Seed metal delete process for thin film repair solutions using direct UV laser

Abstract

A multilayer thin film structure (MLTF) is provided having no extraneous via-pad connection strap plated metallurgy for defective vias needing removal. The method for making or repairing the MLTF comprises determining interconnection defects in the MLTF at a thin film layer adjacent to the top metal layer of the structure, applying a top surface dielectric layer and forming vias in the layer, applying a metal conducting layer and removing the metal conducting layer for via-pad connection straps of defective vias and at the intersection of XY lines used in the repair, defining the top surface metallization including a series of orthogonal X conductor repair lines and Y conductor repair lines using a photoresist and lithography and then using a phototool to selectively expose the photoresist to define top surface strap connections needed to repair the interconnections and/or make EC's, and forming the top surface metallization using additive or subtractive metallization techniques.

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to multilayer thin film (MLTF) structure containing electronic packages such as multi-chip modules (MCM) and, more particularly, to a method for making engineering changes (EC's) in the electronic structure and/or repairing defective electrical connections in the MLTF structure using the conventional procedure of patterning the circuit design including orthogonal XY repair lines as if no changes or repairs are needed but without the need for deleting unwanted metallization such as via-pad connection straps for defective nets and XY repair line intersections and to the resulting MLTF structure and electronic component fabricated by the repair method.

2. Description of Related Art

Thin film electronic components offer an attractive packaging solution for high performance and light weight systems such as in computer, telecommunication, military and consumer applications. Though thin films offer high density interconnections, the manufacturing process typically produces some number of non-working interconnections due to process induced defects and a resulting low component product output yield. To assure the quality and reliability of the product, the defective interconnections need to be repaired to ensure their functionality, so as to assure a fault free electronic package.

Package interconnections consist of multiple layers of interconnections which are used to interconnect various parts of the system. After all the layers of the MLTF are fabricated, a final test is performed from the top surface of the package to separate defective interconnects from defect-free interconnects to guarantee the functionality of the interconnects and the package. Since a fully functioning package cannot support any defective interconnects, the package must either be thrown away, which is not feasible for thin film packages due to the high cost involved, or the defective interconnects can be repaired. The repair option accordingly represents an attractive solution for thin film packages.

In the past, repair schemes such as Direct Distribution Engineering Change (DDEC) as shown in U.S. Pat. No. 5,243,140 has been used whereby a series of ‘add’ and ‘delete’ repair operations have been used on a fixed metal layout on the top surface of the MLTF structure. In general, the repair scheme utilizes two correction pads arranged in an array, at least two direct distribution structures, a signal pad and conductor extending between at least two direct distribution structures.

In U.S. Pat. No. 4,254,445 a module for LSI chips includes an orthogonal array of sets of pads and fan-out metallization for a large number of chips. Running parallel to the sides of the chips and the fan-out area are several parallel prefabricated, thin film engineering change (EC) interconnection lines terminating in pads adjacent to the fan-out. The pads are arranged to permit discretionary connections of the fan outs to the EC pads with minimal crossovers by means of short fly wires.

U.S. Pat. No. 4,489,364 shows a chip carrying module including a number of EC change lines buried below the surface of the module. The EC lines are interrupted periodically to provide a set of vias extending up to the upper surface of the module between each set of chips where the vias are connected by dumbbell-shaped pads including narrow link which permits laser deletion. The fan-out pads can be connected to the pads by means of fly-wires.

U.S. Pat. Nos. 5,220,490 and 5,224,022 show custom interconnections done by personalizing (not repairing) the top metal wiring. The customizable circuit has a high density of orthogonally placed X and Y conductors capable of interconnecting closely spaced LSI circuits.

The above patents are incorporated herein by reference.

The typical thin film structure containing a number of interconnections using vias, pads and connecting conductor straps is shown in cross-section in FIG. 1 as number 10 . The structure is typically mounted on a substrate (not shown) such as a ceramic material (MCM) containing wiring. The MLTF structure consists of a power plane or capture level 19 , mesh 1 level 11 , X wiring layer 12 , Y wiring layer 13 , ground plane mesh 2 layer 14 and a top surface metallurgy level (TSM) 15 . The top surface metallurgy (TSM) level contains the (TSM) vias lo, via-pad strap connectors 18 and corresponding pads 17 for connecting chips to the thin film package. The top surface metallurgy level would also contain the repair wires such as orthogonal XY lines as shown in FIG. 2 as lines 30 R, 30 R′, 31 R and 31 R′ for correcting faulty interconnections or making EC's as discussed hereinbelow.

The terms net, via, defective net and defective via will be used interchangeably since they are related with the term net broadly defining a defective structure (nets consist of lines connected with vias between layers and a defect can occur on either a via or line segment—normally the line segment).

FIG. 2 , which represents a partial top view of a typical MCM and of the TSM metallization level 15 of FIG. 1 shows one chip area bounded by the dotted lines 27 , vias 16 and chip connection pads 17 (such as controlled collapse chip connection pads known as C 4 pads) with the vias representing connections to the I/O in the MLTF structure and supporting substrate if any and the C 4 pads represent the microsockets supporting the C 4 balls connecting the chip to the thin film substrate. As can be seen from the figure, the C 4 pads 17 are offset from the vias 16 , which is preferable in high performance machines to ensure the elimination of any discontinuities which may arise due to the presence of the faulty interconnection still connected to the repaired wire. In the figure, the C 4 pads are connected to the vias by conductor straps 18 that provide the connection for non-faulty interconnections. The strap 18 is conventionally created by a mask during the fabrication of the TSM and if the interconnection is faulty, a laser delete operation is necessary to disconnect the faulty interconnection from the C 4 pad. Repair lines 30 R, 30 R′, 31 R and 31 R′ are orthogonal XY repair lines also conventionally created by a mask during the fabrication of the TSM and intersect at for example junction 34 . A laser delete operation is also needed to separate the connected XY lines at their intersection or junction 34 with the needed X or Y repair line being continued past the junction by a subway as shown in FIG. 10 . As will be more fully discussed hereinbelow, vias 16 a and 16 b were found to be part of defective interconnections and are not to be used. Corresponding pads 17 a and 17 b are shown connected to repair orthogonal lines 30 R and 30 R′ by repair straps 18 R and 18 R′, respectively. Using the method of the invention Y repair lines 30 R and 30 R′ do not intersect with X repair line 31 R at junction 34 and a metal delete step is therefore not required.

A repair method is disclosed in copending U.S. patent application Ser. No. 08/743,405 assigned to the assignee of the present invention. In this method interconnection defects are determined at the layer adjacent the top surface layer before the top surface layer is fabricated. The necessary repair lines are then known and the top surface metallurgy defined accordingly. There is still a need however to remove or delete unwanted metallurgy in the top surface metallurgy due primarily to the use of a mask which defines all the circuitry metallurgy regardless of the defects in the MLTF structure.

Bearing in mind the problems and deficiencies of the prior art, it is therefore an object of the present invention to provide a method for repairing interconnections and/or making engineering changes in multilayer thin film containing electronic components such as MCMs without the need for deleting unwanted metallurgy such as via-pad connection straps for defective nets and intersecting XY repair lines which X and/or Y lines are needed to repair the defective nets but which connection straps and XY repair lines were formed for all nets regardless of defects.

Another object of the invention is to provide a method for repairing interconnections and/or making EC's in multilayer thin containing film electronic components employed on top of ceramic, laminate, dielectric or other substrates.

A further object of the invention is to provide a MLTF structure having repair lines and/or EC lines made using the method of the invention.

A still further object of the invention is to provide a multi-chip module containing a MLTF structure having repair lines and/or EC lines made using the method of the invention.

Still other objects and advantages of the invention will in part be obvious and will in part be apparent from the specification.

SUMMARY OF THE INVENTION

The above and other objects, which will be apparent to those skilled in the art, are achieved in the present invention which relates to a method for repairing interconnections in multilayer thin film (MLTF) structures typically used to make multi-chip modules (MCM) by employing the MLTF structure on MCM's such as MCM-C (ceramic substrate), MCM-D (non-conductive dielectric substrate) and MCL-L (laminate substrate) comprising:

building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure;

electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections;

determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure;

defining the top surface connections needed to repair the defective interconnections based on the defects uncovered and/or EC's desired, preferably using a computerized algorithm to determine the best metal line routes on the top surface layer;

applying a dielectric layer and forming vias in the layer;

applying a metal conducting layer on the dielectric layer and in the vias;

deleting the metal conducting layer for via-pad connection straps for defective vias and for X-Y orthogonal line intersections which X and/or Y lines are defined as top surface metal repair connections;

defining by a photoresist technique the top surface layer to form the top surface metallization preferably as if no defects existed including a plurality of orthogonal X-Y repair lines;

defining metal routes for connecting pads of vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered and/or EC changes to define the first and second metal connecting line straps; and

then developing and plating the top surface metallization layer.

Broadly stated, after the MLTF has been formed to the thin film layer adjacent to and below the TSM layer, electrical testing is performed to determine any faulty interconnections (defective vias). The interconnection faults may arise due to opens or shorts in the wiring. Simple capacitance testing or other such testing methods can be used to differentiate between the defective and defect-free interconnections. It is important to note that any opens in an input/output (I/O) net or power-ground plane short is a fatal defect and cannot be repaired. Next the top surface metallurgy level is built similarly by applying a polyimide or similar dielectric material having defined vias, applying a metal conducting layer, deleting, preferably using a laser, the metal conductor layer for via-pad connection straps for defective nets and for X-Y intersections which X and/or Y lines are defined as top surface metallization determined by the testing step, applying a photoresist layer and using, for example, a fixed mask to define the top surface metallurgy as if there were no defects including C 4 pads, via capture pads, a plurality of orthogonal X-Y conductor lines preferably positioned both within and outside the chip footprint area and running between the chip areas, and conducting straps connecting the pads to the via locations. Defective net interconnections and the needed X-Y intersections are now isolated by the lack of a metal conducting layer between the defective via and its corresponding pad and at the X-Y intersections used for the repair so that there will be no conductor strap plated during the plating step between the pad and corresponding defective via interconnection and between the X-Y line at its intersection. Using the determined interconnection data, the straps needed on the top surface to repair the component by connecting pads of defective nets to other pads are defined using a phototool to expose the metal line repair straps and then the photoresist is developed and the complete top surface metallurgy plated using conventional means.

For each defect and/or engineering change made, the repair line from the “defective” pad to the repair location, is a first repair strap to an X line and/or Y line and is a single (individual) conductive line used to repair each defective via or to make each engineering change. A second repair strap is then needed to connect from the first repair strap connected X line and/or Y line route to the desired pad. X repair lines and Y repair lines are interconnected in a similar fashion based on the defined X-Y routes to connect the “defective” pad to the desired repair pad as shown in FIG. 10 . The photoresist is then developed and the complete top surface metallurgy plated.

In another aspect of the invention, the proposed method of the invention can also be used for implementing engineering changes (EC's). EC's are required in a product to make changes at the systems level. In this method, EC's can be incorporated by using some of the C 4 pads primarily for EC's with an EC wire buried in the substrate and connected to the C 4 pad. The repair scheme of the present invention can be used to not plate the straps between the via and the C 4 pad of the original connection, and exposing a strap to an X line and/or Y line for developing and metallization which repair strap would then be connected to the defined EC C 4 pad as described hereinabove. EC's are described and shown in U.S. Pat. No. 5,243,140.

BRIEF DESCRIPTION OF THE DRAWINGS

The features of the invention believed to be novel and the elements characteristic of the invention are set forth with particularity in the appended claims. The figures are for illustration purposes only and are not drawn to scale. The invention itself, however, both as to organization and method of operation, may best be understood by reference to the detailed description which follows taken in conjunction with the accompanying drawings in which:

FIG. 1 is a side elevational view of a multilayer thin film structure electronic component repairable by the method of the present invention.

FIG. 2 is a partial top view of a MCM showing the top surface of a MLTF and the repair wiring using the repair method of the invention.

FIGS. 3-9 are side elevational views showing a sequence of steps which may be used to repair a multilayer thin film structure by the method of the invention.

FIG. 10 is a partial side elevational view of a multilayer thin film structure electronic component showing the continuation of a Y metal line and the separation of the Y metal line from the X line at the intersection of X and Y orthogonal conductive repair lines.

DESCRIPTION OF THE PREFERRED EMBODIMENT(S)

In describing the preferred embodiment of the present invention, reference will be made herein to FIGS. 1-10 of the drawings in which like numerals refer to like features of the invention. Features of the invention are not necessarily shown to scale in the drawings.

The repair scheme can be used for any MLTF structure having any number of layers. FIG. 1 shows the cross-section of the MLTF structure shown generally as 10 which in this case consists of 5 metal layers ( 11 - 14 and 19 ) and a metal TSM layer 15 . The TSM layer would contain features such as the chip connection pads, vias, via-pad connector straps and repair structures. The 5 metal layers are listed below:

Layer 1 : Capture Pad ( 19 ) (with mesh)

Layer 2 : Mesh 1 ( 11 )

Layer 3 : X Wiring Level ( 12 )

Layer 4 : Y Wiring Level ( 13 )

Layer 5 : Mesh 2 ( 14 )

Referring to FIGS. 1 and 2 , layers 11 - 14 comprise vias ( 11 a , 12 a , 13 a and 14 a ) in corresponding dielectric layers 11 b , 12 b , 13 b and 14 b and metal lines on top of the dielectric and in the vias ( 11 c , 12 c , 13 c and 14 c ). Other MLTF wiring not shown is also on each layer as well-known in the art. The pads, straps and vias interconnect are shown layer by layer and form the interconnections terminating on the top surface 15 . The top level 15 include vias 16 , pads 17 , straps 18 and a plurality of orthogonal Y conductor lines 30 R and 30 R′ and X conductor lines 31 R and 31 R′. Some of these interconnections may be defective and need to be repaired using the method of the invention as shown by repair straps 18 R and 18 R′.

The repair scheme used in the invention utilizes the electrical testing and/or inspection for defects at the MLTF layer 14 which is the layer below and adjacent to the top surface layer 15 and the use of defined X and Y orthogonal conductor lines on the top surface. The X and Y orthogonal conductor lines are connected to pads of defective vias by metal plating repair straps using the test data to control an expose device such as a phototool on the top surface 15 of the thin film (structure). The test data is used to define a repair strap from the pad of the defective via to a X conductor line and/or a Y conductor line. The phototool is used with an algorithm that analyzes the test data and determines the best or most efficient repair layout needed for the TSM level. X-Y intersections of orthogonal repair lines are defined by not using a metal conducting layer at the desired intersection so that the X-Y lines do not intersect for the needed X-Y repair lines.

In the present invention, after the defective nets are determined a dielectric layer is applied and vias formed therein. After the application of a conductor layer on the top surface 15 as shown in detail in FIGS. 3-9 , the conductor layer is removed where straps would be plated for defective vias and for defined X-Y intersections which X or Y repair line is used to connect pads of defective nets to another pad for repair of the net. Preferably the conductor layer is removed using a laser, such as a UV laser. It will be appreciated that much less energy is required to delete the conductor layer than a fully plated metal strap or X-Y plated intersection as now done in the prior art. Accordingly, no metal will be plated for straps for defective nets or for defined X-Y repair intersections and a laser delete operation for a fully plated strap or X-Y intersection will not be necessary.

A photoresist layer is now applied and a phototool controlled by an algorithm is moved over the surface 15 typically in an X-Y direction, to expose the resist forming the desired repair strap connections. The phototool may also be used to define the pads, vias, etc., however, much of this is generally done using a fixed mask due to cost consideration. A phototool typically comprises an UV or electronic beam source, a shutter and condensing lens with a variable aperture and a reduction lens, and having a data system to facilitate control of the exposure area, dosage and location.

The plurality of orthogonal X and Y conductor lines are established in such a fashion to permit access of all the signal pads from the interconnected devices, and to permit access to all devices on the substrate. In order to permit X and Y conductor lines to cross without breaking their continuity one of them (typically the Y lines) are fabricated using both the top surface 15 and the layer 14 below (Mesh 2 ). At every point where an X line needs to cross a Y line, the Y line travels beneath the X line on a subway feature connected to the TSM through vias of each end of the subway. A cross-section is shown schematically in FIG. 10 . Thus, the Mesh layer 14 adjacent to the TSM contains subway features that permit repair line continuity and orthogonality as well as the power distribution and via interconnects required by the package function.

FIG. 2 shows a partial top view of a typical multilayer thin film structure showing one chip bounded by dotted lines 27 and a typical repair and EC scheme using the method of the invention. Defect-free vias 16 and their corresponding C 4 pads 17 that support the C 4 balls to connect to the chips are electrically connected by the via connection straps 18 which are shown L-shaped. The C 4 pads 17 are shown preferably offset from the vias 16 to facilitate disconnecting a faulty thin film or ceramic net by deleting the straps so that no straps are connected to the repair lines. Via 16 a was detected to be faulty by testing at the adjacent lower level and no strap was fabricated for connection to its corresponding pad 17 a using the method of the invention whereby a metal conductor layer overlaying the dielectric was removed prior to applying the photoresist, exposing, developing and plating steps. If strap 18 a (not shown) was fabricated connecting pad 17 a and via 16 a , strap 18 a would be conventionally deleted by a laser delete technique to disconnect defective via 16 a from pad 17 a . This procedure, however, can result in damage to the underlying circuitry and is time consuming and costly due to the thickness of the plated metal which must be removed. This is to be compared and contrasted to deleting only the metal conductor layer in the method of the present invention.

In the method of the invention using, for example, the phototool procedure, repair strap 18 R is formed and shown connected from C 4 pad 17 a to Y repair line 30 R and repair strap 18 R′ is formed and shown connected from C 4 pad 17 b to Y repair line 30 R′ to repair the defective 16 a and 16 b via interconnections. A similar repair strap connection would be made from repair line 30 R and 30 R′ to the desired pads (not shown) either directly therefrom or in conjunction with one or more interconnected X lines 31 R and 31 R′ and/or one or more Y lines 30 R and 30 R′. Using the method of the invention, Y lines 30 R and 30 R′ will not intersect X repair line 31 R at junction 34 . Y lines 30 R and 30 R′ are shown breaking at points 35 and 36 and are continued using a subway as shown in FIG. 10 .

In general the repair method comprises a series of steps as follows:

1. As shown in FIG. 1 , build the layers of thin film 11 , 12 , 13 and 14 on capture level 19 which includes wiring patterns such as pads, straps, vias, etc. and preferably test for opens and shorts at each layer before the next layer is built. Typically each layer is made as follows. A dielectric material layer 11 b such as polyimide or epoxy is applied and a via 11 a defined for further interconnection. A seed plating layer is applied on top thereof and photoresist material then applied and exposed to define the wiring pattern. After developing, a metal such as copper is electroplated to form the wiring shown as 11 c . The photoresist material and underlying seed layer is then stripped. This is generally termed a lithography or photolithography process and may be used for additive or subtractive metallization procedures as is well-known in the art, e.g., as described in U.S. Pat. No. 5,258,236, which is incorporated herein by reference. This procedure is continued for each layer until the thin film structure is completed. Intralevel shorts/opens at each layer may be repaired using existing tools. Any plating method can be used, for example, either an additive or subtractive method as is known in the art.

2. After building the 5 layer structure, the Mesh 2 level 14 ( FIG. 1 ) is tested to establish any interconnection defects, e.g., signal line/via opens/shorts. The nets that need to be repaired are determined.

3. Build the top surface layer 15 as for the other layers preferably using a fixed mask and expose with C 4 pads and via connecting straps at every via location and a series of Y-X conductor lines 30 R, 30 R′, 31 R and 31 R′ respectively as shown in FIG. 2 . It would be preferred not to build the connector straps for defective via interconnections or the X-Y intersections for X and/or Y lines which are to be used for the repair, however, this is not the most cost effective method and it is now conventional to use a fixed mask and to build the straps and all the X-Y intersections and then to laser delete the straps and intersections associated with defective nets and the defined metal line repair routes. The method of the invention avoids laser deleting of via-pad connection straps for defective vias and X-Y intersections for defined metal line routes since these straps and intersections are not plated because of removal of the metal conductor seed layer prior to applying the photoresist, exposing, developing and plating steps

Following the exposure of the fixed mask pattern containing all of the TSM features, the repair straps are then separately exposed, relying on the results of the electrical testing. This is done by defining the nets needing repair and selectively exposing the photoresist to define the conductor repair straps needed to contact the C 4 pads of defective vias to Y conductor lines 30 R and 30 R′ and/or X conductor lines 31 R and 31 R′ to repair the MLTF component or make EC's. For example, as shown in FIG. 2 , existing pads 17 a and 17 b of defective vias 16 a and 16 b respectively are connected by straps 18 R and 18 R′ to Y conductor lines 30 R and 30 R′ to repair or make EC's for defective or unneeded vias 16 a and 16 b . Other Y lines 30 R and 30 R′ and X lines 31 R and 31 R′ are not shown for clarity. After completion of this second expose, the photoresist is then developed producing a complete wiring image. The layer is then plated using conventional techniques. The conventional laser disconnection operation to delete unwanted straps for defective vias and X-Y intersections for the defined metal line route to restore full functionality is now not required.

With regard to FIGS. 3-9 , the repair method of the invention may be demonstrated for an additive metal plating process.

In FIG. 3 the multilayer thin film substrate of FIG. 1 is shown schematically completed to the mesh 2 level 14 and is shown in composite as 26 . Substrate 26 is then overcoated with a dielectric material such as polyimide layer 15 b and via 16 a defined by laser ablation or photolithography. Via 16 a is shown as defective and representing a wiring connection requiring repair. As shown in FIG. 10 below, vias are also formed to provide subway connections for orthogonal Y repair lines where the X and Y repair lines would cross (intersect). These subways and subway vias are not shown in FIGS. 3-9 for clarity.

In FIG. 4 , a thin metallic plating conductor layer 23 such as Cr/Cu at 2500 Å is applied to the dielectric layer 15 b and via 16 a . FIG. 4 also shows removal of the metal plating conductor layer 23 for the connecting strap 18 a that would conventionally connect via 16 a to pad 17 a regardless of whether or not via 16 a is defective or operable. Conductor layer 23 is preferably removed using a laser although other techniques such as photolithography and selective etching could be used.

FIG. 5 shows the application of a thick positive photoresist material 24 to the metal layer 23 . The photoresist coats area 18 a to the surface of the polyimide layer 15 b . FIG. 6 shows exposing the photoresist layer 24 through a mask to expose and define parallel Y repair lines 30 R and 30 R′ and non-developable resist areas 24 a , 24 b and 24 c . The orthogonal X repair lines 31 R are not shown in this figure for clarity. The fixed structures, i.e., chip connecting pads 17 a , vias 16 a and strap lines 18 a are also exposed through a mask at the same time as areas 24 and repair lines 30 R and 30 R′.

Referring to FIG. 6 , using the data determined by testing the lower adjacent layer, it was determined that via 16 a is defective and that a repair strap line is needed from pad 17 a to Y conductor line 30 R. Area 24 b is now exposed using a phototool transforming 24 b from a section which will not be dissolved during developing to a section which will be dissolved. The photoresist 24 is, a positive photoresist and as shown in FIG. 7 when it is developed it leaves only positive images 24 a and 24 c on the metal surface 23 . Thus, 24 a and 24 c indicate areas on the top surface 15 of the electronic component that are not to be plated. Also, area 18 a indicating an original via-pad connecting strap will not be plated because there is no conductor layer 23 in that area. The complete exposed image, consisting of the fixed mask pattern and the repair straps together is then plated.

FIG. 8 shows the substrate shown in FIG. 7 after metal plating (such as copper) followed by stripping of the photoresist areas 24 a and 24 c . As shown in FIG. 9 , via 16 a , conductor lines 30 R and 30 R′, repair strap 24 b (now shown as repair strap 18 R) and pad 17 a are formed on the top surface of the structure. Original strap 18 a was not plated because of the absence of a plating layer 23 thereat. The plating conductor layer 23 has also now been etched from the other unprotected areas leaving a conductor layer 23 under each of the repair lines 30 R and 30 R′, repair strap 18 R, pad 17 a and via 16 a . Defective via 16 a is now isolated and pad 17 a is connected to Y repair line 30 R by repair strap 18 R as shown in FIG. 2 . Conductor line 30 R will typically now be connected to other X and/or Y repair lines and terminate at a desired pad location on the module by a repair strap from the repair line to the pad formed using a phototool as described above.

FIG. 10 shows the MLTF circuitry used where the X and Y orthogonal conductor repair lines cross (intersect) on the top surface layer. The X and Y repair lines cannot, of course, contact each other except when necessary to connect an X line and Y line to define the repair path. Thus, intersection 34 shown in FIG. 2 is shown in FIG. 10 and comprises Y wiring level 13 and mask 2 layer 14 . A subway 32 is formed on layer 14 by techniques described above to form metallization such as vias, pads, etc. Vias 33 are also formed to connect with layer surface 15 . When the top surface metallurgy is formed on surface 15 using the conventional mask procedure, X line 31 R and Y line 30 R normally would intersect. To avoid X line 31 R from contacting Y line 30 R where the lines would cross, the metal conducting layer 23 is deleted before the photoresist and other steps are performed so that Y line 30 R is interrupted at points 35 and 36 and only connected to subway 32 by vias 33 . Thus, Y line 30 R is electrically continuous without contacting orthogonal X line 31 R. As shown for defective strap 18 a in FIGS. 3-9 , there is no metal plating layer 23 between ends 35 and 36 and line 31 R so that metal would not be plated and a laser delete would not be necessary to separate intersecting lines 30 R and 31 R.

While the present invention has been particularly described, in conjunction with a specific preferred embodiment, it is evident that many alternatives, modifications and variations will be apparent to those skilled in the art in light of the foregoing description. It is therefore contemplated that the appended claims will embrace any such alternatives, modifications and variations as falling within the true scope and spirit of the present invention.

Claims

1. A method of forming a multilayer thin film structure (MLTF) which comprises a series of layers comprising a dielectric having metal thereon in the form of wiring and via interconnections and a top surface layer of the structure which has vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines thereon comprising the steps of:building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure; electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections; determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure; defining the top surface connections needed to repair the defective interconnections based on the defects uncovered to determine the best metal line repair routes on the top surface layer; applying a dielectric layer and forming vias in the layer; applying a metal conducting layer on the dielectric layer and in the vias; deleting the metal conducting layer for via-pad connection straps for vias determined to be defective and for X-Y orthogonal line intersections for X and/or Y lines which are determined to be top surface metal repair connections; defining by a photoresist technique the top surface layer to form the top surface metallization as if no defects existed including a plurality of orthogonal X-Y repair lines; defining metal routes for connecting pads of defective vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered to define the first and second metal connecting line straps; and then developing and plating the top surface metallization layer to form the wiring including vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines.

2. The method of claim 1 wherein the metal repair and/or engineering change lines are defined by a photo exposure tool controlled by an algorithm that analyzes the test data and determines the repair and/or engineering change wiring needed.

3. The method of claim 1 wherein deletion of the metal conducting layer is performed using a laser.

4. The method of claim 1 wherein the top surface metallization other than the repair strap is formed using a fixed mask.

5. A method for repairing defective via interconnections of multilayer thin film structures (MLTF) or making engineering changes (EC's) to the structures which structures comprise a series of layers comprising a dielectric layer having plated metal thereon in the form of wiring and via interconnections to the next layer and a top layer of the structure which has interconnecting vias to the lower layers and corresponding chip connection pads connected to the vias by straps comprising the steps of:building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure; electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections; determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure; defining the top surface connections needed to repair the defective interconnections based on the defects uncovered and/or EC's desired to determine the best metal line repair routes on the top surface layer; applying a dielectric layer and forming vias in the layer; applying a metal conducting layer on the dielectric layer and in the vias; deleting the metal conducting layer for via-pad connection straps for vias determined to be defective and for X-Y orthogonal line intersections for X and/or Y lines which are determined to be top surface metal repair connections; defining by a photoresist technique the top surface layer to form the top surface metallization as if no defects existed including a plurality of orthogonal X-Y repair lines; defining metal routes for connecting pads of defective vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered and/or EC changes to define the first and second metal connecting line straps; and then developing and plating the top surface metallization layer to form the wiring including vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines.

6. The method of claim 5 wherein the repair straps are defined using a photo tool controlled by an algorithm that analyzes the test data and determines the repair strap wiring needed for the multilayer thin film structure.

7. The method of claim 5 wherein top surface metallization other than the repair straps is formed using a fixed mask.

8. The method of claim 5 wherein each thin film layer is tested and/or inspected after its fabrication to determine intralevel defects and repairing any such defects before the next layer is formed.

9. The method of claim 5 wherein the deletion of the metal conducting layer is performed using a laser.