J. Roychowdhury. Efficient Methods for Simulating highly Nonlinear Multy-Rate Circuits. IEEE, Jun. 1997.* |
O. Narayan and J. Roychowdhury. Analysing Forced Oscillator with Multiple Time Scales. Bell Lab., 1998.* |
H. G. Brachtendorf, G. Welsch, R. Laur, A. Bunse-Gerstner; “Numerical Steady State Analysis of Electronic Circuits Driven by Multi-Tone Signals,” Electrical Engineering 79 (1996) ©Springer-Verlag 1996, pp. 103-112. |
Jaijeet Roychowdhury; Bell Laboratories, Murray Hill, USA; “Efficient Methods For Simulating Highly Nonlinear Multi-Rate Circuits,” Design Automation Conference®, Coyright ©1997 by the Association for Computing Machinery, Inc., DAC 97- 06/97, Anaheim, CA USA, pp. 269-274. |
Jaijeet Roychowdhury; Bell Laboratories, Murray Hill, New Jersey; “Analysing Circuits With Widely Separated Time Scales Using Numerical PDE Methods,” pp. 1-25, May 1999. |
Yousef Saad, University of Minnesota; “Iterative Methods For Sparse Linear Systems,” Copyright ©1996 by PWS Publishing Company, Table of Contents. |
Roland W. Freund, “Reduced-order Modeling Techniques Based on Krylov Subspaces and Their Use in Circuit Simulation,” dated Feb. 17, 1998; Invited survey paper for Applied and Computational Control, Signals, and Circuits, pp. 1-56. |
Robert C. Melville, Peter Feldmann, Jaijeet Roychowdhury; AT&T Bell Laboratories, Murray Hill, New Jersey; “Efficient Multi-tone Distortion Analysis of Analog Integrated Circuits,” IEEE 1995 Custom Integrated Circuits Conference, 0-7803-2584-2/95 ©1995 IEEE, pp. 241-244. |
Peter Feldmann, Bob Melville, David Long; AT&T Bell Laboratories, Murray Hill, New Jersey; “Efficient Frequency Domain Analysis of Large Nonlinear Analog Circuits,” IEEE 1996 Custom Integrated Circuits Conference, 0-7803-3177-6 ©1996 IEEE, pp. 461-464. |
Jaijeet Roychowdhury, David Long, and Peter Feldmann, Senior Member, IEEE; Bell Laboratories, Murray Hill, New Jersey; “Cyclostationary Noise Analysis Of Large RF Circuits with Multitone Excitations,” IEEE Journal of Solid-State Circuits, vol. 33, No. 3, Mar. 1998, 0018-9200/98 ©1998 IEEE, pp. 324-336. |