using dedicated test connectors, test elements or test circuits on the IC under test

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G01R31/2884

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2884using dedicated test connectors, test elements or test circuits on the IC under test

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 12,203,980
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 12,196,822
- Issue date Jan 14, 2025
- Hitachi Astemo, Ltd.
- Tomoki Takamoto
- G01 - MEASURING TESTING
Information Patent Grant
Display substrate, manufacturing method thereof, and display device
- Patent number 12,200,986
- Issue date Jan 14, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Bo Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with interface structure
- Patent number 12,181,518
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chun-Huang Yu
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit and semiconductor device
- Patent number 12,174,247
- Issue date Dec 24, 2024
- SK Hynix Inc.
- Tae-Pyeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSV testing
- Patent number 12,163,998
- Issue date Dec 10, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip checker for on-chip safety area
- Patent number 12,164,000
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Alessandro Cannone
- G01 - MEASURING TESTING
Information Patent Grant
Shielded interconnect system
- Patent number 12,167,582
- Issue date Dec 10, 2024
- GITech, Inc.
- John Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, a device and a computer program for operating a modular tes...
- Patent number 12,153,091
- Issue date Nov 26, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Mixed signal test device based on graphical control
- Patent number 12,111,349
- Issue date Oct 8, 2024
- Macrotest Semiconductor Inc.
- Quanren Li
- G01 - MEASURING TESTING
Information Patent Grant
FCM based chiplet test circuit
- Patent number 12,099,086
- Issue date Sep 24, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for carrying chip, and device and method for testing chip
- Patent number 12,092,654
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scan test in a single-wire bus circuit
- Patent number 12,092,689
- Issue date Sep 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods to monitor leakage current
- Patent number 12,085,601
- Issue date Sep 10, 2024
- STMicroelectronics S.r.l.
- Romeo Letor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical device
- Patent number 12,078,687
- Issue date Sep 3, 2024
- AMS-OSRAM INTERNATIONAL GMBH
- Dirk Becker
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration checking apparatus and deterioration checking
- Patent number 12,072,368
- Issue date Aug 27, 2024
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection pad structure for analysis in a semiconductor device
- Patent number 12,072,374
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Jihoon Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 12,072,375
- Issue date Aug 27, 2024
- Mitsumi Electric Co., Ltd.
- Yoichi Takano
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit fault detection apparatus
- Patent number 12,066,485
- Issue date Aug 20, 2024
- Denso Corporation
- Yuichiro Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer and multi-chip parallel testing method
- Patent number 12,066,486
- Issue date Aug 20, 2024
- Winbond Electronics Corp.
- Chih-Chiang Lai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device and method of operating the same
- Patent number 12,050,245
- Issue date Jul 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kong-Beng Thei
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for remote access hardware testing
- Patent number 12,044,728
- Issue date Jul 23, 2024
- DISH Network L.L.C.
- Mansoor Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Flexible input/output (I/O) allocation for integrated circuit scan...
- Patent number 12,032,015
- Issue date Jul 9, 2024
- Amazon Technologies, Inc.
- Ilan Strulovici
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line detection of electrical fails on integrated circuits
- Patent number 12,013,442
- Issue date Jun 18, 2024
- Intel Corporation
- Enlan Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Method of copper hillock detecting
- Patent number 12,007,435
- Issue date Jun 11, 2024
- United Microelectronics Corp.
- Ching-Chih Chang
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of integrated substrate
- Patent number 12,009,329
- Issue date Jun 11, 2024
- Dyi-Chung Hu
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method
- Patent number 12,007,436
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME
- Publication number 20250054817
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Wei-Kuan Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...
- Publication number 20250035701
- Publication date Jan 30, 2025
- SUMSUNG ELECTRONICS CO., LTD.
- Gyosoo CHOO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20250035698
- Publication date Jan 30, 2025
- JCET STATS ChipPAC Korea Limited
- SeungHyeon JEONG
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
- Publication number 20250035700
- Publication date Jan 30, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Hoon Kim
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS
- Publication number 20250027989
- Publication date Jan 23, 2025
- Raytheon Company
- Micky Harris
- G01 - MEASURING TESTING
Information Patent Application
UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...
- Publication number 20250020714
- Publication date Jan 16, 2025
- ROBERT BOSCH GmbH
- Eric Sebastian Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST STRUCTURE FOR MOL RELIABILITY EVALUATION
- Publication number 20250022759
- Publication date Jan 16, 2025
- International Business Machines Corporation
- HUIMEI ZHOU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR
- Publication number 20240426902
- Publication date Dec 26, 2024
- Yiming YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Thermal and Electrical Conductivity Between Metal Contacts
- Publication number 20240410939
- Publication date Dec 12, 2024
- Wolfspeed, Inc.
- Alexander Komposch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING POWER-ON RESET THRESHOLD
- Publication number 20240402241
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Sandor PETENYI
- G01 - MEASURING TESTING
Information Patent Application
Decoupling Cells Testability
- Publication number 20240369619
- Publication date Nov 7, 2024
- MELLANOX TECHNOLOGIES, LTD.
- Ido Bourstein
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT PROBING PAD DESIGN IN SCRIBE LINE STRUCTURE AND METHOD FOR...
- Publication number 20240363454
- Publication date Oct 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT PROBING PAD DESIGN IN SCRIBE LINE STRUCTURE AND METHOD FOR...
- Publication number 20240363453
- Publication date Oct 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALOG TEST DEVICES FOR INTEGRATED CIRCUITS WITH MULTIPLE POWER DOM...
- Publication number 20240353478
- Publication date Oct 24, 2024
- NXP B.V.
- Prashant Goyal
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR VOLTAGE CONTRAST DEFECT INSPECTION
- Publication number 20240353480
- Publication date Oct 24, 2024
- Peter James O'Brien
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING DEVICE AND METHOD OF OPERATING THE SAME
- Publication number 20240353474
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kong-Beng THEI
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP FAULT DETECTION DUE TO MALFUNCTIONS ON CHIP PINS
- Publication number 20240353479
- Publication date Oct 24, 2024
- NXP USA, Inc.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING
- Publication number 20240345158
- Publication date Oct 17, 2024
- Dish Network L.L.C.
- Mansoor Ahmed
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND TEST DEVICE FOR IDENTIFYING CRITICAL POINTS OF A CI...
- Publication number 20240345157
- Publication date Oct 17, 2024
- MEDIATEK INC.
- Harry Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT
- Publication number 20240345162
- Publication date Oct 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND SYSTEMS FOR VERIFYING INTEGRATED CIRCUITS
- Publication number 20240337687
- Publication date Oct 10, 2024
- Samsung Electronics Co., Ltd.
- Taehwan KIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COUPLING TO AN ELECTRICAL INTERFACE OF A C...
- Publication number 20240339782
- Publication date Oct 10, 2024
- Western Digital Technologies, Inc.
- Channarong Thangchotika
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSP...
- Publication number 20240336065
- Publication date Oct 10, 2024
- Canon Kabushiki Kaisha
- TAKAMITSU TOKUDA
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
DEVICE UNDER TEST (DUT) STRUCTURES FOR VOLTAGE CONTRAST (VC) DETECT...
- Publication number 20240329122
- Publication date Oct 3, 2024
- Intel Corporation
- Sairam SUBRAMANIAN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DRIVER DEVICE
- Publication number 20240329124
- Publication date Oct 3, 2024
- LAPIS Technology Co., Ltd.
- Kunihiro HARAYAMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus and Method for Testing Semiconductor Devices
- Publication number 20240329134
- Publication date Oct 3, 2024
- Testmetrix, Inc.
- Christian O. Cojocneanu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD
- Publication number 20240329123
- Publication date Oct 3, 2024
- LAPIS Technology Co., Ltd.
- Hirokazu MIYAZAKI
- H03 - BASIC ELECTRONIC CIRCUITRY

using dedicated test connectors, test elements or test circuits on the IC under test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer level methods of testing semiconductor devices using internal...

Semiconductor device

Display substrate, manufacturing method thereof, and display device

Semiconductor device with interface structure

Monitoring circuit and semiconductor device

TSV testing

On-chip checker for on-chip safety area

Shielded interconnect system

Method, a device and a computer program for operating a modular tes...

Interface to full and reduced pin JTAG devices

Module substrate for semiconductor module, semiconductor module and...

Mixed signal test device based on graphical control

FCM based chiplet test circuit

Assembly for carrying chip, and device and method for testing chip

Scan test in a single-wire bus circuit

Systems and methods to monitor leakage current

Electrical device

Deterioration checking apparatus and deterioration checking

Detection pad structure for analysis in a semiconductor device

Semiconductor integrated circuit

Circuit fault detection apparatus

Semiconductor wafer and multi-chip parallel testing method

Semiconductor testing device and method of operating the same

Methods and systems for remote access hardware testing

Test socket for performing a test on an electronic device

Flexible input/output (I/O) allocation for integrated circuit scan...

In-line detection of electrical fails on integrated circuits

Method of copper hillock detecting

Manufacturing method of integrated substrate

Test circuit and method

Patents Applicationslast 30 patents

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...

METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST TRAY SYSTEM AND RELATED METHOD

INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS

UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...

TEST STRUCTURE FOR MOL RELIABILITY EVALUATION

ELECTRICAL CONNECTION APPARATUS

SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR

Improved Thermal and Electrical Conductivity Between Metal Contacts

METHOD AND APPARATUS FOR DETECTING POWER-ON RESET THRESHOLD

Decoupling Cells Testability

CIRCUIT PROBING PAD DESIGN IN SCRIBE LINE STRUCTURE AND METHOD FOR...

CIRCUIT PROBING PAD DESIGN IN SCRIBE LINE STRUCTURE AND METHOD FOR...

ANALOG TEST DEVICES FOR INTEGRATED CIRCUITS WITH MULTIPLE POWER DOM...

METHODS AND APPARATUS FOR VOLTAGE CONTRAST DEFECT INSPECTION

SEMICONDUCTOR TESTING DEVICE AND METHOD OF OPERATING THE SAME

ON-CHIP FAULT DETECTION DUE TO MALFUNCTIONS ON CHIP PINS

METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING

TEST METHOD AND TEST DEVICE FOR IDENTIFYING CRITICAL POINTS OF A CI...

SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT

METHODS AND SYSTEMS FOR VERIFYING INTEGRATED CIRCUITS

APPARATUS AND METHOD FOR COUPLING TO AN ELECTRICAL INTERFACE OF A C...

FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSP...

DEVICE UNDER TEST (DUT) STRUCTURES FOR VOLTAGE CONTRAST (VC) DETECT...

SEMICONDUCTOR DEVICE AND DRIVER DEVICE

Apparatus and Method for Testing Semiconductor Devices

SEMICONDUCTOR DEVICE AND TEST METHOD