for measuring evenness

Industry

CPC
G01B11/306

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/306for measuring evenness

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System with substrate carrier deterioration detection and repair
- Patent number 12,162,134
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Flatness roller, system for measuring flatness and line for associa...
- Patent number 12,076,769
- Issue date Sep 3, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sylvain Magne
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Measuring apparatus and method of wafer geometry
- Patent number 12,072,176
- Issue date Aug 27, 2024
- Nanjing ZhongAn Semiconductor Equipment Ltd
- An Andrew Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Device and system for testing flatness
- Patent number 11,948,845
- Issue date Apr 2, 2024
- BOE Technology Group Co., Ltd.
- Shaodong Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface scanner, an arrangement and a method for surface defect det...
- Patent number 11,852,594
- Issue date Dec 26, 2023
- Maillefer S.A.
- Janne Harjuhahto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrasonic inspection of extents of voids or the like in heated mat...
- Patent number 11,835,487
- Issue date Dec 5, 2023
- Teijin Limited
- Takashi Toyozumi
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method for selecting template assembly, method for polishing workpi...
- Patent number 11,731,236
- Issue date Aug 22, 2023
- Shin-Etsu Handotai Co., Ltd.
- Kazuya Sato
- B24 - GRINDING POLISHING
Information Patent Grant
Hardness and flatness tester
- Patent number 11,686,575
- Issue date Jun 27, 2023
- Stepan Company
- Thomas K. Johnson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Substrate carrier deterioration detection and repair
- Patent number 11,584,019
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer backside engineering for wafer stress control
- Patent number 11,569,134
- Issue date Jan 31, 2023
- International Business Machines Corporation
- Nikhil Jain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Flatness detection device
- Patent number 11,493,333
- Issue date Nov 8, 2022
- Shanghai Fusion Tech Co., Ltd.
- Xi Cao
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Apparatuses and methods for warpage measurement
- Patent number 11,481,887
- Issue date Oct 25, 2022
- C&B Tech
- Tong Cui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring a flatness of an object and apparatus for perfo...
- Patent number 11,454,497
- Issue date Sep 27, 2022
- Samsung Display Co., Ltd.
- Yong Woon Lim
- G01 - MEASURING TESTING
Information Patent Grant
Systems having light source with extended spectrum for semiconducto...
- Patent number 11,454,491
- Issue date Sep 27, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for distributed detection of straightness of work...
- Patent number 11,402,196
- Issue date Aug 2, 2022
- China University of Mining and Technology
- Shaoyi Xu
- E21 - EARTH DRILLING MINING
Information Patent Grant
Wafer surface curvature determining system
- Patent number 11,287,249
- Issue date Mar 29, 2022
- Soitec Belgium
- Roland Pusche
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional surface roughness evaluating device, three-dimens...
- Patent number 11,162,786
- Issue date Nov 2, 2021
- CHUGOKU MARINE PAINTS, LTD.
- Hirohisa Mieno
- G01 - MEASURING TESTING
Information Patent Grant
Hardness and flatness tester
- Patent number 11,009,342
- Issue date May 18, 2021
- Stepan Company
- Thomas K. Johnson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Device and method for optical monitoring of surfaces of an object
- Patent number 10,983,067
- Issue date Apr 20, 2021
- Inlevel GmbH
- Bjoern Lindner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mobile and automated apparatus for the detection and classification...
- Patent number 10,976,262
- Issue date Apr 13, 2021
- AUTOSCAN GMBH
- Matej Ozim
- G01 - MEASURING TESTING
Information Patent Grant
Cylindrical body surface inspection device and cylindrical body sur...
- Patent number 10,955,354
- Issue date Mar 23, 2021
- Toray Industries, Inc.
- Hiroki Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing an OSB
- Patent number 10,955,357
- Issue date Mar 23, 2021
- SWISS KRONO TEC AG
- Norbert Kalwa
- G01 - MEASURING TESTING
Information Patent Grant
Portable 3D document scanning device and method
- Patent number 10,935,375
- Issue date Mar 2, 2021
- KALLION, INC.
- Chui Hee Lee
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system for substrate deformation measurement
- Patent number 10,923,371
- Issue date Feb 16, 2021
- Applied Materials, Inc.
- Mehdi Vaez-Iravani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for the optical detection of inner walls
- Patent number 10,914,687
- Issue date Feb 9, 2021
- SAC SIRIUS ADVANCED CYBERNETICS GMBH
- Christoph Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Reaming and self-rotating anchor rod and using method thereof
- Patent number 10,907,474
- Issue date Feb 2, 2021
- China University of Mining and Technology
- Nong Zhang
- E21 - EARTH DRILLING MINING
Information Patent Grant
Shape inspection apparatus and shape inspection method
- Patent number 10,890,441
- Issue date Jan 12, 2021
- Nippon Steel Corporation
- Takayuki Sonoda
- G01 - MEASURING TESTING
Information Patent Grant
Systems for and methods of measuring photomask flatness with reduce...
- Patent number 10,871,369
- Issue date Dec 22, 2020
- Corning Incorporated
- Thomas James Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Road surface assessment apparatus for vehicle
- Patent number 10,809,058
- Issue date Oct 20, 2020
- SUBARU CORPORATION
- Dan Suzuki
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...
- Publication number 20240410689
- Publication date Dec 12, 2024
- Chengdu University of Technology
- Wenli ZHONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20240183657
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Daisuke NAGATOMO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING A DEFECT IN A SPECIMEN
- Publication number 20240151653
- Publication date May 9, 2024
- GLOBALFOUNDRIES U.S. Inc.
- RICHARD PAUL GOOD
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, PROCESSING DEVICE, OPTICAL INSPECTION...
- Publication number 20230324309
- Publication date Oct 12, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR
- Publication number 20230191619
- Publication date Jun 22, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Ti Wang
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
UNEVENNESS LEVEL INSPECTING DEVICE, UNEVENNESS LEVEL INSPECTING MET...
- Publication number 20230106629
- Publication date Apr 6, 2023
- TOPCON CORPORATION
- Takeshi KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
PRECISION HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD
- Publication number 20230013094
- Publication date Jan 19, 2023
- Cherry Systems Research Inc.
- Paul Toom
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR QUANTIFYING THE SURFACE FLATNESS OF THREE-...
- Publication number 20220412731
- Publication date Dec 29, 2022
- Hok Chuen CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MONITORING FLATNESS OF WAFER TABLE, A...
- Publication number 20220341732
- Publication date Oct 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING FLATNESS OF ALUMINUM ALLOY SHEET...
- Publication number 20220275494
- Publication date Sep 1, 2022
- COMMONWEALTH ROLLED PRODUCTS, INC.
- Jamaal D. Harris
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
DEVICE AND SYSTEM FOR TESTING FLATNESS
- Publication number 20220238391
- Publication date Jul 28, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Shaodong SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS AND METHOD OF WAFER GEOMETRY
- Publication number 20220120559
- Publication date Apr 21, 2022
- Nanjing LiAn Semiconductor Limited
- An Andrew ZENG
- G01 - MEASURING TESTING
Information Patent Application
WAFER BACKSIDE ENGINEERING FOR WAFER STRESS CONTROL
- Publication number 20210320036
- Publication date Oct 14, 2021
- International Business Machines Corporation
- Nikhil JAIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING A FLATNESS OF AN OBJECT AND APPARATUS FOR PERFO...
- Publication number 20210278204
- Publication date Sep 9, 2021
- SAMSUNG DISPLAY CO., LTD.
- Yong Woon LIM
- G01 - MEASURING TESTING
Information Patent Application
HARDNESS AND FLATNESS TESTER
- Publication number 20210278202
- Publication date Sep 9, 2021
- Stepan Company
- Thomas K. Johnson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...
- Publication number 20210262778
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS DETECTION DEVICE
- Publication number 20210172734
- Publication date Jun 10, 2021
- SHANGHAI FUSION TECH CO., LTD.
- Xi CAO
- G01 - MEASURING TESTING
Information Patent Application
TUBULAR BODY INNER SURFACE INSPECTION METHOD AND TUBULAR BODY INNER...
- Publication number 20210156681
- Publication date May 27, 2021
- NIPPON STEEL CORPORATION
- Toshio AKAGI
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS ROLLER, SYSTEM FOR MEASURING FLATNESS AND LINE FOR ASSOCIA...
- Publication number 20210078060
- Publication date Mar 18, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Sylvain MAGNE
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
A SURFACE SCANNER, AN ARRANGEMENT AND A METHOD FOR SURFACE DEFECT D...
- Publication number 20210041375
- Publication date Feb 11, 2021
- MAILLEFER S.A..
- Janne HARJUHAHTO
- G01 - MEASURING TESTING
Information Patent Application
A WAFER SURFACE CURVATURE DETERMINING SYSTEM
- Publication number 20200393241
- Publication date Dec 17, 2020
- EPIGAN NV
- Roland PUSCHE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR WARPAGE MEASUREMENT
- Publication number 20200234427
- Publication date Jul 23, 2020
- C&B TECH
- Tong CUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HARDNESS AND FLATNESS TESTER
- Publication number 20200217652
- Publication date Jul 9, 2020
- Stepan Company
- Thomas K. Johnson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
RUBBER SHEET MONITORING APPARATUS AND RUBBER SHEET MONITORING METHOD
- Publication number 20200164562
- Publication date May 28, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Eiji TAKAHASHI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Shape-Distortion Standards for Calibrating Measurement Tools for No...
- Publication number 20200135519
- Publication date Apr 30, 2020
- KLA Corporation
- Farhat A. Quli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CYLINDRICAL BODY SURFACE INSPECTION DEVICE AND CYLINDRICAL BODY SUR...
- Publication number 20200116648
- Publication date Apr 16, 2020
- TORAY INDUSTRIES, INC.
- Hiroki Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOBILE AND AUTOMATED APPARATUS FOR THE DETECTION AND CLASSIFICATION...
- Publication number 20200011808
- Publication date Jan 9, 2020
- AUTOSCAN GMBH
- Matej OZIM
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE LIGHTING
- Publication number 20190302030
- Publication date Oct 3, 2019
- DENT IMPRESSIONS, INC.
- Brian J. Chenvert
- G01 - MEASURING TESTING
Information Patent Application
LEVELING SYSTEM
- Publication number 20190277630
- Publication date Sep 12, 2019
- Joseph Frank DeLorenzo
- G01 - MEASURING TESTING

for measuring evenness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System with substrate carrier deterioration detection and repair

Flatness roller, system for measuring flatness and line for associa...

Measuring apparatus and method of wafer geometry

Wafer surface defect inspection method and apparatus thereof

Device and system for testing flatness

Surface scanner, an arrangement and a method for surface defect det...

Ultrasonic inspection of extents of voids or the like in heated mat...

Method for selecting template assembly, method for polishing workpi...

Hardness and flatness tester

Substrate carrier deterioration detection and repair

Wafer backside engineering for wafer stress control

Flatness detection device

Apparatuses and methods for warpage measurement

Method of measuring a flatness of an object and apparatus for perfo...

Systems having light source with extended spectrum for semiconducto...

Device and method for distributed detection of straightness of work...

Wafer surface curvature determining system

Three-dimensional surface roughness evaluating device, three-dimens...

Hardness and flatness tester

Device and method for optical monitoring of surfaces of an object

Mobile and automated apparatus for the detection and classification...

Cylindrical body surface inspection device and cylindrical body sur...

Method for producing an OSB

Portable 3D document scanning device and method

Metrology system for substrate deformation measurement

Apparatus and method for the optical detection of inner walls

Reaming and self-rotating anchor rod and using method thereof

Shape inspection apparatus and shape inspection method

Systems for and methods of measuring photomask flatness with reduce...

Road surface assessment apparatus for vehicle

Patents Applicationslast 30 patents

METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD

SYSTEM AND METHOD FOR DETECTING A DEFECT IN A SPECIMEN

OPTICAL INSPECTION APPARATUS, PROCESSING DEVICE, OPTICAL INSPECTION...

SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR

UNEVENNESS LEVEL INSPECTING DEVICE, UNEVENNESS LEVEL INSPECTING MET...

PRECISION HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD

APPARATUS AND METHOD FOR QUANTIFYING THE SURFACE FLATNESS OF THREE-...

METHOD, DEVICE AND SYSTEM FOR MONITORING FLATNESS OF WAFER TABLE, A...

METHODS AND SYSTEMS FOR MEASURING FLATNESS OF ALUMINUM ALLOY SHEET...

DEVICE AND SYSTEM FOR TESTING FLATNESS

MEASURING APPARATUS AND METHOD OF WAFER GEOMETRY

WAFER BACKSIDE ENGINEERING FOR WAFER STRESS CONTROL

METHOD OF MEASURING A FLATNESS OF AN OBJECT AND APPARATUS FOR PERFO...

HARDNESS AND FLATNESS TESTER

SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...

FLATNESS DETECTION DEVICE

TUBULAR BODY INNER SURFACE INSPECTION METHOD AND TUBULAR BODY INNER...

FLATNESS ROLLER, SYSTEM FOR MEASURING FLATNESS AND LINE FOR ASSOCIA...

A SURFACE SCANNER, AN ARRANGEMENT AND A METHOD FOR SURFACE DEFECT D...

A WAFER SURFACE CURVATURE DETERMINING SYSTEM

APPARATUSES AND METHODS FOR WARPAGE MEASUREMENT

HARDNESS AND FLATNESS TESTER

RUBBER SHEET MONITORING APPARATUS AND RUBBER SHEET MONITORING METHOD

Shape-Distortion Standards for Calibrating Measurement Tools for No...

CYLINDRICAL BODY SURFACE INSPECTION DEVICE AND CYLINDRICAL BODY SUR...

MOBILE AND AUTOMATED APPARATUS FOR THE DETECTION AND CLASSIFICATION...

VEHICLE LIGHTING

LEVELING SYSTEM