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using dedicated test connectors, test elements or test circuits on the IC under test
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Industry
CPC
G01R31/2884
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2884
using dedicated test connectors, test elements or test circuits on the IC under test
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