Number | Name | Date | Kind |
---|---|---|---|
4597708 | Wheeler et al. | Jul 1986 | |
4636128 | Millis et al. | Jan 1987 | |
4643629 | Takahashi et al. | Feb 1987 | |
4768640 | Sticht | Sep 1988 | |
4776744 | Stonestreet et al. | Oct 1988 | |
4786816 | Ohmori et al. | Nov 1988 | |
4790709 | Sakimori et al. | Dec 1988 | |
4803373 | Imamura et al. | Feb 1989 | |
4859137 | Bonora et al. | Aug 1989 | |
4875825 | Tullis et al. | Oct 1989 | |
4895486 | Baker et al. | Jan 1990 | |
5003188 | Igari | Mar 1991 | |
5110248 | Asano et al. | May 1992 | |
5181819 | Sakata et al. | Jan 1993 | |
5186594 | Toshima et al. | Feb 1993 | |
5219464 | Yamaga et al. | Jun 1993 | |
5382806 | Bacchi et al. | Jan 1995 |
Number | Date | Country |
---|---|---|
63-72137 | Apr 1988 | JPX |
2178948 | Jul 1990 | JPX |
4189483 | Jul 1992 | JPX |
5090384 | Apr 1993 | JPX |
Entry |
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IBM Technical Disclosure Bulletin, vol. 31 No. 10, Mar. 1989 Dual Microscope Semiconductor Wafer Inspection Machine. |