor
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Patents Grants
last 30 patents
Information
Patent Grant
Device for detection of cellular stress
Patent number
12,055,536
Issue date
Aug 6, 2024
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electrochemical microscopy with oscillating probe tip
Patent number
11,921,130
Issue date
Mar 5, 2024
The University of Warwick
Patrick Unwin
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Portable electrochemical microscopy device, kits comprising same an...
Patent number
11,808,784
Issue date
Nov 7, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Gaëlle Charrier
G01 - MEASURING TESTING
Information
Patent Grant
Device for detection of cellular stress
Patent number
11,692,996
Issue date
Jul 4, 2023
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning electrochemical microscopy electrode method
Patent number
11,543,429
Issue date
Jan 3, 2023
Morgan State University
Birol Ozturk
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Biosensor for the detection of a biological target, and method for...
Patent number
10,794,932
Issue date
Oct 6, 2020
Her Majesty the Queen in Right of Canada, as Represented by The Minster of Na...
Zhe She
G01 - MEASURING TESTING
Information
Patent Grant
Non-local scanning probes for scanning probe microscopy
Patent number
10,739,378
Issue date
Aug 11, 2020
The Trustees of Columbia University In the City of New York
Daniel Vincent Esposito
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for positioning a micro- or nano-object under...
Patent number
10,705,115
Issue date
Jul 7, 2020
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Stéphane Campidelli
G02 - OPTICS
Information
Patent Grant
Scanning electrochemical microscopy
Patent number
10,006,935
Issue date
Jun 26, 2018
The University of Warwick
Patrick Robert Unwin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electrochemical force microscopy
Patent number
9,541,576
Issue date
Jan 10, 2017
UT-Battelle, LLC
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid microprobe for electrochemical and SERS monitoring, scanning...
Patent number
9,519,006
Issue date
Dec 13, 2016
Seoul National University R&DB Foundation
Taek Dong Chung
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Pipets containing electrolyte and electrodes
Patent number
9,316,613
Issue date
Apr 19, 2016
The University of Warwick
Patrick Unwin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Real space mapping of ionic diffusion and electrochemical activity...
Patent number
8,719,961
Issue date
May 6, 2014
UT-Battelle, LLC
Sergei V. Kalinin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Cantilever for scanning probe microscope and scanning probe microsc...
Patent number
8,601,608
Issue date
Dec 3, 2013
Japan Science and Technology Agency
Kenichi Maruyama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Probe microscope and measurement method using the same
Patent number
8,327,460
Issue date
Dec 4, 2012
Hitachi, Ltd.
Kyoko Honbo
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sensors for electrochemical, electrical or topographical analysis
Patent number
7,444,856
Issue date
Nov 4, 2008
The Board of Trustees of the Leland Stanford Junior University
Friedrich B. Prinz
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electrochemical potential microscope
Patent number
7,156,965
Issue date
Jan 2, 2007
Veeco Instruments Inc.
Chunzeng Li
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a device for simultaneously carrying out an el...
Patent number
7,074,340
Issue date
Jul 11, 2006
Innovationsagentur Gesellschaft
Alois Lugstein
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating tip conducting probe microscope
Patent number
6,245,204
Issue date
Jun 12, 2001
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Probe of scanning electrochemical microscope
Patent number
6,123,817
Issue date
Sep 26, 2000
Matsushita Electric Industrial Co., Ltd.
Tohru Nakagawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe potentiometer
Patent number
6,002,131
Issue date
Dec 14, 1999
The Board of Trustees of the Leland Stanford Junior University
Scott R. Manalis
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope and molecular processing method using the...
Patent number
5,730,940
Issue date
Mar 24, 1998
Matsushita Electric Industrial Co., Ltd.
Tohru Nakagawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System for analyzing surfaces of samples
Patent number
5,619,035
Issue date
Apr 8, 1997
Biotechnology Research and Development Corporation
Paul S. Weiss
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Small cavity analytical instruments
Patent number
5,559,328
Issue date
Sep 24, 1996
Biotechnology Research and Development Corporation
Paul S. Weiss
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System for analyzing surfaces of samples
Patent number
5,504,366
Issue date
Apr 2, 1996
Biotechnology Research and Development Corp.
Paul S. Weiss
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of electrochemical detection/identification of single organi...
Patent number
5,497,000
Issue date
Mar 5, 1996
The United States of America as represented by the Secretary of the Navy
Nongjian Tao
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electrochemical identification of molecules in a scanning probe mic...
Patent number
5,495,109
Issue date
Feb 27, 1996
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tip position modulation and lock-in detection in scanning electroch...
Patent number
5,382,336
Issue date
Jan 17, 1995
Board of Regents, The University of Texas System
Allen J. Bard
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope, molecular processing method using the sc...
Patent number
5,363,697
Issue date
Nov 15, 1994
Matsushita Electric Industrial Co., Ltd.
Tohru Nakagawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System for imaging and detecting threshold phenomena associated wit...
Patent number
5,281,814
Issue date
Jan 25, 1994
The Penn State Research Foundation, Penn State Rsrch Foundtn & Biotechnol. Rs...
Paul S. Weiss
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
GAS SENSOR, SCANNING ELECTROCHEMICAL GAS MICROSCOPE, AND METHOD OF...
Publication number
20240230711
Publication date
Jul 11, 2024
Samsung Electronics Co., Ltd.
Hyunpyo Lee
G01 - MEASURING TESTING
Information
Patent Application
USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...
Publication number
20240210444
Publication date
Jun 27, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Gaëlle Charrier
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DETECTION OF CELLULAR STRESS
Publication number
20230384288
Publication date
Nov 30, 2023
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Application
ELECTROCHEMICAL SENSING METHODS AND APPARATUS FOR DETERMINING DRUG...
Publication number
20230052517
Publication date
Feb 16, 2023
The University Of Manitoba
Sabine Kuss
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
DEVICE FOR DETECTION OF CELLULAR STRESS
Publication number
20230039153
Publication date
Feb 9, 2023
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY WITH OSCILLATING PROBE TIP
Publication number
20210373047
Publication date
Dec 2, 2021
University of Warwick
Patrick Unwin
B22 - CASTING POWDER METALLURGY
Information
Patent Application
PORTABLE ELECTROCHEMICAL MICROSCOPY DEVICE, KITS COMPRISING SAME AN...
Publication number
20210156884
Publication date
May 27, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Gaëlle CHARRIER
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE SCANNING ELECTROCHEMICAL MICROSCOPY ELECTRODE METHOD
Publication number
20200341029
Publication date
Oct 29, 2020
MORGAN STATE UNIVERSITY
Birol Ozturk
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Biosensor for the Detection of a Biological Target, and Method for...
Publication number
20200225262
Publication date
Jul 16, 2020
THE GOVERNING COUNCIL OF THE UNIVERSITY OF TORONTO
Zhe She
G01 - MEASURING TESTING
Information
Patent Application
NON-LOCAL SCANNING PROBES FOR SCANNING PROBE MICROSCOPY
Publication number
20190324055
Publication date
Oct 24, 2019
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Daniel Vincent Esposito
G01 - MEASURING TESTING
Information
Patent Application
THETA PIPETTE EMITTER AND METHOD THEREFOR
Publication number
20190275511
Publication date
Sep 12, 2019
The Trustees of Indiana University
Lane A. BAKER
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD AND APPARATUS FOR POSITIONING A MICRO- OR NANO-OBJECT UNDER...
Publication number
20190170787
Publication date
Jun 6, 2019
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Stéphane CAMPIDELLI
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY WITH OSCILLATING PROBE TIP
Publication number
20180052187
Publication date
Feb 22, 2018
University of Warwick
Patrick Unwin
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SCANNING ION CONDUCTANCE MICROSCOPY
Publication number
20170016933
Publication date
Jan 19, 2017
OPENIOLABS LTD
Andrew James Richardson
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY
Publication number
20160195570
Publication date
Jul 7, 2016
University of Warwick
Patrick Unwin
G01 - MEASURING TESTING
Information
Patent Application
ELECTROCHEMICAL FORCE MICROSCOPY
Publication number
20160025773
Publication date
Jan 28, 2016
UT-Battelle, LLC
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY
Publication number
20150129436
Publication date
May 14, 2015
The University of Warwick
Patrick Robert Unwin
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY
Publication number
20150059027
Publication date
Feb 26, 2015
University of Warwick
Patrick Unwin
G01 - MEASURING TESTING
Information
Patent Application
NANO ELECTRODE AND MANUFACTURING METHOD THEREOF
Publication number
20140262433
Publication date
Sep 18, 2014
Geunbae Lim
B82 - NANO-TECHNOLOGY
Information
Patent Application
HYBRID MICROPROBE FOR ELECTROCHEMICAL AND SERS MONITORING, SCANNING...
Publication number
20140014507
Publication date
Jan 16, 2014
SNU R&DB Foundation
Taek Dong Chung
B82 - NANO-TECHNOLOGY
Information
Patent Application
PIPETS CONTAINING ELECTROLYTE AND ELECTRODES
Publication number
20130140191
Publication date
Jun 6, 2013
Patrick Unwin
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY
Publication number
20130032495
Publication date
Feb 7, 2013
Patrick Unwin
B82 - NANO-TECHNOLOGY
Information
Patent Application
NEURAL ACTIVITY MEASUREMENT SYSTEM
Publication number
20120185173
Publication date
Jul 19, 2012
Hitachi, Ltd.
Tsuyoshi YAMAMOTO
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHEMICAL ACTIVITY...
Publication number
20120125783
Publication date
May 24, 2012
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Application
Probe microscope and measurement method using the same
Publication number
20100257642
Publication date
Oct 7, 2010
Kyoko Honbo
G01 - MEASURING TESTING
Information
Patent Application
Cantilever for Scanning Probe Microscope and Scanning Probe Microsc...
Publication number
20100154085
Publication date
Jun 17, 2010
Kenichi Maruyama
G01 - MEASURING TESTING
Information
Patent Application
NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTR...
Publication number
20100115673
Publication date
May 6, 2010
Christine Kranz
G01 - MEASURING TESTING
Information
Patent Application
Sensors for electrochemical, electrical or topographical analysis
Publication number
20060213259
Publication date
Sep 28, 2006
Friedrich B. Prinz
G01 - MEASURING TESTING
Information
Patent Application
Method for producing a device for simultaneously carrying out an el...
Publication number
20030190425
Publication date
Oct 9, 2003
Alois Lugstein
G01 - MEASURING TESTING