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using dedicated test connectors, test elements or test circuits on the IC under test
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G01R31/2884
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/2884
using dedicated test connectors, test elements or test circuits on the IC under test
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Patents Grants
last 30 patents
Information
Patent Grant
Defect detection system for cavity in integrated circuit
Patent number
12,292,470
Issue date
May 6, 2025
GLOBALFOUNDRIES U.S. Inc.
Zhuojie Wu
G01 - MEASURING TESTING
Information
Patent Grant
Display substrate, manufacturing method thereof, and display device
Patent number
12,295,228
Issue date
May 6, 2025
Chegdu BOE Optoelectronics Technology Co., Ltd.
Bo Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
GaN HEMT device for irradiation damage detection and detection and...
Patent number
12,287,360
Issue date
Apr 29, 2025
Nanjing University
Feng Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
12,282,056
Issue date
Apr 22, 2025
Renesas Electronics Corporation
Noboru Inomata
G01 - MEASURING TESTING
Information
Patent Grant
Organic light emitting diode display substrate and preparing method...
Patent number
12,274,136
Issue date
Apr 8, 2025
Chengdu BOE Optoelectronics Technology Co., Ltd.
Hongjun Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Benchmark device and method for evaluating a semiconductor wafer
Patent number
12,270,854
Issue date
Apr 8, 2025
Taiwan Semiconductor Manufacturing Company Ltd.
Lan-Chou Cho
G02 - OPTICS
Information
Patent Grant
Semiconductor wafer configured for single touch-down testing
Patent number
12,270,853
Issue date
Apr 8, 2025
SanDisk Technologies, Inc.
Toru Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technologies for on-circuit board de-embedding
Patent number
12,259,430
Issue date
Mar 25, 2025
Intel Corporation
Bishnu Prasad Patra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test key and semiconductor die including the same
Patent number
12,255,112
Issue date
Mar 18, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Tse-Pan Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radio frequency performance characterization of multi-carrier broad...
Patent number
12,248,000
Issue date
Mar 11, 2025
Charter Communications Operating, LLC
Diana Linton
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Display panel and test method thereof, display apparatus
Patent number
12,250,867
Issue date
Mar 11, 2025
HEFEI BOE JOINT TECHNOLOGY CO., LTD.
Zhidong Yuan
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Wafer level methods of testing semiconductor devices using internal...
Patent number
12,203,980
Issue date
Jan 21, 2025
Samsung Electronics Co., Ltd.
Ahn Choi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
12,196,822
Issue date
Jan 14, 2025
Hitachi Astemo, Ltd.
Tomoki Takamoto
G01 - MEASURING TESTING
Information
Patent Grant
Display substrate, manufacturing method thereof, and display device
Patent number
12,200,986
Issue date
Jan 14, 2025
Chengdu BOE Optoelectronics Technology Co., Ltd.
Bo Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device with interface structure
Patent number
12,181,518
Issue date
Dec 31, 2024
NANYA TECHNOLOGY CORPORATION
Chun-Huang Yu
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring circuit and semiconductor device
Patent number
12,174,247
Issue date
Dec 24, 2024
SK Hynix Inc.
Tae-Pyeong Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
TSV testing
Patent number
12,163,998
Issue date
Dec 10, 2024
Texas Instruments Incorporated
Lee D. Whetsel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
On-chip checker for on-chip safety area
Patent number
12,164,000
Issue date
Dec 10, 2024
STMicroelectronics S.r.l.
Alessandro Cannone
G01 - MEASURING TESTING
Information
Patent Grant
Shielded interconnect system
Patent number
12,167,582
Issue date
Dec 10, 2024
GITech, Inc.
John Williams
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, a device and a computer program for operating a modular tes...
Patent number
12,153,091
Issue date
Nov 26, 2024
Volkswagen Aktiengesellschaft
Andreas Aal
G01 - MEASURING TESTING
Information
Patent Grant
Interface to full and reduced pin JTAG devices
Patent number
12,130,328
Issue date
Oct 29, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Module substrate for semiconductor module, semiconductor module and...
Patent number
12,130,306
Issue date
Oct 29, 2024
Samsung Electronics Co., Ltd.
Kwangkyu Bang
G01 - MEASURING TESTING
Information
Patent Grant
Mixed signal test device based on graphical control
Patent number
12,111,349
Issue date
Oct 8, 2024
Macrotest Semiconductor Inc.
Quanren Li
G01 - MEASURING TESTING
Information
Patent Grant
FCM based chiplet test circuit
Patent number
12,099,086
Issue date
Sep 24, 2024
Nanjing University Of Posts And Telecommunications
Zhikuang Cai
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for carrying chip, and device and method for testing chip
Patent number
12,092,654
Issue date
Sep 17, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Jinrong Huang
G01 - MEASURING TESTING
Information
Patent Grant
Scan test in a single-wire bus circuit
Patent number
12,092,689
Issue date
Sep 17, 2024
Qorvo US, Inc.
Alexander Wayne Hietala
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods to monitor leakage current
Patent number
12,085,601
Issue date
Sep 10, 2024
STMicroelectronics S.r.l.
Romeo Letor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical device
Patent number
12,078,687
Issue date
Sep 3, 2024
AMS-OSRAM INTERNATIONAL GMBH
Dirk Becker
G01 - MEASURING TESTING
Information
Patent Grant
Deterioration checking apparatus and deterioration checking
Patent number
12,072,368
Issue date
Aug 27, 2024
Kabushiki Kaisha Toshiba
Hideaki Majima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection pad structure for analysis in a semiconductor device
Patent number
12,072,374
Issue date
Aug 27, 2024
Samsung Electronics Co., Ltd.
Jihoon Chang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CHARACTERIZING PATH MARGIN MONITORS WITHOUT THE USE OF SCAN CHAINS
Publication number
20250164550
Publication date
May 22, 2025
Synopsys, Inc.
Gulve Rohini Vasant
G01 - MEASURING TESTING
Information
Patent Application
Electronic Component and Method of Operating Such a Component
Publication number
20250164551
Publication date
May 22, 2025
TDK-Micronas GmbH
Thilo Rubehn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POWER MODULE AND POWER CONVERTER INCLUDING SAME
Publication number
20250116700
Publication date
Apr 10, 2025
Mitsubishi Heavy Industries, Ltd.
Norihito Yanagita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...
Publication number
20250110172
Publication date
Apr 3, 2025
Taiwan Semiconductor Manufacturing Company, Ltd.
Ying-Chih Hsu
G01 - MEASURING TESTING
Information
Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
Publication number
20250102559
Publication date
Mar 27, 2025
ASTI GLOBAL INC., TAIWAN
CHIEN-SHOU LIAO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME
Publication number
20250096047
Publication date
Mar 20, 2025
Samsung Electronics Co., Ltd.
YEONGSEON KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BUILT-IN SELF TEST WITH CURRENT MEASUREMENT FOR ANALOG CIRCUIT VERI...
Publication number
20250093409
Publication date
Mar 20, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Francois LAULANET
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE
Publication number
20250093410
Publication date
Mar 20, 2025
Samsung Electronics Co., Ltd.
Donguk PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THROUGH-SILICON VIA (TSV) TESTING
Publication number
20250093404
Publication date
Mar 20, 2025
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTS
Publication number
20250085341
Publication date
Mar 13, 2025
Microsoft Technology Licensing, LLC
Terrence Huat Hin TAN
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION SYSTEM AND METHOD FOR SEMICONDUCTOR CIRCUIT
Publication number
20250085336
Publication date
Mar 13, 2025
REALTEK SEMICONDUCTOR CORPORATION
Li-Lung KAO
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Minimum Integrated Circuit Operating Voltage Searching Method and M...
Publication number
20250076369
Publication date
Mar 6, 2025
MEDIATEK INC.
Ronald Kuo-Hua Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IC TEST METHOD AND IC TEST SYSTEM
Publication number
20250076370
Publication date
Mar 6, 2025
Realtek Semiconductor Corp.
Jian-Xing Huang
G01 - MEASURING TESTING
Information
Patent Application
VIA ACCURACY MEASUREMENT
Publication number
20250079242
Publication date
Mar 6, 2025
Taiwan Semiconductor Manufacturing Company, Ltd.
Wei-Hsuen Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO TEST SYNCHRONOUS DOMAINS DURING STUCK-AT TEST
Publication number
20250070785
Publication date
Feb 27, 2025
STMicroelectronics International N.V.
Venkata Narayanan SRINIVASAN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE
Publication number
20250067798
Publication date
Feb 27, 2025
SK HYNIX INC.
Tae-Pyeong KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
Publication number
20250052811
Publication date
Feb 13, 2025
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME
Publication number
20250054817
Publication date
Feb 13, 2025
Taiwan Semiconductor Manufacturing company Ltd.
Wei-Kuan Yen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
Publication number
20250044345
Publication date
Feb 6, 2025
MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
Guoliang MAO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...
Publication number
20250035701
Publication date
Jan 30, 2025
SUMSUNG ELECTRONICS CO., LTD.
Gyosoo CHOO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20250035698
Publication date
Jan 30, 2025
JCET STATS ChipPAC Korea Limited
SeungHyeon JEONG
G01 - MEASURING TESTING
Information
Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
Publication number
20250035700
Publication date
Jan 30, 2025
GLOBALFOUNDRIES U.S. Inc.
Jae Hoon Kim
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS
Publication number
20250027989
Publication date
Jan 23, 2025
Raytheon Company
Micky Harris
G01 - MEASURING TESTING
Information
Patent Application
UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...
Publication number
20250020714
Publication date
Jan 16, 2025
ROBERT BOSCH GmbH
Eric Sebastian Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST STRUCTURE FOR MOL RELIABILITY EVALUATION
Publication number
20250022759
Publication date
Jan 16, 2025
International Business Machines Corporation
HUIMEI ZHOU
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL CONNECTION APPARATUS
Publication number
20240426903
Publication date
Dec 26, 2024
Kabushiki Kaisha Nihon Micronics
Souichi KANOSUE
G01 - MEASURING TESTING
Information
Patent Application
SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR
Publication number
20240426902
Publication date
Dec 26, 2024
Yiming YU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Improved Thermal and Electrical Conductivity Between Metal Contacts
Publication number
20240410939
Publication date
Dec 12, 2024
Wolfspeed, Inc.
Alexander Komposch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING POWER-ON RESET THRESHOLD
Publication number
20240402241
Publication date
Dec 5, 2024
STMicroelectronics International N.V.
Sandor PETENYI
G01 - MEASURING TESTING
Information
Patent Application
Decoupling Cells Testability
Publication number
20240369619
Publication date
Nov 7, 2024
MELLANOX TECHNOLOGIES, LTD.
Ido Bourstein
G01 - MEASURING TESTING