Number | Date | Country | Kind |
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5-308245 | Dec 1993 | JPX |
Number | Name | Date | Kind |
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5369359 | Schmitt | Nov 1994 |
Entry |
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T. Nakamura et al., "Development of rapid voltage contrast image acquisition technique and its application to LSI fault origin localization", R91-68 CPM 91-135, Mar. 13, 1992, total 8 pages. |
T. C. May et al., "Dynamic Fault Imaging of VLSI Random Logic Devices", 1984 IEEE/IRPS, pp. 95-108 (month unavailable). |