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Semiconductor device
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Patent number 12,196,822
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Issue date Jan 14, 2025
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Hitachi Astemo, Ltd.
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Tomoki Takamoto
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G01 - MEASURING TESTING
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TSV testing
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Patent number 12,163,998
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Issue date Dec 10, 2024
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Texas Instruments Incorporated
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Lee D. Whetsel
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H01 - BASIC ELECTRIC ELEMENTS
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FCM based chiplet test circuit
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Patent number 12,099,086
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Issue date Sep 24, 2024
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Nanjing University Of Posts And Telecommunications
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Zhikuang Cai
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G01 - MEASURING TESTING
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Electrical device
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Patent number 12,078,687
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Issue date Sep 3, 2024
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AMS-OSRAM INTERNATIONAL GMBH
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Dirk Becker
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G01 - MEASURING TESTING
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Test circuit and method
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Patent number 12,007,436
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Issue date Jun 11, 2024
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Taiwan Semiconductor Manufacturing Company, Ltd
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Hsieh-Hung Hsieh
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G01 - MEASURING TESTING