Claims
- 1. A semiconductor energy detector comprising a semiconductor substrate having an inside region and a peripheral part, said inside region having a thickness which is smaller than that of the peripheral part, and having a charge readout area formed on a front surface side of said semiconductor substrate in order to read a charge generated in said semiconductor substrate according to incidence of an energy ray from a back surface side of the semiconductor substrate,wherein one or more reinforcements are provided in said inside region; wherein an array of vertical transfer channels for generated charges is provided on the front surface side of said semiconductor substrate, the charges in the transfer channel extending to said readout area; and wherein each of said transfer channels extends across at least one of said reinforcements.
- 2. A semiconductor energy detector according to claim 1, wherein each reinforcement is integrally formed with said semiconductor substrate.
- 3. A semiconductor energy detector according to claim 2, wherein said semiconductor substrate and each reinforcement are comprised of silicon.
- 4. A semiconductor energy detector according to claim 1, wherein ends of each reinforcement are connected to the peripheral part of said semiconductor substrate.
- 5. A semiconductor energy detector according to claim 1, wherein said charge readout area is comprised of a charge coupled device.
- 6. A semiconductor energy detector according to claim 1, wherein said charge readout area has a plurality of transfer channels for transfer of the charge generated.
- 7. A semiconductor energy detector according to claim 6, wherein when said detector is viewed in a two dimensional plane view, said reinforcement intersects and extends across at least two of said transfer channels.
- 8. A semiconductor energy detector according to claim 7, wherein when said detector is viewed in a two dimensional plane view, an area is defined by the intersection of said reinforcement and one of said transfer channels and the total area of all the area defined by the intersection of a representative transfer channel and all the reinforcements intersected in said representative transfer channel is equal to a total area of any one of the remaining transfer channels and the corresponding intersections with said reinforcements.
- 9. A semiconductor energy detector according to claim 6, further comprising a charge transfer control portion for controlling said charge readout area so as to make said transfer channels perform the charge transfer at a speed corresponding to a moving speed of a detection object.
Priority Claims (1)
Number |
Date |
Country |
Kind |
10-312255 |
Nov 1998 |
JP |
|
RELATED APPLICATION
This is a continuation-in-part application of application serial no. PCT/JP99/06045 filed on Oct. 29, 1999, now pending.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
4675525 |
Amingual et al. |
Jun 1987 |
A |
6033489 |
Marchant et al. |
Mar 2000 |
A |
6057539 |
Zhou et al. |
May 2000 |
A |
Foreign Referenced Citations (4)
Number |
Date |
Country |
0 858 112 |
Aug 1998 |
EP |
5-121711 |
May 1993 |
JP |
6-29506 |
Feb 1994 |
JP |
6-45574 |
Feb 1994 |
JP |
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
PCT/JP99/06045 |
Oct 1999 |
US |
Child |
09/845204 |
|
US |