BRIEF DESCRIPTION OF THE DRAWINGS
FIGS. 1, 2 and 3, as discussed above, respectively depict the supply distribution network to the banks of sense amplifiers of two distinct partitions of a memory device, the timing diagram that highlights the discussed cause of possible errors, and the scheme of a common circuit embodiment of a sense amplifier of the logic data stored in an array cell of the relative partition or sector of the memory device.
FIG. 4 depicts a sample timing diagram modified according to the invention such to ensure that no disturbance is present during a critical discrimination phase of the logic value of data read from a cell of a partition.
FIG. 5 is a basic diagram that depicts how the generation of turn on or turn off signals of a bank of sense amplifiers of a partition is conditioned in case of simultaneous read and verification operations in two different partitions.
FIG. 6 depicts a possible circuit scheme for freezing the turn on and turn off command of a bank of sense amplifiers verifying data being modified in a partition, according to a pre-established choice of penalizing verification operations for preserving the design access time of random read operations.
FIGS. 7 and 8 show the effectiveness of the invention in the two different situations of occurring simultaneously.
FIG. 9 depicts a basic circuit scheme according to the invention for momentarily preventing an aggressor circuit from causing a disturbance on common supply lines that may propagate to a victim circuit connected thereto and disturb its functioning.
FIG. 10 depicts a time graph of the main signals of the circuit scheme of FIG. 9.