by means of diffractometry using detectors

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CPC
G01N23/207

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/207by means of diffractometry using detectors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 12,105,034
- Issue date Oct 1, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 12,092,593
- Issue date Sep 17, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Structure for battery analysis and X-ray diffraction device
- Patent number 12,080,858
- Issue date Sep 3, 2024
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soaking machine of single-crystal X-ray structure analysis sample,...
- Patent number 12,055,501
- Issue date Aug 6, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
- Patent number 12,031,924
- Issue date Jul 9, 2024
- Jürgen Fink
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of cause of degradation of lithium secondary battery
- Patent number 12,013,356
- Issue date Jun 18, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Metal oxide film and method for forming metal oxide film
- Patent number 11,978,742
- Issue date May 7, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Masahiro Takahashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining the three-dimensional structure of molecules...
- Patent number 11,933,748
- Issue date Mar 19, 2024
- Bruker Axs GmbH
- Clemens Richert
- C30 - CRYSTAL GROWTH
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
- Publication number 20240361259
- Publication date Oct 31, 2024
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL PHASE INFORMATION EXTRACTION APPARATUS, CRYSTAL PHASE INFOR...
- Publication number 20240353357
- Publication date Oct 24, 2024
- Kabushiki Kaisha Toshiba
- Shuhei NITTA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM
- Publication number 20240321897
- Publication date Sep 26, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Masahiro TAKAHASHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
NON-DESTRUCTIVE METHOD FOR DETECTING FAILURE OF CELL
- Publication number 20240310454
- Publication date Sep 19, 2024
- LG ENERGY SOLUTION, LTD.
- Youngdeok KIM
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
- Publication number 20240302302
- Publication date Sep 12, 2024
- Sumitomo Chemical Company, Limited
- Takehiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...
- Publication number 20240272098
- Publication date Aug 15, 2024
- Centre National de la Recherche Scientifique
- Hocine KHEMLICHE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...
- Publication number 20240241067
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Seungchul Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240210334
- Publication date Jun 27, 2024
- KIOXIA Corporation
- Yuki ABE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR METROLOGY SYSTEM AND METHOD
- Publication number 20240193473
- Publication date Jun 13, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yun-Chung Teng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20240167969
- Publication date May 23, 2024
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
SELECTION METHOD FOR CONDITIONS TO INTRODUCE A GUEST ANALYTE COMPOU...
- Publication number 20240151663
- Publication date May 9, 2024
- Merck Patent GmbH
- Carolina Von Essen
- C07 - ORGANIC CHEMISTRY
Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
- Publication number 20240133829
- Publication date Apr 25, 2024
- Rigaku Corporation
- Takumi OTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems And Methods For Interpreting High Energy Interactions
- Publication number 20240125717
- Publication date Apr 18, 2024
- DECISION TREE, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20240077435
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...
- Publication number 20240068966
- Publication date Feb 29, 2024
- Danmarks Tekniske Universitet
- Henning Friis Poulsen
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
- Publication number 20240044819
- Publication date Feb 8, 2024
- NOVA LTD
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
- Publication number 20240035989
- Publication date Feb 1, 2024
- Security Matters Ltd.
- Haggai ALON
- G01 - MEASURING TESTING
Information Patent Application
Analysis of X-ray Scatterometry Data using Deep Learning
- Publication number 20240027374
- Publication date Jan 25, 2024
- BRUKER TECHNOLOGIES LTD.
- Andrei Baranovskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20240027373
- Publication date Jan 25, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR
- Publication number 20240019385
- Publication date Jan 18, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM
- Publication number 20230369341
- Publication date Nov 16, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Masahiro TAKAHASHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COLLIMATOR
- Publication number 20230358692
- Publication date Nov 9, 2023
- ISTITUTO NAZIONALE DI FISICA NUCLEARE
- Roberto BEDOGNI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

by means of diffractometry using detectors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bifocal electron microscope

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Method for measuring distribution of pores in electrode for seconda...

X-ray based measurements in patterned structure

Evaluation device

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Nitride semiconductor substrate, laminated structure, and method fo...

Quantitative analysis method of carbon based hybrid negative electrode

Component residual stress testing platform based on neutron diffrac...

X-ray fluorescence analyzer

Single-crystal X-ray structure analysis apparatus, and method therefor

Device and method for measuring short-wavelength characteristic X-r...

Single-crystal X-ray structure analysis apparatus and method, and s...

Small-angle X-ray scatterometry

Structure for battery analysis and X-ray diffraction device

Soaking machine of single-crystal X-ray structure analysis sample,...

Measurement arrangement for X-ray radiation for gap-free 1D measure...

Diagnosis of cause of degradation of lithium secondary battery

X-ray beam shaping apparatus and method

Patterned x-ray emitting target

Method and system to determine crystal structure

Metal oxide film and method for forming metal oxide film

Method for improving an EBSD/TKD map

Method of determining the three-dimensional structure of molecules...

System and method for in-situ X-ray diffraction-based real-time mon...

Sample mounting system for an X-ray analysis apparatus

Patents Applicationslast 30 patents

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

PATTERNED X-RAY EMITTING TARGET

Small-Angle X-Ray Scatterometry

X-Ray diffraction imaging detector having multiple angled input faces

X-RAY ANALYZER

CRYSTAL PHASE INFORMATION EXTRACTION APPARATUS, CRYSTAL PHASE INFOR...

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM

NON-DESTRUCTIVE METHOD FOR DETECTING FAILURE OF CELL

NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

BIFOCAL ELECTRON MICROSCOPE

DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...

APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

SEMICONDUCTOR METROLOGY SYSTEM AND METHOD

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

SELECTION METHOD FOR CONDITIONS TO INTRODUCE A GUEST ANALYTE COMPOU...

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...

Systems And Methods For Interpreting High Energy Interactions

Small-angle x-ray scatterometry

X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...

Analysis of X-ray Scatterometry Data using Deep Learning

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR

METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM

COLLIMATOR