A conventional data receiver samples received data based on sampling clock signals. The sampling clock signals are typically synchronized with the received data such that the received data is sampled within a time period, or “data eye”, during which the data is valid. Data errors may occur if the data is sampled at the edges of or outside of the data eye.
A high speed data link may employ any of several techniques to ensure that received data is correctly sampled. Continuous time linear equalization (CTLE) is one technique commonly implemented in a data receiver. According to CTLE, the received data is passed through a system having a transfer function which peaks at desired frequencies.
A higher-order system including additional zeros and/or poles may improve CTLE. However, conventional higher-order systems require multiple stages and feedback, thereby increasing circuit complexity and power dissipation.
Circuit 200 also includes output 210 of the first stage to output a differential output signal (data_out, data_out#). The differential output signal reflects the application of a transfer function to the differential input signal. The transfer function of circuit 200 exhibits two zeros and three poles in frequency domain. Also, the differential output signal is not fed back to the first stage.
Turning to the specific components of circuit 200, portion data_in of the differential input signal is received at a gate of p-type metal-oxide semiconductor (PMOS) transistor 215. Portion data_in#, in turn, is received by a gate of PMOS transistor 220. As shown, capacitive element 225 may comprise a capacitor and/or any other suitable capacitive element. A first node of capacitive element 225 is coupled to a drain of transistor 215 and a second node of capacitive element 225 is coupled to a drain of transistor 220.
Resistive element 230 may comprise any resistive element or elements that are or become known. A first node of resistive element 230 is coupled to the drain of transistor 215 and a second node of resistive element 230 is coupled to the drain of transistor 220. Also shown is current source 235, wherein, a first node of current source 235 is coupled to a supply voltage and a second node of current source 235 is coupled to the first node of resistive element 230. Similarly, a first node of current source 240 is coupled to a supply voltage and a second node of current source 240 is coupled to the second node of resistive element 230.
Circuit 200 also includes PMOS transistor 245 and PMOS transistor 250, drains of which are coupled to the supply power. Resistive element 255 includes a first node and a second node, with the first node of resistive element 255 being coupled to a gate of transistor 245 and the second node of resistive element 255 being coupled to a source of transistor 245. The second node is also coupled to output node 260 of the first stage, which outputs portion data_out# of the output differential signal.
Resistive element 265 also includes a first node and a second node. The first node of resistive element 265 is coupled to a gate of transistor 250 and the second node of resistive element 265 is coupled to a source of transistor 250 and to output node 270 of the first stage. Output node 270, as illustrated, is to output portion data_out of the output differential signal.
According to some embodiments, circuit 200 also includes current source 275 and current source 280. A first node of current source 275 is coupled to the supply power and a second node of current source 280 is coupled to output node 260. A first node of current source 280 is coupled to the supply power and a second node of current source 280 is coupled to output node 270. Current sources 275 and 280 may be controlled to control an operating point of circuit 200. Current sources 275 and 280 may also or alternatively be controlled to provide offset correction in order to move a center of the data eye to a desired voltage (e.g., 0V). Current sources 275 and 280 are optional in some embodiments.
According to some embodiments, the transfer function of circuit 200 comprises:
where Rs is a resistance of resistive element 230, Rp is a resistance of resistive elements 245 and 250, gm1 is a transconductance of the differential transistor pair 215/220, gm2 is a transconductance of transistors 245 and 250, Cg is a total capacitance at the gate of transistors 245 and 250, and CL is a total capacitance at output nodes 260 and 270. CL may take into account loads of any circuits attached thereto.
According to some embodiments, at least one of resistive elements 230, 255 and 265 comprises a variable resistive element including but not limited to an active transistor circuit. The poles and zeroes of the above transfer function may be controlled by appropriate selection of the various components of circuit 200, and may also be controlled during operation by varying resistances of the resistive elements.
Portion data_in of the differential input signal is received at a gate of PMOS transistor 325. Portion data_in# of the differential input signal is received by a gate of PMOS transistor 330. A first node of capacitive element 335 is coupled to a drain of transistor 325 and a second node of capacitive element 335 is coupled to a drain of transistor 330. Capacitive element 335 may comprise any capacitive element or elements that are or become known.
A first node of resistive element 340 is coupled to the drain of transistor 325 and a second node of resistive element 340 is coupled to the drain of transistor 330. A first node of current source 345 is coupled to a supply voltage and a second node of current source 345 is coupled to the first node of resistive element 340. Similarly, a first node of current source 350 is coupled to the supply voltage and a second node of current source 350 is coupled to the second node of resistive element 340.
Circuit 200 also includes n-type metal-oxide semiconductor (NMOS) transistor 355 and NMOS transistor 360, drains of which are coupled to ground. Resistive element 365 includes a first node and a second node, with the first node of resistive element 365 being coupled to a gate of transistor 355 and the second node of resistive element 365 being coupled to a source of transistor 355. The second node is also coupled to output node 370 of the first stage, which outputs portion data_out# of the output differential signal.
Resistive element 375 also includes a first node and a second node. The first node of resistive element 375 is coupled to a gate of transistor 360 and the second node of resistive element 375 is coupled to a source of transistor 360 and to output node 380 of the first stage. Output node 380 is to output portion data_out of the output differential signal.
Circuit 300 also includes current source 385 and current source 390. A first node of current source 385 is coupled to output node 380 and a second node of current source 385 is coupled to ground. A first node of current source 390 is coupled to output node 370 and a second node of current source 390 is coupled to ground. Current sources 385 and 390 may be controlled to control an operating point of circuit 300 and/or to provide offset correction. Some embodiments of circuit 300 do not include current sources 385 and 390.
The transfer function of circuit 300 may be equal to:
where Rs is a resistance of resistive element 340, Rp is a resistance of resistive elements 365 and 375, gm1 is a transconductance of the differential transistor pair 325/330, gm2 is a transconductance of transistors 355 and 360, Cg is a total capacitance at the gate of transistors 355 and 360, and CL is a total capacitance at output nodes 370 and 380. CL may take into account loads of any circuits attached thereto.
At least one of resistive elements 340, 365 and 375 may comprise a variable resistive element including but not limited to an active transistor circuit. The poles and zeroes of the above transfer function may be controlled by appropriate selection of the various components of circuit 300, and may also be controlled during operation by varying resistances of the resistive elements.
Circuit 400 employs current mirrors to implement current sources 235, 240, 275 and 280 of circuit 200. Moreover, DC-biased PMOS transistor 410 implements resistive element 230 and variable resistors 420 and 430 implement resistive elements 255 and 265, respectively. Control 440 operates to control resistances exhibited by variable active resistors 420 and 430.
Portion data_out of the differential output signal is received at a gate of PMOS transistor 510. Portion data_out# is received by a gate of PMOS transistor 520. Circuit 500 also includes PMOS transistor 530 and PMOS transistor 540, sources of which are coupled to a supply power. Resistive element 550 includes a first node and a second node, with the first node of resistive element 550 being coupled to a gate of transistor 530 and the second node of resistive element 550 being coupled to a drain of transistor 530. The second node is also coupled to output node 570 of the first stage, which outputs portion data_out(2) of a second output differential signal.
Resistive element 560 also includes a first node and a second node. The first node of resistive element 560 is coupled to a gate of transistor 540 and the second node of resistive element 560 is coupled to a drain of transistor 540 and to output node 580 of the first stage. Output node 580, as illustrated, is to output portion data_out(2)# of the second output differential signal. Resistive elements 550 and 560 may be implemented by active transistor circuits controlled by a suitable control unit.
The differential data signal is received by linear equalizer 630. Linear equalizer 630 may be implemented by any suitable combination of circuits 200, 300, 400 and 500, but embodiments are not limited thereto. Linear equalizer 630 applies a transfer function to the received data and outputs a differential signal (Data+, Data−) to sampler block 640.
Sampler block 640 samples the differential signal based on clock signals received from clocking unit 650. As a result, sampler block 640 outputs signals edge_0 corresponding to a first edge of a first data eye, data_90 corresponding to a value sampled at a center of the first data eye, edge_180 corresponding to a first edge of a second data eye, and data_270 corresponding to a value sampled at a center of the second data eye. Each of these signals are fed back to clocking unit 650 so that clocking unit may control its output clock signals based thereon.
The several embodiments described herein are solely for the purpose of illustration. Therefore, persons in the art will recognize from this description that other embodiments may be practiced with various modifications and alterations.