by inductive methods

Industry

CPC
G01R31/315

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/315by inductive methods

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method of detecting a fault in a pulsed power distribution system
- Patent number 12,169,215
- Issue date Dec 17, 2024
- Panduit Corp.
- Ronald A. Nordin
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting a fault in a pulsed power distribution system
- Patent number 11,921,146
- Issue date Mar 5, 2024
- Panduit Corp.
- Ronald A. Nordin
- G01 - MEASURING TESTING
Information Patent Grant
Alternative near-field gradient probe for the suppression of radio...
- Patent number 11,733,281
- Issue date Aug 22, 2023
- Tom Lavedas
- G01 - MEASURING TESTING
Information Patent Grant
Short-circuit determining apparatus, switch apparatus and short-cir...
- Patent number 11,500,015
- Issue date Nov 15, 2022
- Fuji Electric Co., Ltd.
- Ryoga Kiguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring velocities of projectiles
- Patent number 11,320,447
- Issue date May 3, 2022
- Nielsen Kellerman Co.
- Garet L. Itz
- G01 - MEASURING TESTING
Information Patent Grant
Alternative near-field gradient probe for the suppression of radio...
- Patent number 11,300,598
- Issue date Apr 12, 2022
- Tom Lavedas
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor
- Patent number 11,035,888
- Issue date Jun 15, 2021
- Hitachi Metals, Ltd.
- Jun Umetsu
- G01 - MEASURING TESTING
Information Patent Grant
Inductive connection structure for use in an integrated circuit
- Patent number 10,991,654
- Issue date Apr 27, 2021
- STMicroelectronics S.r.l.
- Alberto Pagani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of coil coupling in an inductive charging system
- Patent number 10,879,721
- Issue date Dec 29, 2020
- Apple Inc.
- Todd K. Moyer
- G01 - MEASURING TESTING
Information Patent Grant
Ferromagnetic resonance testing of buried magnetic layers of whole...
- Patent number 10,732,217
- Issue date Aug 4, 2020
- Intel Corporation
- Kevin P. O'Brien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power drive transistor resonance sensor
- Patent number 10,718,810
- Issue date Jul 21, 2020
- Sikorsky Aircraft Corporation
- Patrick W. Kalgren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring velocities of projectiles launched from fir...
- Patent number 10,712,358
- Issue date Jul 14, 2020
- MAGNETOSPEED LLC
- Garet Itz
- G01 - MEASURING TESTING
Information Patent Grant
Strain gauge detection and orientation system
- Patent number 10,612,992
- Issue date Apr 7, 2020
- Lockheed Martin Corporation
- George N. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Detection of coil coupling in an inductive charging system
- Patent number 10,110,051
- Issue date Oct 23, 2018
- Apple Inc.
- Todd K. Moyer
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Solderless test fixture for trimmed coaxial cable or related products
- Patent number 10,031,159
- Issue date Jul 24, 2018
- CommScope Technologies LLC
- Jinchun He
- G01 - MEASURING TESTING
Information Patent Grant
Inductive connection structure for use in an integrated circuit
- Patent number 9,929,089
- Issue date Mar 27, 2018
- STMicroelectronics S.r.l.
- Alberto Pagani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for checking a circuit
- Patent number 9,851,399
- Issue date Dec 26, 2017
- GIESECKE+DEVRIENT MOBILE SECURITY GMBH
- Klaus Finkenzeller
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for measuring velocities of projectiles launched from fir...
- Patent number 9,709,593
- Issue date Jul 18, 2017
- MAGNETOSPEED LLC
- Alex J. Sitzman
- G01 - MEASURING TESTING
Information Patent Grant
Detection of coil coupling in an inductive charging system
- Patent number 9,685,814
- Issue date Jun 20, 2017
- Apple Inc.
- Todd K. Moyer
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Magnetic field probe, magnetic field measurement system and magneti...
- Patent number 9,606,198
- Issue date Mar 28, 2017
- NATIONAL TAIWAN UNIVERSITY
- Yien-Tien Chou
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic pre-conditioning of magnetic sensors
- Patent number 9,543,067
- Issue date Jan 10, 2017
- NXP USA, INC.
- Carlos M. Acuna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for localization of open defects in electronic de...
- Patent number 9,529,035
- Issue date Dec 27, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measuring system for contactless decoupling of a signal...
- Patent number 9,291,644
- Issue date Mar 22, 2016
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 9,123,571
- Issue date Sep 1, 2015
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Grant
Contactless loop probe
- Patent number 8,963,570
- Issue date Feb 24, 2015
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measuring system for near field measurement of a signal...
- Patent number 8,803,538
- Issue date Aug 12, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,664,967
- Issue date Mar 4, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Masaaki Hiroki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and semiconductor wafer inspection method using the same
- Patent number 8,659,312
- Issue date Feb 25, 2014
- Panasonic Corporation
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit testing apparatus
- Patent number 8,648,614
- Issue date Feb 11, 2014
- Keio University
- Tadahiro Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,633,037
- Issue date Jan 21, 2014
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETECTING A FAULT IN A PULSED POWER DISTRIBUTION SYSTEM
- Publication number 20240159814
- Publication date May 16, 2024
- Panduit Corp.
- RONALD A. NORDIN
- G01 - MEASURING TESTING
Information Patent Application
Alternative Near-Field Gradient Probe For The Suppression Of Radio...
- Publication number 20240019472
- Publication date Jan 18, 2024
- Tom Lavedas
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTOR FOR SEMICONDUCTOR DIES
- Publication number 20230168300
- Publication date Jun 1, 2023
- STMicroelectronics S.r.l.
- Mauro GIACOMINI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Alternative Near-Field Gradient Probe For The Suppression Of Radio...
- Publication number 20220229101
- Publication date Jul 21, 2022
- Tom Lavedas
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING A FAULT IN A PULSED POWER DISTRIBUTION SYSTEM
- Publication number 20220050135
- Publication date Feb 17, 2022
- Panduit Corp.
- RONALD A. NORDIN
- G01 - MEASURING TESTING
Information Patent Application
SHORT-CIRCUIT DETERMINING APPARATUS, SWITCH APPARATUS AND SHORT-CIR...
- Publication number 20220003816
- Publication date Jan 6, 2022
- Fuji Electric Co., Ltd.
- Ryoga KIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FAULT DETECTION
- Publication number 20210215750
- Publication date Jul 15, 2021
- ENICS AG
- Kristian FEDERLEY
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING VELOCITIES OF PROJECTILES
- Publication number 20200319225
- Publication date Oct 8, 2020
- MAGNETOSPEED LLC
- GARET L. ITZ
- G01 - MEASURING TESTING
Information Patent Application
ALTERNATIVE NEAR-FIELD GRADIENT PROBE FOR THE SUPPRESSION OF RADIO...
- Publication number 20200264220
- Publication date Aug 20, 2020
- Tom Lavedas
- G01 - MEASURING TESTING
Information Patent Application
FERROMAGNETIC RESONANCE TESTING OF BURIED MAGNETIC LAYERS OF WHOLE...
- Publication number 20190049514
- Publication date Feb 14, 2019
- Intel Corporation
- KEVIN P. O'BRIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER DRIVE TRANSISTOR RESONANCE SENSOR
- Publication number 20180180671
- Publication date Jun 28, 2018
- SIKORSKY AIRCRAFT CORPORATION
- Patrick W. Kalgren
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE CONNECTION STRUCTURE FOR USE IN AN INTEGRATED CIRCUIT
- Publication number 20180174964
- Publication date Jun 21, 2018
- STMicroelectronics S.r.l.
- Alberto Pagani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection of Coil Coupling in an Inductive Charging System
- Publication number 20180013312
- Publication date Jan 11, 2018
- Apple Inc.
- Todd K. Moyer
- G01 - MEASURING TESTING
Information Patent Application
SOLDERLESS TEST FIXTURE FOR TRIMMED COAXIAL CABLE OR RELATED PRODUCTS
- Publication number 20170052215
- Publication date Feb 23, 2017
- CommScope Technologies LLC
- Jinchun He
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING VARIABLE FREQUENC...
- Publication number 20160252572
- Publication date Sep 1, 2016
- SK HYNIX INC.
- Seung Geun BAEK
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Checking a Circuit
- Publication number 20160146886
- Publication date May 26, 2016
- Giesecke & Devrient GmbH
- Klaus Finkenzeller
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PRE-CONDITIONING OF MAGNETIC SENSORS
- Publication number 20150179325
- Publication date Jun 25, 2015
- CARLOS M. ACUNA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING CHARACTERISTICS OF AN ELECTRICAL D...
- Publication number 20150130480
- Publication date May 14, 2015
- GENERAL ELECTRIC COMPANY
- Ertugrul Berkcan
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20140300381
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR LOCALIZATION OF OPEN DEFECTS IN ELECTRONIC DE...
- Publication number 20140253111
- Publication date Sep 11, 2014
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140103487
- Publication date Apr 17, 2014
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130062731
- Publication date Mar 14, 2013
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC STEERING APPLICATION FOR SINGULATED (X) MR SENSORS
- Publication number 20120242333
- Publication date Sep 27, 2012
- NXP B.V.
- Jochen Eshold
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE CONNECTION STRUCTURE FOR USE IN AN INTEGRATED CIRCUIT
- Publication number 20120153745
- Publication date Jun 21, 2012
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Application
Method of characterizing an electrical defect affecting an electron...
- Publication number 20120116734
- Publication date May 10, 2012
- Centre National D'Etudes Spatiales
- Fulvio INFANTE
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS LOOP PROBE
- Publication number 20110267088
- Publication date Nov 3, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20110260743
- Publication date Oct 27, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20110204359
- Publication date Aug 25, 2011
- RENESAS ELECTRONICS CORPORATION
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT AND COMMUNICATION FUNCTIONALITY INSPECTION METHOD
- Publication number 20110201271
- Publication date Aug 18, 2011
- KEIO UNIVERSITY
- Tadahiro Kuroda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DE...
- Publication number 20110187352
- Publication date Aug 4, 2011
- CENTRE NATIONAL D'ETUDES SPATIALES (C.N.E.S.)
- Philippe Perdu
- G01 - MEASURING TESTING

by inductive methods

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of detecting a fault in a pulsed power distribution system

Method of detecting a fault in a pulsed power distribution system

Alternative near-field gradient probe for the suppression of radio...

Short-circuit determining apparatus, switch apparatus and short-cir...

Apparatus for measuring velocities of projectiles

Alternative near-field gradient probe for the suppression of radio...

Current sensor

Inductive connection structure for use in an integrated circuit

Detection of coil coupling in an inductive charging system

Ferromagnetic resonance testing of buried magnetic layers of whole...

Power drive transistor resonance sensor

Apparatus for measuring velocities of projectiles launched from fir...

Strain gauge detection and orientation system

Detection of coil coupling in an inductive charging system

Solderless test fixture for trimmed coaxial cable or related products

Inductive connection structure for use in an integrated circuit

Method and apparatus for checking a circuit

Apparatus for measuring velocities of projectiles launched from fir...

Detection of coil coupling in an inductive charging system

Magnetic field probe, magnetic field measurement system and magneti...

Magnetic pre-conditioning of magnetic sensors

Method and system for localization of open defects in electronic de...

Contactless measuring system for contactless decoupling of a signal...

Semiconductor device

Contactless loop probe

Contactless measuring system for near field measurement of a signal...

Inspection method and inspection apparatus

Probe card and semiconductor wafer inspection method using the same

Electronic circuit testing apparatus

Semiconductor device

Patents Applicationslast 30 patents

METHOD OF DETECTING A FAULT IN A PULSED POWER DISTRIBUTION SYSTEM

Alternative Near-Field Gradient Probe For The Suppression Of Radio...

CRACK DETECTOR FOR SEMICONDUCTOR DIES

Alternative Near-Field Gradient Probe For The Suppression Of Radio...

METHOD OF DETECTING A FAULT IN A PULSED POWER DISTRIBUTION SYSTEM

SHORT-CIRCUIT DETERMINING APPARATUS, SWITCH APPARATUS AND SHORT-CIR...

METHOD AND SYSTEM FOR FAULT DETECTION

APPARATUS FOR MEASURING VELOCITIES OF PROJECTILES

ALTERNATIVE NEAR-FIELD GRADIENT PROBE FOR THE SUPPRESSION OF RADIO...

FERROMAGNETIC RESONANCE TESTING OF BURIED MAGNETIC LAYERS OF WHOLE...

POWER DRIVE TRANSISTOR RESONANCE SENSOR

INDUCTIVE CONNECTION STRUCTURE FOR USE IN AN INTEGRATED CIRCUIT

Detection of Coil Coupling in an Inductive Charging System

SOLDERLESS TEST FIXTURE FOR TRIMMED COAXIAL CABLE OR RELATED PRODUCTS

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING VARIABLE FREQUENC...

Method and Apparatus for Checking a Circuit

MAGNETIC PRE-CONDITIONING OF MAGNETIC SENSORS

SYSTEM AND METHOD FOR MONITORING CHARACTERISTICS OF AN ELECTRICAL D...

CONTACTLESS MEASURING SYSTEM

METHOD AND SYSTEM FOR LOCALIZATION OF OPEN DEFECTS IN ELECTRONIC DE...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

MAGNETIC STEERING APPLICATION FOR SINGULATED (X) MR SENSORS

INDUCTIVE CONNECTION STRUCTURE FOR USE IN AN INTEGRATED CIRCUIT

Method of characterizing an electrical defect affecting an electron...

CONTACTLESS LOOP PROBE

CONTACTLESS MEASURING SYSTEM

Semiconductor device

ELECTRONIC CIRCUIT AND COMMUNICATION FUNCTIONALITY INSPECTION METHOD

METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DE...