Number | Date | Country | Kind |
---|---|---|---|
9-198446 | Jul 1997 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
5449638 | Hong et al. | Sep 1995 | |
5686346 | Duane | Nov 1997 | |
5773989 | Edelman et al. | Jun 1998 |
Entry |
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A. Berman, "Time-Zero Dielectric Reliability Test by a Ramp Method", IEEE/PROC. IRPS, pp. 204-209, 1981. |
K. Yamabe, et al. "Time-Dependent Dielectric Breakdown of Thin Thermally Frown SiO.sub.2 Films", IEEE Transactions on Electron Devices, vol. ED-32, No. 2, pp. 423-428, Feb. 1985. |
Published by Engineering Department of Electronic Industries Association, "Procedure for the Wafer-Level Testing of Thin Dielectrics", JEDEC Standard No. 35, pp. 1-39, Jul. 1992. |