Specimen analysis apparatus and specimen analysis method

Abstract

A specimen analysis method, comprising: bringing a first specimen vessel to a sucking position for sucking specimens; obtaining a first measurement result of a first specimen contained in the first specimen vessel; bringing a second specimen vessel to the sucking position before the first measurement result is obtained; obtaining a second measurement result of a second specimen contained in the second specimen vessel; bringing a third specimen vessel to the sucking position after the first measurement result is obtained; obtaining a third measurement result of a third specimen contained in the third specimen vessel; and obtaining a fourth measurement result of the second specimen when the first measurement result is higher than a threshold, the second specimen being sucked at the sucking position again for obtaining the fourth measurement result before bringing the third specimen vessel to the sucking position, is disclosed. A specimen analysis is also disclosed.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective depiction view of a urine analysis apparatus, an embodiment of a specimen analysis apparatus of the present invention.

FIG. 2 is a block diagram indicating a hardware configuration of the computer indicated in FIG. 1.

FIG. 3 is a diagram of a schematic function configuration of the sample preparation section and the optical detection section of the urine analysis apparatus.

FIG. 4 is a diagram indicating a configuration of the optical detection section.

FIG. 5 is a block diagram indicating the whole configuration of the urine analysis apparatus indicated in FIG. 1.

FIG. 6 is a perspective depiction view of the quantitative mechanism and sample preparation section of the urine analysis apparatus.

FIG. 7 is a depiction view of the quantitative mechanism and sample preparation section of the urine analysis apparatus.

FIG. 8 is a flow chart indicating the analysis procedure of urine using the urine analysis apparatus indicated in FIG. 1.

FIG. 9 is a flow chart (first half flow) indicating the procedure of the specimen processing operation indicated in FIG. 8.

FIG. 10 is a flow chart (latter half flow) indicating the procedure of the specimen processing operation indicated in FIG. 8.

FIG. 11 is a diagram indicating a time chart example of the normal processing operation of a urine analysis apparatus that carries out two kinds of measurements (measurements of concrete components in urine and bacteria).

FIG. 12 is a diagram indicating a time chart example of the processing operation of a urine analysis apparatus in the case where there is a urine specimen containing therein a high concentration bacterium.

FIG. 13 is a diagram indicating a time chart example of the normal processing operation of a urine analysis apparatus that measures bacteria in urine.

FIG. 14 is a diagram indicating a time chart example of the processing operation of a urine analysis apparatus in the case where there is a urine specimen containing therein a high concentration bacterium.

FIG. 15 is a diagram indicating an example of an output screen outputting analysis results.

FIG. 16 is a perspective view indicating the whole construction of an immune aggregation measurement apparatus according to another embodiment of the present invention.

FIG. 17 is a front view of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 18 is a plan view indicating the inner configuration of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 19 is an enlarged perspective view of the specimen holder section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 20 is a diagram indicating an aggregation reaction of antibodies bonding to antigens and latex particles.

FIG. 21 is a scheme of the optical detection section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 22 is a diagram indicating a measurement registration screen displayed on a display section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 23 is a diagram indicating a progress status screen (specimen progress status confirmation screen) displayed on a display section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 24 is a diagram indicating a progress status screen (rack usage status confirmation screen) displayed on a display section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 25 is a graph in which a calibration curve is drawn that indicates the relationship between the concentration and the degree of aggregation of a carburetor used in the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 26 is a block diagram of the control section of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 27 is a flow chart indicating the measurement process of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

FIG. 28 is a graph indicating the relationship between the degree of aggregation and concentration of the T1 and T2 measurement results.

FIG. 29 is a diagram indicating a detail information screen displayed on the display of the immune aggregation measurement apparatus according to the embodiment indicated in FIG. 16.

Claims

1. A specimen analysis apparatus for analyzing a component contained in a specimen, comprising: a specimen suction section for sucking a specimen from a specimen vessel placed on a specimen vessel placing section;a sample preparation section for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent;a measurement section for measuring a component in the measurement sample;a first control means for controlling operations of the specimen suction section, the sample preparation section and the measurement section to implement processing of a first specimen;a second control means for controlling operations of the specimen suction section, the sample preparation section and the measurement section to initiate processing of a second specimen different from the first specimen during the implementation of the processing of the first specimen by the first control means;a judge means for judging whether a measurement result of the first specimen exceeds a threshold; anda third control means for controlling operations of the specimen suction section, the sample preparation section and the measurement section to implement the reprocessing of the second specimen when the judge means judges that the measurement result of the first specimen exceeds the threshold.

2. The specimen analysis apparatus according to claim 1, wherein the sample preparation section comprises: a first sample preparation section for preparing a first measurement sample by mixing a specimen with a first reagent; anda second sample preparation section for preparing a second measurement sample by mixing a specimen with a second reagent,the first control means comprises: a first measurement implementation means for causing the measurement section to implement a first measurement measuring a first component in the first measurement sample; anda second measurement implementation means for causing the measurement section to implement a second measurement measuring a second component in the second measurement sample after measurement of the first component,the judge means comprises: a first judge means for judging whether a first measurement result of the first measurement of the first specimen exceeds a first threshold; anda second judge means for judging whether a second measurement result of the second measurement of the first specimen exceeds a second threshold, andthe third control means is configured so as to implement the reprocessing of the second specimen when the first judge means judges that the first measurement result of the first specimen exceeds the first threshold or when the second judge means judges that the second measurement result of the first specimen exceeds the second threshold.

3. The specimen analysis apparatus according to claim 2, wherein the third control unit is configured so as to implement preparation of the first measurement sample of the second specimen by the first sample preparation section and measurement of the first component in the first measurement sample of the second specimen by the measurement section when the first judge means judges that the first measurement result of the first specimen exceeds the first threshold.

4. The specimen analysis apparatus according to claim 1, wherein the component measured by the measurement section comprises a particle.

5. The specimen analysis apparatus according to claim 4, wherein the specimen is a urine specimen, and the measurement section is configured so as to be capable of measuring a bacterium or crystal in the urine specimen.

6. The specimen analysis apparatus according to claim 1, further comprising: a specimen vessel placing section on which a plurality of specimen vessels are capable of being placed; anda cleaning section for cleaning a specimen passage channel through which a specimen passes.

7. The specimen analysis apparatus according to claim 6, wherein the specimen vessel placing section comprises a transport mechanism for transporting the specimen vessels to the specimen suction section.

8. The specimen analysis apparatus according to claim 7, wherein the transport mechanism is configured so as to be capable of retreating the specimen vessels to the specimen suction section.

9. The specimen analysis apparatus according to claim 8, wherein the third control means is configured so as to control the transport mechanism to retreat at least one of the specimen vessels when the judge means judges that the measurement result of the first specimen exceeds the threshold.

10. A specimen analysis apparatus for analyzing a component contained in a specimen, comprising: a specimen suction section for sucking a specimen from a specimen vessel placed on a specimen vessel placing section;a sample preparation section for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent;a measurement section for measuring a component in the measurement sample;a display;a first control means for controlling operations of the specimen suction section, the sample preparation section and the measurement section to implement processing of a first specimen;a second control means for controlling operations of the specimen suction section, the sample preparation section and the measurement section to initiate processing of a second specimen different from the first specimen during the implementation of the processing of the first specimen by the first control means;a judge means for judging whether a measurement result of the first specimen exceeds a threshold; anda display control means for controlling the display so as to display notice for remeasurement of the second specimen when the judge means judges that the measurement result of the first specimen exceeds the threshold.

11. The specimen analysis apparatus according to claim 10, further comprising: a distribution section for distributing a specimen to a first aliquot and a second aliquot, wherein the sample preparation section comprises: a first sample preparation section for preparing a first measurement sample by mixing the first aliquot with a first reagent; anda second sample preparation section for preparing a second measurement sample by mixing the second aliquot with a second reagent,the first control means comprises: a first measurement implementation means for causing the measurement section to implement a first measurement measuring a first component in the first measurement sample; anda second measurement implementation means for causing the measurement section to implement a second measurement of measuring a second component in the second measurement sample after measurement of the first component,the judge means comprising: a first judge means for judging whether a first measurement result of the first measurement of the first specimen exceeds a first threshold; anda second judge means for judging whether a second measurement result of the second measurement of the first specimen exceeds a second threshold, andthe display control means controls the display so as to display the notice for remeasurement of the second specimen when the first judge means judges that the first measurement result of the first specimen exceeds the first threshold or when the second judge means judges that the second measurement result of the first specimen exceeds the second threshold.

12. The specimen analysis apparatus according to claim 11, wherein the display control means controls the display so as to display a notice for re-implementation of the first or second measurements using the second specimen when the first judge means judges that the first measurement result of the first specimen exceeds the first threshold or when the second judge means judges that the second measurement result of the first specimen exceeds the second threshold.

13. The specimen analysis apparatus according to claim 12, wherein the display control means controls the display so as to display the notice for re-implementation of the first measurement of the second specimen when the first judge means judges that the first measurement result of the first specimen exceeds the first threshold.

14. A specimen analysis apparatus for analyzing a component contained in a specimen, comprising: a specimen vessel placing section on which a plurality of specimen vessels are capable of being placed;a specimen suction section for sucking a specimen from a specimen vessel placed on the specimen vessel placing section;a sample preparation section for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent;a measurement section for measuring a component in the measurement sample;a cleaning section for cleaning a specimen passage channel through which a specimen passes; anda controller for controlling operations of the specimen suction section, the sample preparation section and the measurement section to implement processing of the specimen, the processing comprising suction of a specimen, preparation of a measurement sample and measurement of a component in the measurement sample, wherein the controller is configured so as to initiate processing of a next specimen during processing of a previous specimen and, when measurement result of the previous specimen exceeds a threshold, implement reprocessing of the next specimen.

15. A specimen analysis apparatus for analyzing a component contained in a specimen, comprising: a specimen vessel placing section on which a plurality of specimen vessels are capable of being placed;a specimen suction section for sucking a specimen from a specimen vessel placed on the specimen vessel placing section;a sample preparation section for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent;a measurement section for measuring a component in the measurement sample;a cleaning section for cleaning a specimen passage channel through which a specimen passes;a display; anda controller for controlling operations of the specimen suction section, the sample preparation section and the measurement section to implement processing of the specimen, the processing comprising suction of a specimen, preparation of a measurement sample and measurement of a component in the measurement sample, wherein the control section is configured so as to initiate processing of a next specimen during processing of a previous specimen and, when measurement result of the previous specimen exceeds a threshold, control the display so as to display notice for reprocessing of the next specimen.

16. A specimen analysis method, comprising: bringing a first specimen vessel to a sucking position for sucking specimens;obtaining a first measurement result of a first specimen contained in the first specimen vessel;bringing a second specimen vessel to the sucking position before the first measurement result is obtained;obtaining a second measurement result of a second specimen contained in the second specimen vessel;bringing a third specimen vessel to the sucking position after the first measurement result is obtained;obtaining a third measurement result of a third specimen contained in the third specimen vessel; andobtaining a fourth measurement result of the second specimen when the first measurement result is higher than a threshold, the second specimen being sucked at the sucking position again for obtaining the fourth measurement result before bringing the third specimen vessel to the sucking position.

17. The specimen analysis method according to claim 16, further comprising: cleaning a specimen passage channel through which a specimen passes before obtaining the fourth measurement result when the first measurement result is higher than the threshold.

18. The specimen analysis method according to claim 16, wherein the first, second, and third specimen vessels are held in a specimen rack and brought to the sucking position one by one.

19. The specimen analysis method according to claim 16, further comprising: notifying lack of accuracy of the second measurement result when the first measurement result is higher than a threshold.

20. The specimen analysis method according to claim 16, wherein the third specimen vessel is brought to the sucking position before the second measurement result is obtained.