This application claims priority to Japanese Patent Application No. JP2017-160008, filed Aug. 23, 2017, which is incorporated herein by reference.
The present technology relates to a socket for mounting a BGA (ball grid array) semiconductor device, a CSP (chip-scale package) semiconductor device, an LGA (land grid array) semiconductor device, or another semiconductor device and relates particularly to a structure for mounting a socket to a circuit board.
A socket is widely used as an interface for electrically connecting a semiconductor device and a circuit board or the like. For example, as illustrated in
In performing a test such as a burn-in of the semiconductor device, first, the socket is mounted on the circuit board, and next, the semiconductor device is mounted in the socket.
Because the socket 10B is soldered to the circuit board 90, there is a problem where replacement is time-consuming when the socket 10B fails. As a countermeasure to this, there is a method of using a socket of a surface-mounted type using a probe pin, but this type of socket is expensive compared to a soldered type. Moreover, as illustrated in
The present technology has as an object to solve these conventional problems and provide a surface-mountable socket provided with a wiping function.
A socket of the present technology can be surface-mounted to a board and has a plurality of contacts configured from a conductive material, each contact including a contact portion that can contact a terminal of a semiconductor device, a locking portion connected to the contact portion, and a board-side contact portion that extends from the locking portion and can contact a conductive region formed on a board surface; a holding member that holds the locking portion of the plurality of contacts; and a guide member that is disposed so as to oppose the holding member and is formed with a plurality of through holes into which the board-side contact portion of the contact, which protrudes from the holding member, is inserted, the guide member being able to move in a direction heading toward or away from the holding member.
In a certain embodiment, the board-side contact portion moves in an axial direction and a direction perpendicular to the axial direction when a force is received in the axial direction. In a certain embodiment, the board-side contact portion rotates and moves. In a certain embodiment, the board-side contact portion includes an elastically deforming portion connected to the locking portion and a curved portion connected to the elastically deforming portion. In a certain embodiment, the board-side contact portion rotates and moves with the elastically deforming portion as a fulcrum. In a certain embodiment, the board-side contact portion is larger than a diameter of a through hole of the board. In a certain embodiment, a centre of the board-side contact portion is offset from a centre of the through hole of the board. In a certain embodiment, a curvature radius of the board-side contact portion is greater than a radius of the through hole of the board. In a certain embodiment, the board-side contact portion includes a portion with a relatively narrow width. In a certain embodiment, a material equally soft as or softer than a material plating a through hole of the board or the board surface of the through hole is selected as a material plating a surface of the board-side contact portion. In a certain embodiment, the board-side contact portion is Ag plating, and the through hole of the board is Au plating. In a certain embodiment, the socket further includes a spring means of biasing the guide member in the direction heading away from the holding member.
A mounting device of the present technology includes the socket of any one of the above configurations and a board whereto the socket is surface-mounted. In a certain embodiment, the mounting device is a device for testing. In a certain embodiment, the board-side contact portion makes multiple contact with an edge portion of the through hole of the board.
The present technology can provide a socket of a surface-mounted type to an existing through-hole-type board. Because a component configuration substantially identical to that of an existing through-hole-type socket is had, it is less expensive than a surface-mounted socket of a probe-pin type. Moreover, by offsetting a board-side contact portion from a through hole of the board and moving the board-side contact portion in a horizontal direction, the board-side contact portion can perform wiping with an edge portion of the through hole and contact failure due to foreign matter or the like can be prevented.
So that those having ordinary skill in the art to which the disclosed system appertains will more readily understand how to make and use the same, reference may be had to the following drawings.
A preferred embodiment of the present technology is described in detail below with reference to the drawings.
Configurations and operations of the cover member 140, the latch member 150, the link member 160, and the floating/adapter member 170 of the socket are disclosed in patent literatures 1 and 2 and the like, and detailed description thereof is omitted. Moreover, it is sufficient for the socket of the present example to have a configuration that can mount a BGA semiconductor device or another semiconductor device, and the cover member 140, the latch member 150, the link member 160, and the floating/adapter member 170 do not necessarily need to be provided.
As illustrated in this diagram, in the socket 100 of the present example, included as the interface structure for enabling surface-mounting to the board are the plurality of contacts 110; the stopper member 120, which is installed in a central opening of the base member 130; and a lead-guide member 180, which is installed below the stopper member 120.
In
The contact 110 further includes an elastically deforming portion 114 that is connected to the contact portion 112 and bent to a roughly U-shaped side. By the elastically deforming portion 114 flexing, a certain contact pressure is imparted between the contact portion 112 and the terminal of the semiconductor device. The contact 110 further includes a locking portion 116 that extends in the axial direction from the elastically deforming portion 114. The locking portion 116 is fixed by the stopper member 120, which is described below. In one example, the locking portion 116 includes a wide portion with a wide width and further includes a bent portion 116A that is bent substantially at a right angle from the wide portion and a wide section 116B that extends downward from the bent portion 116A.
Further connected to the locking portion 116 is a board-side contact 118 that contacts a conductive region such as an electrode on a board side. The board-side contact 118 includes a protruding portion 118A that protrudes somewhat from the axial direction, an elastically deforming portion 118B that protrudes in an opposite direction of the protruding portion 118A and is bent in roughly a V shape, and a board-side contact portion 118C that is connected to the elastically deforming portion 118 and contacts the board. The board-side contact portion 118C includes an extended portion 118C1 that extends in substantially the same axial direction as the locking portion 116, and the extended portion 118C1 has a shape of being bent substantially 180 degrees. When a load is applied in a direction of compressing the board-side contact portion 118C, the board-side contact portion 118C rotates and moves with a bend portion f of the elastically deforming portion 118 as a fulcrum.
The base 130 is formed with the plurality of spaces partitioned by the plurality of walls to align and hold the plurality of contacts 110; the stopper member 120 is installed from a bottom-portion side of the base member 130 so this space is closed.
The main body portion 122 has a plurality of elongated grooves 126 formed in a two-dimensional manner. A width of the elongated groove 126 in a transverse direction is only somewhat greater than a width of the contact 110, and movement of the contact 110 in the transverse direction is regulated by this width in the transverse direction. Moreover, a plurality of locking grooves 128 is formed along the plurality of elongated grooves 126; when a plurality of board-side contacts 118 is inserted into the elongated groove 126, the wide section 116B of the locking portion 116 is locked in the locking groove 128. In this example, four or five contacts are aligned in one elongated groove 126, and as such, four or five locking grooves 128 are formed along one elongated groove 126.
A depth at which the elongated groove 126 penetrates the main body portion 122 is constant, and this depth is roughly equal to a length, in the axial direction, of the elastically deforming portion 118B of the board-side contact 118. Because of this, the board-side contact portion 118C of the board-side contact 118 protrudes from a bottom face of the stopper member 120.
The guide member 180 is installed to the base member 130 so as to oppose the stopper member 120.
In the main body portion 181 of the guide member 180, a plurality of through holes 184 is formed in a position aligned with the elongated groove 126 of the stopper member 120. In one example, as illustrated in
As illustrated in (D) in
Next, an operation when installing the socket of the present example to the board is described. First, with a location pin 200 protruding from a corner of a bottom face of the base member 130 as a guide, the pin 200 is inserted into a positioning hole of the board 210 and the socket 100 is installed on the board 210. (A) in
In a process of pressing the socket 100 to the board 210, the board-side contact portion 118C of the board-side contact 118 contacts the conductive region of the board surface while wiping the conductive region. (A) in
Next, when the socket 100 is pressed toward the board 210, the guide member 180 moves against an elasticity of the spring coil 136 in the direction heading toward the base member 130. At the same time, because the board-side contact portion 118C receives a force in the axial direction from the board surface and receives a force in a direction inclined from the axial direction from an edge of the through hole due to being offset, the board-side contact portion 118C rotates and moves around the fulcrum f of the elastically deforming portion 118B so as to slide on the board surface, and by this movement in a horizontal direction, the board-side contact portion 118C performs a wiping operation with an edge portion WP of the through hole 214 (see (B) in
By being provided with the following characteristics, the socket of the present example can prevent a problem of contact failure due to foreign matter, which is a conventional problem.
Next, a second example of the present technology is described. In the second example, a surface of the board-side contact portion 118C is plated with the same material with which the inner wall of the through hole 214 and/or the surface of the board 210 is plated (see the plating 212 in (B) in
Note that the board mounted with the socket may be a board of a single-layer wiring structure or a board of a multilayer wiring structure. Moreover, a shape and a material of the conductive region formed into the through hole of the board is not particularly limited; in short, a configuration is sufficient where the board-side contact portion 118C can electrically connect to the conductive region at the same time as contacting the through hole of the board.
Furthermore, the semiconductor device mounted to the socket is not particularly limited. In the examples above, it is a BGA package formed with solder balls, but it may be a semiconductor package (semiconductor device) for surface mounting other than this. Moreover, a shape of the terminal is not limited to being spherical, and the terminal may be a bump that is semicircular, conical, rectangular, or the like.
While detailed above is a preferred embodiment of the present technology, the present technology is not limited to a specific embodiment of the present technology and can be modified or changed in various ways within the scope of the gist of the present technology as given in the claims.
Number | Date | Country | Kind |
---|---|---|---|
2017-160008 | Aug 2017 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
4080027 | Benasutti | Mar 1978 | A |
5118311 | Margini | Jun 1992 | A |
5277607 | Thumma et al. | Jan 1994 | A |
5308249 | Renn et al. | May 1994 | A |
5387134 | Bryce et al. | Feb 1995 | A |
5427553 | Tsuji | Jun 1995 | A |
5443394 | Billman et al. | Aug 1995 | A |
5676559 | Laub et al. | Oct 1997 | A |
5800186 | Ramirez et al. | Sep 1998 | A |
6666691 | Ikeya | Dec 2003 | B2 |
6743034 | Shimada | Jun 2004 | B2 |
6790065 | Fukunaga | Sep 2004 | B2 |
6848928 | Ikeya et al. | Feb 2005 | B2 |
7021954 | Gattuso et al. | Apr 2006 | B2 |
7200930 | Khandros | Apr 2007 | B2 |
7288005 | Nagahashi | Oct 2007 | B2 |
7410382 | Wu | Aug 2008 | B2 |
7462056 | Yeh | Dec 2008 | B2 |
7651366 | Ringler et al. | Jan 2010 | B2 |
7666016 | Kobayashi | Feb 2010 | B2 |
7887355 | Watanabe | Feb 2011 | B2 |
7956631 | Chen | Jun 2011 | B2 |
7976326 | Stoner | Jul 2011 | B2 |
8197290 | Koyama | Jun 2012 | B2 |
8272882 | Sakai | Sep 2012 | B2 |
8385080 | Kim et al. | Feb 2013 | B2 |
8388365 | Takahashi et al. | Mar 2013 | B2 |
8535079 | Wang et al. | Sep 2013 | B2 |
8840406 | Hirata | Sep 2014 | B2 |
9368893 | Koyama | Jun 2016 | B2 |
9692156 | Matsumoto | Jun 2017 | B2 |
9761980 | Zeng | Sep 2017 | B2 |
9979150 | Hwang | May 2018 | B2 |
10079443 | Costello | Sep 2018 | B2 |
20020155735 | Zhou et al. | Oct 2002 | A1 |
20020182919 | Watanabe | Dec 2002 | A1 |
20070249207 | Yeh et al. | Oct 2007 | A1 |
20110201221 | Kobayashi | Aug 2011 | A1 |
20180115101 | Oda | Apr 2018 | A1 |
20180287279 | Taguchi | Oct 2018 | A1 |
Number | Date | Country |
---|---|---|
101627508 | Jan 2010 | CN |
102593675 | Jul 2012 | CN |
202601895 | Dec 2012 | CN |
203312562 | Nov 2013 | CN |
2530791 | Dec 2012 | EP |
2000173699 | Jun 2000 | JP |
200110532 | Apr 2001 | JP |
2002298998 | Oct 2002 | JP |
3737078 | Jan 2006 | JP |
2007317623 | Dec 2007 | JP |
4173155 | Oct 2008 | JP |
2013-113753 | Jun 2013 | JP |
5253016 | Jul 2013 | JP |
Entry |
---|
Search Report from related United Kingdom Application No. GB1813689.5 dated Jan. 15, 2019. |
Number | Date | Country | |
---|---|---|---|
20190064214 A1 | Feb 2019 | US |