Number | Name | Date | Kind |
---|---|---|---|
2184174 | Bertram | Dec 1939 | |
2462374 | Firth | Feb 1949 | |
2898470 | Khol | Aug 1959 | |
3023311 | Bessen | Feb 1962 | |
3030507 | Khol | Apr 1962 | |
3197638 | Sinclair | Jul 1965 | |
3402291 | Weinman | Sep 1968 | |
3411001 | Wilchinsky | Nov 1968 | |
3483377 | Borkowski | Dec 1969 | |
3614425 | Yoshimatsu | Oct 1971 | |
3617705 | Takano | Nov 1971 | |
3634686 | Sekita | Jan 1972 | |
3639758 | Shimura | Feb 1972 | |
3639760 | Mizunuma | Feb 1972 | |
3868506 | Ogiso | Feb 1975 | |
3934138 | Bens | Jan 1976 | |
4042825 | Ruud | Aug 1977 | |
4076981 | Sparks et al. | Feb 1978 | |
4095103 | Cohen et al. | Jun 1978 | |
4125771 | Erwin | Nov 1978 | |
4128762 | Nagao et al. | Dec 1978 | |
4247771 | Frevel | Jan 1981 | |
4287416 | Kramer et al. | Sep 1981 | |
4476386 | Reid et al. | Oct 1984 |
Number | Date | Country |
---|---|---|
3119287 | Mar 1982 | DEX |
2007479 | May 1979 | GBX |
1585608 | Mar 1981 | GBX |
441490 | Sep 1972 | SUX |
624150 | Feb 1977 | SUX |
737818 | Dec 1977 | SUX |
Entry |
---|
Jrl. of Metals, "Review of Nondestructive Methods for Residual Stress Measurement", Jul. 1981, C. O. Ruud, pp. 35-39. |
Advances in X-Ray Analysis, vol. 20 (1977), "A Dual Detector Diffractometer for Measurement of Residual Stress", C. M. Mitchel, pp. 379-391. |
Advances in X-Ray Analysis, vol. 22 (1979), "New Method for Fast XRPD using a Position Sensitive Detector", H. E. Gobel, pp. 255-265. |