Number | Name | Date | Kind |
---|---|---|---|
3228282 | Barker, Jr. | Jan 1966 | |
3405268 | Brunton | Oct 1968 | |
3455637 | Howard | Jul 1969 | |
3476482 | Howard et al. | Nov 1969 | |
3525863 | Constantine et al. | Aug 1970 | |
3614450 | Hill et al. | Oct 1971 | |
3641349 | Dahlin | Feb 1972 | |
3675019 | Hill et al. | Jul 1972 | |
3793524 | Howarth | Feb 1974 | |
3801349 | Wilson et al. | Apr 1974 | |
3827808 | Cho | Aug 1974 | |
3851175 | Dahlin et al. | Nov 1974 | |
3879607 | Bjorklund | Apr 1975 | |
3965356 | Howarth | Jun 1976 | |
3994602 | Howarth | Nov 1976 | |
4006358 | Howarth | Feb 1977 | |
4098641 | Casey et al. | Jul 1978 | |
4135006 | Readel et al. | Jan 1979 | |
4243882 | Yasujima et al. | Jan 1981 | |
4277177 | Larsen et al. | Jul 1981 | |
4306151 | Chase | Dec 1981 | |
4319847 | Howarth | Mar 1982 | |
4345150 | Tamura et al. | Aug 1982 | |
4743775 | Edgar | May 1988 | |
4769544 | Dahlquist | Sep 1988 | |
4789820 | Parrent, Jr. et al. | Dec 1988 | |
4823008 | Sturm | Apr 1989 | |
4840706 | Campbell | Jun 1989 | |
4928013 | Howarth et al. | May 1990 | |
4957770 | Howarth | Sep 1990 | |
5124552 | Anderson | Jun 1992 |
Number | Date | Country |
---|---|---|
0137696 | Apr 1985 | EPX |
2128273 | Jun 1971 | DEX |
2318032 | Oct 1973 | DEX |
2845995 | Apr 1979 | DEX |
53-39194 | Oct 1978 | JPX |
59-120940 | Jul 1984 | JPX |
61-53549 | Mar 1986 | JPX |
61-120004 | Jun 1986 | JPX |
1102062 | Feb 1968 | GBX |
2044443 | Oct 1980 | GBX |
2127871 | Apr 1984 | GBX |
Entry |
---|
Jon F. Pugh, "The infrared measurement of surface moisture in paper." Tappi, vol. 63, No. 10 (Oct. 1980) pp. 131-134. |
Wesley Wm. Wendlandt and Harry G. Hecht, Reflectance Spectroscopy New York, Interscience Publishers, 1966, pp. 46-90. |
K. Takami and G. Shinbo, Thickness measurement method for thin photoresist film on transparent material, Rev. Sci. Instrum. 54(6), Jun. 1983. |