Claims
- 1. A process for the preparation of a sputtering target which comprises sub-stoichiometric titanium dioxide, TiOx, where x is below 2 having an electrical resistivity of less than 0.5 ohm.cm, optionally together with niobium oxide, which process comprises plasma spraying titanium dioxide, TiO2, optionally together with niobium oxide, onto a target base in an atmosphere which is oxygen deficient and which does not contain oxygen-containing compounds, the target base being coated with TiOX which is solidified by cooling under conditions which prevent the sub-stoichiometric titanium dioxide from combining with oxygen.
- 2. A process as claimed in claim 1 wherein the target base is water cooled during the plasma spraying.
- 3. A process as claimed in claim 1 or claim 2 wherein the plasma spraying is carried out using argon as the plasma gas and hydrogen as the secondary plasma gas.
- 4. A process as claimed in any one of the preceding claims wherein the target base is titanium, stainless steel, aluminium or copper.
- 5. A process as claimed in claim 4 wherein the target base is a rotatable target or a flat magnetron target.
- 6. A process as claimed in any one of the preceding claims wherein the titanium dioxide which is plasma sprayed has particle size in the range of from 1 to 60 micrometres.
- 7. A process as claimed in any one of the preceding claims wherein the titanium dioxide is plasma sprayed together with Nb2O3.
- 8. A process as claimed in any one of the preceding claims wherein the sub-stoichiometric titanium dioxide, TiOx, has a value of x in the range of from 1.55 to 1.95.
- 9. A process as claimed in any one of the preceding claims wherein the sputtering target has an electrical resistivity of about 0.02 ohm.cm.
- 10. A sputtering target comprising sub-stoichiometric titanium dioxide whenever prepared by a process as claimed in any one of the preceding claims.
- 11. A sputtering target as claimed in claim 10 which has an electrical resistivity of about 0.02 ohm.cm.
- 12. A process for the preparation of sub-stoichiometric titanium dioxide, TiOx, where x is below 2 having an electrical resistivity of less than 0.1 ohm.cm which process comprises subjecting titanium dioxide to a plasma treatment in an atmosphere which is oxygen deficient and which does not contain any oxygen-containing compounds.
- 13. A process as claimed in claim 12 wherein the titanium dioxide is sprayed through a plasma flame having a temperature of above 2000° C.
- 14. A process as claimed in claim 13 wherein the plasma flame uses a mixture of hydrogen and argon as the plasma gas.
Priority Claims (3)
Number |
Date |
Country |
Kind |
9600210.0 |
Jan 1996 |
GB |
|
PCT/EP97/00020 |
Jan 1997 |
EP |
|
PCT/EP97/00021 |
Jan 1997 |
EP |
|
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] The present application is a divisional of U.S. patent application filed Feb. 17, 1998 and assigned Ser. No. 09/024,240, the entire disclosure of which is incorporated herein by reference.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09024240 |
Feb 1998 |
US |
Child |
09759661 |
Jan 2001 |
US |