Number | Date | Country | Kind |
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10-346030 | Dec 1998 | JP |
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5465046 | Campbell et al. | Nov 1995 | |
5570034 | Needham et al. | Oct 1996 | |
5578930 | Sheen | Nov 1996 | |
6064220 | Sugasawara et al. | May 2000 |
Number | Date | Country |
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3-015765 | Jan 1991 | JP |
7-063823 | Mar 1995 | JP |
10-38984 | Feb 1998 | JP |
10-082827 | Mar 1998 | JP |
11-72545 | Mar 1999 | JP |
Entry |
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Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Radiated Emissions Measurement Procedure 150kHz to 1000 MHz, TEM Cell, IEC 47A/429/NP New Work Proposal, Feb. 1996, pp. 27-42. |
Electromagnetic Emission (EME) Measurement of Integrated Circuits, DC to 1 GHZ, IEC 47A/428/NP New Work Item Proposal, Feb. 1996, pp. 1-31. |