Claims
- 1. A supported tungsten carbide material comprising: a high-surface-area support and a tungsten carbide material; the high-surface-area support being comprised of carbon or alumina; the tungsten carbide being present on the surface of the high-surface-area support and comprising tungsten and carbon, the tungsten carbide material having an x-ray diffraction pattern containing a primary x-ray diffraction peak and first and second secondary x-ray diffraction peaks, the primary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 2.39±0.02 Å, the first secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.496±0.007 Å and a relative peak height of 25% to 40% of the peak height of the primary x-ray diffraction peak, and the second secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.268±0.005 Å and a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 2. The supported tungsten carbide material of claim 1 wherein ratio of peak height of the first secondary x-ray diffraction peak to the peak height of the second x-ray diffraction peak is from 0.65 to 0.80.
- 3. The supported tungsten carbide material of claim 1 wherein ratio of peak height of the first secondary x-ray diffraction peak to the peak height of the second x-ray diffraction peak is from 0.69 to 0.75.
- 4. The supported tungsten carbide material of claim 1 wherein the composition of the material is represented by the general formula WC1−x where x is from 0 to 0.5.
- 5. The supported tungsten carbide material of claim 1 wherein the material has crystallite sizes of about 15 Å to about 30 Å.
- 6. The supported tungsten carbide material of claim 5 wherein ratio of peak height of the first secondary x-ray diffraction peak to the peak height of the second x-ray diffraction peak is from 0.65 to 0.80.
- 7. The supported tungsten carbide material of claim 6 wherein ratio of peak height of the first secondary x-ray diffraction peak to the peak height of the second x-ray diffraction peak is from 0.69 to 0.75.
- 8. A supported tungsten carbide material comprising: a high-surface-area support and a tungsten carbide material; the high-surface-area support being comprised of carbon or alumina; the tungsten carbide being present on the surface of the high-surface-area support and comprising tungsten and carbon, the tungsten carbide material comprising tungsten and carbon, the material having a CuKα1 x-ray diffraction pattern consisting of a primary x-ray diffraction peak and first and second secondary x-ray diffraction peaks, the primary peak having a 2-theta reflection angle of 37.3 to 37.9 degrees, the first secondary peak having a 2-theta reflection angle of 61.7 to 62.3 degrees, the second secondary peak having a 2-theta reflection angle of 74.5 to 75.1 degrees, and wherein the ratio of the peak height of the first secondary peak to the peak height of the second secondary peak is from 0.65 to 0.80.
- 9. The supported tungsten carbide material of claim 8 wherein the first secondary peak has a relative peak height of 25% to 40% of the peak height of the primary x-ray diffraction peak and the second secondary x-ray diffraction peak has a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 10. The supported tungsten carbide material of claim 9 wherein the ratio of the peak height of the first secondary peak to the peak height of the second secondary peak is from 0.69 to 0.75.
- 11. The supported tungsten carbide material of claim 8 wherein the composition of the material is represented by the general formula WC1−x where x is from 0 to 0.5.
- 12. The supported tungsten carbide material of claim 8 wherein the material has crystallite sizes of about 15 Å to about 30 Å.
- 13. The supported tungsten carbide material of claim 12 wherein the first secondary peak has a relative peak height of 25% to 40% of the peak height of the primary x-ray diffraction peak and the second secondary x-ray diffraction peak has a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 14. The supported tungsten carbide material of claim 13 wherein the ratio of the peak height of the first secondary peak to the peak height of the second secondary peak is from 0.69 to 0.75.
- 15. A method for forming a supported tungsten carbide material comprising: forming a mixture of a tungsten precursor and a high-surface area support; and, heating the mixture to a temperature from about 500° C. to about 800° C. in an atmosphere containing a hydrocarbon gas and, optionally, hydrogen gas for a time sufficient to convert the tungsten precursor to the tungsten carbide material.
- 16. The method of claim 15 wherein the mixture is formed by dissolving the tungsten precursor to form a tungsten-containing solution, forming a slurry of the high-surface-area support with the tungsten-containing solution, and drying to form the mixture.
- 17. The method of claim 15 wherein the tungsten precursor is selected from ammonium metatungstate, ammonium paratungstate, ammonium tungstate, sodium tungstate, or tungsten oxides.
- 18. The method of claim 15 wherein the tungsten precursor is ammonium metatungstate or ammonium paratungstate.
- 19. The method of claim 15 wherein the hydrocarbon gas is selected from propane, ethane, natural gas, ethylene, acetylene, or a combination thereof.
- 20. The method of claim 15 wherein the hydrocarbon gas has a molecular formula containing twelve or less carbon atoms.
- 21. The method of claim 19 wherein the hydrocarbon gas is ethane or propane.
- 22. The method of claim 15 wherein the tungsten carbide material is cooled in an inert atmosphere and passivated in nitrogen after conversion.
- 23. The method of claim 21 wherein the tungsten precursor is ammonium paratungstate.
- 24. The method of claim 15 wherein the tungsten carbide material comprises tungsten and carbon and has an x-ray diffraction pattern containing a primary x-ray diffraction peak and first and second secondary x-ray diffraction peaks, the primary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 2.39±0.02 Å, the first secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.496±0.007 Å and a relative peak height of 25% to 40% of the peak height of the primary x-ray diffraction peak, and the second secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.268±0.005 Å and a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 25. A method for forming a supported tungsten carbide material comprising: forming an aqueous solution of ammonium metatungstate, mixing the solution with a high-surface-area support, adjusting the pH of the solution to promote the formation of ammonium paratungstate, allowing the solution to set to form crystals of ammonium paratungstate, separating the solid material from the solution, and drying the solids to form a mixture of ammonium paratungstate and a high-surface area support, heating the mixture to a temperature from about 500° C. to about 800° C. in an atmosphere containing a hydrocarbon gas and, optionally, hydrogen gas for a time sufficient to convert the tungsten precursor to the tungsten carbide material.
- 26. The method of claim 25 wherein the hydrocarbon gas is selected from propane, ethane, natural gas, ethylene, acetylene, or a combination thereof.
- 27. The method of claim 25 wherein the hydrocarbon gas has a molecular formula containing twelve or less carbon atoms.
- 28. The method of claim 26 wherein the hydrocarbon gas is ethane or propane.
- 29. The method of claim 25 wherein the tungsten carbide material is cooled in an inert atmosphere and passivated in nitrogen after conversion.
- 30. The method of claim 25 wherein the high-surface-area support is a high-surface-area carbon or a high-surface-area alumina.
- 31. The method of claim 30 wherein the surface area of the support is at least about 50 m2/g.
- 32. The method of claim 31 wherein the surface area of the support is from about 100 m2/g to about 1000 m2/g.
- 33. The method of claim 31 wherein the support is a high-surface-area carbon.
- 34. The method of claim 33 wherein the hydrocarbon gas is ethane or propane.
- 35. The method of claim 25 wherein the tungsten carbide material comprises tungsten and carbon and has an x-ray diffraction pattern containing a primary x-ray diffraction peak and first and second secondary x-ray diffraction peaks, the primary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 2.39±0.02 Å, the first secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.496±0.007 Å and a relative peak height of 25% to 40% of the peak height of the primary x-ray diffraction peak, and the second secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.268±0.005 Å and a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 36. A method for forming a supported tungsten carbide material comprising: forming a mixture of a tungsten precursor selected from ammonium paratungstate or ammonium metatungstate and a high-surface-area support selected from a high-surface-area carbon or a high-surface-area alumina; heating the mixture to a temperature from about 500° C. to about 800° C. in an atmosphere containing a hydrocarbon gas and, optionally, hydrogen gas for a time sufficient to convert the tungsten precursor to the tungsten carbide material; the tungsten carbide material comprising tungsten and carbon; the material having an x-ray diffraction pattern containing a primary x-ray diffraction peak and first and second secondary x-ray diffraction peaks, the primary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 2.39±0.02 Å, the first secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.496±0.007 Å and a relative peak height of 25% to 40% of the peak height of the primary x-ray ray diffraction peak, and the second secondary x-ray diffraction peak having a reflection angle corresponding to a d-spacing of 1.268±0.005 Å and a relative peak height of 35% to 55% of the peak height of the primary x-ray diffraction peak.
- 37. The method of claim 36 wherein the hydrocarbon gas is ethane or propane.
- 38. The method of claim 36 wherein the surface area of the support is at least about 50 m2/g.
- 39. The method of claim 38 wherein the surface area of the support is from about 100 m2/g to about 1000 m2/g.
- 40. The method of claim 38 wherein the support is a high-surface-area carbon.
- 41. The method of claim 36 wherein the mixture is formed by dissolving the tungsten precursor to form a tungsten-containing solution, forming a slurry of the high-surface-area support with the tungsten-containing solution, and drying to form the mixture.
- 42. The method of claim 41 wherein the surface area of the support is at least about 50 m2/g.
CROSS REFERENCES TO RELATED APPLICATIONS
[0001] This application is related to application Attorney Docket No. 00-2-035 filed concurrently herewith which is incorporated herein by reference.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09675771 |
Sep 2000 |
US |
Child |
09966047 |
Sep 2001 |
US |