Number | Name | Date | Kind |
---|---|---|---|
3583361 | Laudel | Jun 1971 | |
4764394 | Conrad | Aug 1988 | |
5133849 | Kinoshita et al. | Jul 1992 | |
5185067 | Shibahara | Feb 1993 |
Entry |
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R. G. Wilson et. al, "Secondary Ion Mass Spectrometry, A Practical Handbook for Depth Profiling and Bulk Impurity Analysis", John Wiley & Sons, 1989, p. 4.3.1, Section 4.3. (no month available). |