Claims
- 1. A method for spectroscopically analyzing a material utilizing a spectrometric instrument and a means for inducing a thermal gradient in said material, comprising the steps of:
- (a) inducing said thermal gradient in said material;
- (b) responsive to said inducing step, determining the surface emission from the material; and
- (c) determining a parameter from said surface emission correlating to a property of said material independent of optical pathlength.
- 2. A method as recited in claim 1, further comprising the steps of:
- (d) determining a reference intensity from said material; and
- (e) determining said parameter correlating to a property of said material from said surface emission and said reference intensity.
- 3. A method as recited in claim 2, wherein said reference intensity is determined utilizing said spectrometric instrument.
- 4. A method as recited in claim 1, further comprising the step of calibrating said instrument prior to said inducing step.
- 5. A method as recited in claim 1, further comprising the step of transmitting said parameter correlating to a property of said material as an electrical signal for further processing.
- 6. A method for spectroscopically analyzing a material utilizing a spectrometric instrument and a means for inducing a thermal gradient in said material, comprising the steps of:
- (a) determining a reference intensity from said material; and
- (b) inducing said thermal gradient in said material;
- (c) responsive to said inducing step, determining the surface emission from the material; and
- (d) determining a parameter correlating to a property of said material from said surface emission and said reference intensity.
- 7. A method as recited in claim 6, wherein said reference intensity is determined utilizing said spectrometric instrument.
- 8. A method as recited in claim 6, wherein said parameter correlating to a property of said material is determined independent of optical pathlength.
- 9. A method as recited in claim 6, further comprising the step of calibrating said instrument prior to said inducing step.
- 10. A method as recited in claim 6, further comprising the step of transmitting said parameter correlating to a property of said material as an electrical signal for further processing.
- 11. A method for spectroscopically analyzing a material utilizing a spectrometric instrument and a means for inducing a thermal gradient in said material, comprising the steps of:
- (a) determining a reference intensity from said material utilizing said spectrometric instrument;
- (b) inducing said thermal gradient in said material;
- (c) responsive to said inducing step, determining the surface emission from the material; and
- (d) determining a parameter correlating to a property of said material from said surface emission and said reference intensity.
- 12. A method as recited in claim 11, wherein said parameter correlating to a property of said material is determined independent of optical pathlength.
- 13. A method as recited in claim 11, further comprising the step of calibrating said instrument prior to said inducing step.
- 14. A method as recited in claim 11, further comprising the step of transmitting said parameter correlating to a property of said material as an electrical signal for further processing.
- 15. A method for spectroscopically analyzing a material utilizing a spectrometric instrument and a means for inducing a thermal gradient in said material, comprising the steps of:
- (a) calibrating said spectrometric instrument;
- (b) inducing said thermal gradient in said material;
- (c) responsive to said inducing step, determining the surface emission from the material; and
- (d) determining a parameter from said surface emission correlating to a property of said material.
- 16. A method as recited in claim 15, wherein said parameter correlating to a property of said material is determined independent of optical pathlength.
- 17. A method as recited in claim 15, further comprising the steps of:
- (e) determining a reference intensity from said material; and
- (f) determining said parameter correlating to a property of said material from said surface emission and said reference intensity.
- 18. A method as recited in claim 17, wherein said reference intensity is determined utilizing said spectrometric instrument.
- 19. A method as recited in claim 15, further comprising the step of transmitting said parameter correlating to a property of said material as an electrical signal for further processing.
- 20. A method for spectroscopically analyzing a material utilizing a spectrometric instrument and a means for inducing a thermal gradient in said material, comprising the steps of:
- (a) inducing said thermal gradient in said material;
- (b) responsive to said inducing step, determining the surface emission from the material;
- (c) determining a parameter from said surface emission correlating to a property of said material; and
- (d) transmitting said parameter as an electrical signal for further processing.
- 21. A method as recited in claim 20, wherein said parameter correlating to a property of said material is determined independent of optical pathlength.
- 22. A method as recited in claim 20, further comprising the steps of:
- (e) determining a reference intensity from said material; and
- (f) determining said parameter correlating to a property of said material from said surface emission and said reference intensity.
- 23. A method as recited in claim 22, wherein said reference intensity is determined utilizing said spectrometric instrument.
- 24. A method as recited in claim 20, further comprising the step of calibrating said instrument prior to said inducing step.
CROSS-REFERENCE TO RELATED APPLICATIONS
This application is a continuation of application Ser. No. 08/820,378, filed Mar. 12, 1997 now U.S. Pat. No. 5,900,632.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
5461229 |
Sauter et al. |
Oct 1995 |
|
5900632 |
Sterling et al. |
May 1999 |
|
Continuations (1)
|
Number |
Date |
Country |
Parent |
820378 |
Mar 1997 |
|