T. Takeshima et al., "A 55-ns 16 Mb DRAM with Built-in Self-Test Function Using Microprogram ROM", IEEE Journal of Solid-State Circuits, vol. 25, No. 4, pp. 903-909 (Aug. 1990). |
T. Takeshima et al., "A 55ns 16 Mb DRAM", for ISSCC Digest of Technical Papers, at pp. 246-247 (1989). |
"2.3 Built-In Test", from Built-In Test For VLSI, Wiley-Interscience, at pp. 38-43. |
H. Koike et al, "A 55ns 16Mb DRAM w/ Built-In Self-Test Function Using Micro-Program ROM", pp. 79-85 Electronics, Information & Communication Engineers (w/ partial English translation), 1989. |