using dedicated test connectors, test elements or test circuits on the IC under test

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G01R31/2884

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2884using dedicated test connectors, test elements or test circuits on the IC under test

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection system for cavity in integrated circuit
- Patent number 12,292,470
- Issue date May 6, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Zhuojie Wu
- G01 - MEASURING TESTING
Information Patent Grant
Display substrate, manufacturing method thereof, and display device
- Patent number 12,295,228
- Issue date May 6, 2025
- Chegdu BOE Optoelectronics Technology Co., Ltd.
- Bo Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GaN HEMT device for irradiation damage detection and detection and...
- Patent number 12,287,360
- Issue date Apr 29, 2025
- Nanjing University
- Feng Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 12,282,056
- Issue date Apr 22, 2025
- Renesas Electronics Corporation
- Noboru Inomata
- G01 - MEASURING TESTING
Information Patent Grant
Organic light emitting diode display substrate and preparing method...
- Patent number 12,274,136
- Issue date Apr 8, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Hongjun Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Benchmark device and method for evaluating a semiconductor wafer
- Patent number 12,270,854
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Lan-Chou Cho
- G02 - OPTICS
Information Patent Grant
Semiconductor wafer configured for single touch-down testing
- Patent number 12,270,853
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Toru Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technologies for on-circuit board de-embedding
- Patent number 12,259,430
- Issue date Mar 25, 2025
- Intel Corporation
- Bishnu Prasad Patra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test key and semiconductor die including the same
- Patent number 12,255,112
- Issue date Mar 18, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tse-Pan Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel and test method thereof, display apparatus
- Patent number 12,250,867
- Issue date Mar 11, 2025
- HEFEI BOE JOINT TECHNOLOGY CO., LTD.
- Zhidong Yuan
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Radio frequency performance characterization of multi-carrier broad...
- Patent number 12,248,000
- Issue date Mar 11, 2025
- Charter Communications Operating, LLC
- Diana Linton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 12,203,980
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 12,196,822
- Issue date Jan 14, 2025
- Hitachi Astemo, Ltd.
- Tomoki Takamoto
- G01 - MEASURING TESTING
Information Patent Grant
Display substrate, manufacturing method thereof, and display device
- Patent number 12,200,986
- Issue date Jan 14, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Bo Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with interface structure
- Patent number 12,181,518
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chun-Huang Yu
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit and semiconductor device
- Patent number 12,174,247
- Issue date Dec 24, 2024
- SK Hynix Inc.
- Tae-Pyeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSV testing
- Patent number 12,163,998
- Issue date Dec 10, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip checker for on-chip safety area
- Patent number 12,164,000
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Alessandro Cannone
- G01 - MEASURING TESTING
Information Patent Grant
Shielded interconnect system
- Patent number 12,167,582
- Issue date Dec 10, 2024
- GITech, Inc.
- John Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, a device and a computer program for operating a modular tes...
- Patent number 12,153,091
- Issue date Nov 26, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Mixed signal test device based on graphical control
- Patent number 12,111,349
- Issue date Oct 8, 2024
- Macrotest Semiconductor Inc.
- Quanren Li
- G01 - MEASURING TESTING
Information Patent Grant
FCM based chiplet test circuit
- Patent number 12,099,086
- Issue date Sep 24, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for carrying chip, and device and method for testing chip
- Patent number 12,092,654
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scan test in a single-wire bus circuit
- Patent number 12,092,689
- Issue date Sep 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods to monitor leakage current
- Patent number 12,085,601
- Issue date Sep 10, 2024
- STMicroelectronics S.r.l.
- Romeo Letor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical device
- Patent number 12,078,687
- Issue date Sep 3, 2024
- AMS-OSRAM INTERNATIONAL GMBH
- Dirk Becker
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration checking apparatus and deterioration checking
- Patent number 12,072,368
- Issue date Aug 27, 2024
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection pad structure for analysis in a semiconductor device
- Patent number 12,072,374
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Jihoon Chang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZING PATH MARGIN MONITORS WITHOUT THE USE OF SCAN CHAINS
- Publication number 20250164550
- Publication date May 22, 2025
- Synopsys, Inc.
- Gulve Rohini Vasant
- G01 - MEASURING TESTING
Information Patent Application
Electronic Component and Method of Operating Such a Component
- Publication number 20250164551
- Publication date May 22, 2025
- TDK-Micronas GmbH
- Thilo Rubehn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER MODULE AND POWER CONVERTER INCLUDING SAME
- Publication number 20250116700
- Publication date Apr 10, 2025
- Mitsubishi Heavy Industries, Ltd.
- Norihito Yanagita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...
- Publication number 20250110172
- Publication date Apr 3, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Chih Hsu
- G01 - MEASURING TESTING
Information Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
- Publication number 20250102559
- Publication date Mar 27, 2025
- ASTI GLOBAL INC., TAIWAN
- CHIEN-SHOU LIAO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME
- Publication number 20250096047
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- YEONGSEON KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUILT-IN SELF TEST WITH CURRENT MEASUREMENT FOR ANALOG CIRCUIT VERI...
- Publication number 20250093409
- Publication date Mar 20, 2025
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Francois LAULANET
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE
- Publication number 20250093410
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Donguk PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH-SILICON VIA (TSV) TESTING
- Publication number 20250093404
- Publication date Mar 20, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTS
- Publication number 20250085341
- Publication date Mar 13, 2025
- Microsoft Technology Licensing, LLC
- Terrence Huat Hin TAN
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION SYSTEM AND METHOD FOR SEMICONDUCTOR CIRCUIT
- Publication number 20250085336
- Publication date Mar 13, 2025
- REALTEK SEMICONDUCTOR CORPORATION
- Li-Lung KAO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
VIA ACCURACY MEASUREMENT
- Publication number 20250079242
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Hsuen Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Minimum Integrated Circuit Operating Voltage Searching Method and M...
- Publication number 20250076369
- Publication date Mar 6, 2025
- MEDIATEK INC.
- Ronald Kuo-Hua Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC TEST METHOD AND IC TEST SYSTEM
- Publication number 20250076370
- Publication date Mar 6, 2025
- Realtek Semiconductor Corp.
- Jian-Xing Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO TEST SYNCHRONOUS DOMAINS DURING STUCK-AT TEST
- Publication number 20250070785
- Publication date Feb 27, 2025
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20250067798
- Publication date Feb 27, 2025
- SK HYNIX INC.
- Tae-Pyeong KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME
- Publication number 20250054817
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Wei-Kuan Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...
- Publication number 20250035701
- Publication date Jan 30, 2025
- SUMSUNG ELECTRONICS CO., LTD.
- Gyosoo CHOO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20250035698
- Publication date Jan 30, 2025
- JCET STATS ChipPAC Korea Limited
- SeungHyeon JEONG
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
- Publication number 20250035700
- Publication date Jan 30, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Hoon Kim
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS
- Publication number 20250027989
- Publication date Jan 23, 2025
- Raytheon Company
- Micky Harris
- G01 - MEASURING TESTING
Information Patent Application
UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...
- Publication number 20250020714
- Publication date Jan 16, 2025
- ROBERT BOSCH GmbH
- Eric Sebastian Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST STRUCTURE FOR MOL RELIABILITY EVALUATION
- Publication number 20250022759
- Publication date Jan 16, 2025
- International Business Machines Corporation
- HUIMEI ZHOU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR
- Publication number 20240426902
- Publication date Dec 26, 2024
- Yiming YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Thermal and Electrical Conductivity Between Metal Contacts
- Publication number 20240410939
- Publication date Dec 12, 2024
- Wolfspeed, Inc.
- Alexander Komposch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING POWER-ON RESET THRESHOLD
- Publication number 20240402241
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Sandor PETENYI
- G01 - MEASURING TESTING
Information Patent Application
Decoupling Cells Testability
- Publication number 20240369619
- Publication date Nov 7, 2024
- MELLANOX TECHNOLOGIES, LTD.
- Ido Bourstein
- G01 - MEASURING TESTING

using dedicated test connectors, test elements or test circuits on the IC under test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Defect detection system for cavity in integrated circuit

Display substrate, manufacturing method thereof, and display device

GaN HEMT device for irradiation damage detection and detection and...

Semiconductor device

Organic light emitting diode display substrate and preparing method...

Benchmark device and method for evaluating a semiconductor wafer

Semiconductor wafer configured for single touch-down testing

Technologies for on-circuit board de-embedding

Test key and semiconductor die including the same

Display panel and test method thereof, display apparatus

Radio frequency performance characterization of multi-carrier broad...

Wafer level methods of testing semiconductor devices using internal...

Semiconductor device

Display substrate, manufacturing method thereof, and display device

Semiconductor device with interface structure

Monitoring circuit and semiconductor device

TSV testing

On-chip checker for on-chip safety area

Shielded interconnect system

Method, a device and a computer program for operating a modular tes...

Interface to full and reduced pin JTAG devices

Module substrate for semiconductor module, semiconductor module and...

Mixed signal test device based on graphical control

FCM based chiplet test circuit

Assembly for carrying chip, and device and method for testing chip

Scan test in a single-wire bus circuit

Systems and methods to monitor leakage current

Electrical device

Deterioration checking apparatus and deterioration checking

Detection pad structure for analysis in a semiconductor device

Patents Applicationslast 30 patents

CHARACTERIZING PATH MARGIN MONITORS WITHOUT THE USE OF SCAN CHAINS

Electronic Component and Method of Operating Such a Component

POWER MODULE AND POWER CONVERTER INCLUDING SAME

SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...

CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...

SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME

BUILT-IN SELF TEST WITH CURRENT MEASUREMENT FOR ANALOG CIRCUIT VERI...

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE

THROUGH-SILICON VIA (TSV) TESTING

SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTS

CORRECTION SYSTEM AND METHOD FOR SEMICONDUCTOR CIRCUIT

VIA ACCURACY MEASUREMENT

Minimum Integrated Circuit Operating Voltage Searching Method and M...

IC TEST METHOD AND IC TEST SYSTEM

METHOD TO TEST SYNCHRONOUS DOMAINS DURING STUCK-AT TEST

MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...

METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST TRAY SYSTEM AND RELATED METHOD

INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS

UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...

TEST STRUCTURE FOR MOL RELIABILITY EVALUATION

ELECTRICAL CONNECTION APPARATUS

SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR

Improved Thermal and Electrical Conductivity Between Metal Contacts

METHOD AND APPARATUS FOR DETECTING POWER-ON RESET THRESHOLD

Decoupling Cells Testability