Certain aspects of the present disclosure generally relate to electronic components and, more particularly, to electrical shielding for a laminate inductor coil.
Computing devices have become increasingly common in modern society. Amongst the more common computing devices are mobile phones. While such devices may initially have started out as simple devices that allowed audio communication through the Public Land Mobile Network (PLMN) to the Public Standard Telephone Network (PSTN), they have evolved into smartphones capable of supporting full multimedia experiences, as well as supporting multiple wireless protocols. Even within the cellular wireless protocols, mobile phone radios have developed into highly complex, multi-band, and multi-standard designs that often have multiple radio frequency (RF) signal chains.
Such devices may include a radio frequency (RF) front-end (RFFE), including a variety of front-end devices, such as power amplifiers (PAs), low-noise amplifiers (LNAs), filters, switches, power management modules, inductors (e.g., laminate coil inductors), tuning circuits, and sensors. These functions may be located either in separate devices or integrated into a single device, depending on the application. The trend in mobile radio communications is towards complex multi-radio systems composed of several parallel transceivers.
Certain aspects of the present disclosure are generally directed to an electronic device. The electronic device generally includes a plurality of metal layers comprising a bottom metal layer; one or more middle metal layers disposed above the bottom metal layer, wherein at least one of the middle layers comprises a coil; and a top metal layer disposed above the one or more middle metal layers, wherein: at least one of the bottom metal layer or the top metal layer comprises a shield layer; and at least a first portion of a first region of the shield layer overlying or underlying the coil comprises one or more metal pieces that are electrically floating and are disconnected from the shield layer.
Certain aspects of the present disclosure are generally directed to a method for fabricating an electronic device having a plurality of metal layers. The method generally includes forming a bottom metal layer; forming one or more middle metal layers disposed above the bottom metal layer, wherein at least one of the middle layers comprises a coil; and forming a top metal layer disposed above the one or more middle metal layers, wherein: at least one of the bottom metal layer or the top metal layer comprises a shield layer; and at least a first portion of a first region of the shield layer overlying or underlying the coil comprises one or more metal pieces that are electrically floating and are disconnected from the shield layer.
So that the manner in which the above-recited features of the present disclosure can be understood in detail, a more particular description, briefly summarized above, may be by reference to aspects, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only certain typical aspects of this disclosure and are therefore not to be considered limiting of its scope, for the description may admit to other equally effective aspects.
Certain aspects of the present disclosure are generally directed to an electronic device, and more specifically to electrical shielding for laminated inductor coils. The electronic device generally includes a coil and at least one shield layer overlying and/or underlying the coil, the shield layer comprising one or more metal pieces that are electrically floating and are disconnected from the shield layer.
The word “exemplary” is used herein to mean “serving as an example, instance, or illustration.” Any aspect described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other aspects.
As used herein, the term “connected with” in the various tenses of the verb “connect” may mean that element A is directly connected to element B or that other elements may be connected between elements A and B (i.e., that element A is indirectly connected with element B). In the case of electrical components, the term “connected with” may also be used herein to mean that a wire, trace, or other electrically conductive material is used to electrically connect elements A and B (and any components electrically connected therebetween).
Certain terminology may also be used in the following description for the purpose of reference only, and thus are not intended to be limiting. For example, terms such as “upper,” “lower,” “above,” “below,” “bottom,” and “top” refer to directions in the drawings to which reference is made. Terms such as “front,” “back,” “rear,” and “side” describe the orientation and/or location of portions of the component within a consistent but arbitrary frame of reference which is made clear by reference to the text and the associated drawings describing the component under discussion. Such terminology may include the words specifically mentioned above, derivatives thereof, and words of similar import.
Wireless devices may include a radio frequency front-end (RFFE), which may include one or more transmit (TX) chains and or one or more receive (RX) chains. In certain cases, RFFEs may include one or more inductors within tuning circuits and/or filters between antennas of the one or more TX chains and one or more RX chains. In certain cases, these inductors may be implemented as laminated coil inductors.
There are several design considerations that may be taken into account when designing these laminate inductor coils, such as quality factor (Q), area occupied, metal density, potential coupling with adjacent structures, disruption to ground (GND) scheme, etc. A conventional laminate inductor coil design typically covers the inductor coil(s) on the top and bottom with solid metal shielding layers to avoid coupling and GND disruption. However, such shielding metal layer designs typically degrade the Q associated with the inductor coil. The Q is a dimensionless number based on the bandwidth of a resonator circuit with the inductor coil, relative to its center frequency, and typically indicates performance of the inductor coil in the resonator circuit.
Therefore, aspects of the present disclosure provide techniques for improving the Q associated with laminate inductor coils while balancing the desire to reduce coupling, GND disruption, and metal density of the shielding layer. For example, in some cases, techniques presented herein involve creating a large-area cutout region in the metal shielding layer on top of and/or below the laminate coil. Electrically isolated/floating metal plates (or pieces with other shapes) may then be arranged in the cutout region of the metal shielding layer. These floating metal pieces greatly enhance the laminate coil Q while reducing the metal density and preventing magnetic field coupling with surrounding structures.
Additionally, as illustrated, the electronic device 200 may include a top metal layer 208 disposed above the one or more middle metal layers 204. In some cases, at least one of the bottom metal layer 202 or the top metal layer 208 comprises a shield layer. For ease of understanding, references to “the shield layer” herein may refer to the top metal layer 208 or the bottom metal layer 202.
According to aspects, as illustrated, at least a first portion of a first region 210 of the shield layer (e.g., top metal layer 208) overlying or underlying the coil 206 may comprise one or more metal pieces 212 (also, referred to as metal plates) that are electrically floating and are disconnected from the shield layer, forming a grid pattern above or below the coil 206. For example, as illustrated, the one or more metal pieces 212 are separated by a space 214 and not connected to the shield layer. The term “electrically floating” is intended to mean that the one or more metal pieces 212, as illustrated, are separated from (e.g., by space 214) and not electrically connected to electrical ground or another power rail, whereas the shielding layer may be connected to ground. In other words, the one or more metal pieces 212 are electrically isolated from the shielding layer and are not connected to ground.
It should be noted that the techniques described above with respect to the top metal layer 208 may also be applicable to the bottom metal layer 202. In other words, the bottom metal layer 202 may additionally or alternatively comprise a similar shield layer as the top metal layer 208. For example, in some cases, the top metal layer 208 comprises a first shield layer, and the bottom metal layer 202 comprises a second shield layer. Accordingly, in some cases, the first shield layer comprises a region of the first shield layer overlying the coil 206, and the second shield layer comprises a region of the second shield layer underlying the coil. Further, at least one of the region of the first shield layer or the region of the second shield layer comprises one or more metal pieces (e.g., metal pieces 212) that are electrically floating and are disconnected from at least one of the first shield layer or the second shield layer.
Additionally, in some cases, the one or more middle metal layers 204 may comprise another coil (not illustrated). At least a portion of a second region of the shield layer overlying or underlying the other coil comprises one or more additional metal pieces that, in some cases, are electrically floating and are disconnected from the shield layer.
According to aspects, by having the one or more metal pieces 212 electrically floating and not connected to the shielding layer or ground, the Q associated with the coil 206 may be greatly enhanced, while reducing the metal density and preventing a magnetic field produced by the coil 206 from coupling with surrounding structures. For example, by using a shielding layer with electrically floating metal pieces, the Q of the coil 206 is, in some cases, able to achieve approximately a 50% higher Q in the 600 MHz to 1000 MHz frequency range as compared to the design of the conventional metal shielding layer 100B. Additionally, the shielding layer with electrical floating metal pieces is able to improve dissipative loss (e.g., by about 0.12 dB) and TX/RX locus size.
In some cases, however, isolation may be degraded slightly (e.g., by about 6 dB) due to disruption to the ground scheme. Thus,
The operations 400 begin, at block 402, with the semiconductor manufacturing/processing facility forming a bottom metal layer (e.g., bottom metal layer 202).
At block 404, the semiconductor manufacturing/processing facility forms one or more middle metal layers (e.g., middle metal layers 204) disposed above the bottom metal layer. At least one of the middle layers comprises a coil (e.g., coil 206). In some cases, the coil comprises an antenna coil for communication.
At block 406, the semiconductor manufacturing/processing facility forms a top metal layer (e.g., top metal layer 208) disposed above the one or more middle metal layers. In this case, at least one of the bottom metal layer or the top metal layer comprises a shield layer, and at least a first portion (e.g., first portion 302) of a first region (e.g., first region 210) of the shield layer overlying or underlying the coil comprises one or more metal pieces (e.g., metal pieces 212) that are electrically floating and are disconnected from the shield layer. In some cases, the one or more metal pieces comprise one or more metal plates.
In some cases, the semiconductor manufacturing/processing facility forms the shield layer such that the one or more metal pieces form a grid pattern above or below the coil.
In some cases, the semiconductor manufacturing/processing facility forms the shield layer such that at least a second portion (e.g., second portion 304) of the first region of the shield layer overlying or underlying the coil is coupled to the shield layer. In some cases, the semiconductor manufacturing/processing facility forms the shield layer such that the at least the second portion is coupled to a reference potential node for the electronic device. In some cases, the semiconductor manufacturing/processing facility forms the shield layer such that the at least the second portion is located adjacent to a solder bump (e.g., solder bump 306) corresponding to a ground pin.
In some cases, the semiconductor manufacturing/processing facility forms the one or more middle metal layers such that the one or more middle layers comprise another coil. Additionally, in some cases, the semiconductor manufacturing/processing facility forms the shield layer such that at least a portion of a second region of the shield layer overlying or underlying the other coil comprises one or more additional metal pieces. Further, in some cases, the semiconductor manufacturing/processing facility forms the shield layer such that one or more additional metal pieces are electrically floating and are disconnected from the shield layer. Further, in some cases, the semiconductor manufacturing/processing facility forms the shield layer such that the one or more additional metal pieces are coupled to the shield layer. Further, in some cases, the semiconductor manufacturing/processing facility forms the shield layer such that each of the one or more additional metal pieces comprises a first metal plate (e.g., first metal plate 310a) coupled to the shield layer by a first metal trace (e.g., first metal trace 312a). Further, in some cases, the semiconductor manufacturing/processing facility forms the shield layer such that each of the one or more additional metal pieces further comprises a second metal plate (e.g., second metal plate 310b) coupled to the first metal plate by a second metal trace (e.g., second metal trace 312b).
In some cases, the semiconductor manufacturing/processing facility forms the top metal layer (e.g., top metal layer 208) such that the top metal layer comprises a first shield layer, the first shield layer comprising a region of the first shield layer overlying the coil (e.g., coil 206). In some cases, the semiconductor manufacturing/processing facility forms the bottom metal layer (e.g., bottom metal layer 202) such that the bottom metal layer comprises a second shield layer comprising a region of the second shield layer underlying the coil. Further, in some cases, the semiconductor manufacturing/processing facility forms the top metal layer and/or the bottom metal layer such that at least one of the region of the first shield layer or the region of the second shield layer comprises one or more metal pieces that are electrically floating and are disconnected from at least one of the first shield layer or the second shield layer, for example, as illustrated in
Within the present disclosure, the word “exemplary” is used to mean “serving as an example, instance, or illustration.” Any implementation or aspect described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other aspects of the disclosure. Likewise, the term “aspects” does not require that all aspects of the disclosure include the discussed feature, advantage, or mode of operation. The term “coupled” is used herein to refer to the direct or indirect coupling between two objects. For example, if object A physically touches object B and object B touches object C, then objects A and C may still be considered coupled to one another—even if objects A and C do not directly physically touch each other. For instance, a first object may be coupled to a second object even though the first object is never directly physically in contact with the second object. The terms “circuit” and “circuitry” are used broadly and intended to include both hardware implementations of electrical devices and conductors that, when connected and configured, enable the performance of the functions described in the present disclosure, without limitation as to the type of electronic circuits.
The apparatus and methods described in the detailed description are illustrated in the accompanying drawings by various blocks, modules, components, circuits, steps, processes, algorithms, etc. (collectively referred to as “elements”). These elements may be implemented using hardware, for example.
One or more of the components, steps, features, and/or functions illustrated herein may be rearranged and/or combined into a single component, step, feature, or function or embodied in several components, steps, or functions. Additional elements, components, steps, and/or functions may also be added without departing from features disclosed herein. The apparatus, devices, and/or components illustrated herein may be configured to perform one or more of the methods, features, or steps described herein.
It is to be understood that the specific order or hierarchy of steps in the methods disclosed is an illustration of exemplary processes. Based upon design preferences, it is understood that the specific order or hierarchy of steps in the methods may be rearranged. The accompanying method claims present elements of the various steps in a sample order, and are not meant to be limited to the specific order or hierarchy presented unless specifically recited therein.
The previous description is provided to enable any person skilled in the art to practice the various aspects described herein. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects. Thus, the claims are not intended to be limited to the aspects shown herein, but are to be accorded the full scope consistent with the language of the claims, wherein reference to an element in the singular is not intended to mean “one and only one” unless specifically so stated, but rather “one or more.” Unless specifically stated otherwise, the term “some” refers to one or more. A phrase referring to “at least one of” a list of items refers to any combination of those items, including single members. As an example, “at least one of: a, b, or c” is intended to cover at least: a, b, c, a-b, a-c, b-c, and a-b-c, as well as any combination with multiples of the same element (e.g., a-a, a-a-a, a-a-b, a-a-c, a-b-b, a-c-c, b-b, b-b-b, b-b-c, c-c, and c-c-c or any other ordering of a, b, and c). All structural and functional equivalents to the elements of the various aspects described throughout this disclosure that are known or later come to be known to those of ordinary skill in the art are expressly incorporated herein by reference and are intended to be encompassed by the claims. Moreover, nothing disclosed herein is intended to be dedicated to the public regardless of whether such disclosure is explicitly recited in the claims. No claim element is to be construed under the provisions of 35 U.S.C. § 112(f) unless the element is expressly recited using the phrase “means for” or, in the case of a method claim, the element is recited using the phrase “step for.”