BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 illustrates generally an amplitude modulated specular light advanced optical inspection system for inspecting disk surfaces according to one embodiment of the present invention.
FIG. 2 illustrates a delivery module of a sensor optical illumination module for the amplitude modulated light advanced optical inspection system according to one embodiment of the present invention.
FIG. 3 illustrates the sensor optical illumination module and a sensor brightfield collection optical module for the amplitude modulated specular light advanced optical inspection system according to one embodiment of the present invention.
FIG. 4 illustrates the signal processing electronics for the amplitude modulated specular light advanced optical inspection system according to one embodiment of the present invention.
FIG. 5 illustrates a chirp signal timing diagram for an acousto-optic deflector according to one embodiment of the present invention.
FIG. 6 is a flowchart depicting steps performed within an apparatus for detecting defects on a disk surface in accordance with one embodiment of the present invention.