Claims
- 1. A method for processing images of samples deposited on a sample plate, comprising the steps of:
generating an image of at least a portion of said plate; processing said image to locate at least one of said samples on said plate in said image; generating location data corresponding to said sample in said image; and providing said location data to a controller for at least one of a laser and a positioning device for said sample plate, said controller being operable to perform at least one of a plurality of functions comprising directing said laser at said samples on said sample plate and moving said sample plate relative to said laser in accordance with said location data.
- 2. A method as claimed in claim 1, wherein said processing step comprises the step of determining the approximate center of said sample, and said providing step comprises the steps of:
providing coordinates to a laser that correspond to a plurality of points on said sample at respective selected locations with respect to said approximate center; and operating said laser to impinge said sample at said plurality of points.
- 3. A method as claimed in claim 1, wherein said image is stored in at least an 8-bit gray scale format.
- 4. A method as claimed in claim 1, wherein said generating step comprises the steps of:
selecting points on said sample depending on the crystalline structure of said sample, said points being defined as coordinates; providing coordinates to a laser that correspond to said points; and operating said laser to impinge said sample at said points.
- 5. A method as claimed in claim 1, wherein said laser and said controller are in a mass spectrometer further comprising a camera, said generating step for generating an image comprising the step of obtaining an output signal generated via said camera, said camera having a field of view comprising said at least part of said sample plate.
- 6. A method as claimed in claim 5, wherein said output signal from said camera is provided to a monitor, said processing step comprising the step of image processing the image displayed on said monitor to locate said sample.
- 7. A method as claimed in claim 6, wherein said monitor is connected to a frame grabber.
- 8. A method as claimed in claim 1, wherein said image is characterized by coordinates selected from the group consisting of Cartesian coordinates and polar coordinates, said location data comprising coordinates that substantially coincide with said samples on said sample plate.
- 9. A method as claimed in claim 1, wherein said image comprises pixels, said pixels being characterized by respective values corresponding to different levels of brightness, said locating step comprising the steps of:
selecting a minimum brightness level such that said pixels having a value less than said minimum brightness level are determined to not belong to one of said samples; and analyzing groups of said pixels having values above said minimum brightness level to locate clusters of said pixels that correspond to one of said samples.
- 10. A method as claimed in claim 9, wherein said generating step for generating said location data comprises the step of determining an approximate centroid for at least one of said clusters.
- 11. A method as claimed in claim 1, wherein said location data is defined as coordinates and said providing step comprises the step of storing said coordinates in a file having a file format that is compatible with a mass spectrometry apparatus, said mass spectrometry apparatus being operable to move at least one of said sample plate and said laser to impinge said sample plate at locations corresponding to said coordinates provided in said file.
- 12. A method for processing images of samples deposited on a sample plate, comprising the steps of:
generating at least a partial image of said plate; determining the structure of each of said samples in said image; selecting areas on said samples in said image at which to direct laser radiation depending on the structure of said samples; generating position data corresponding to said areas; and providing said position data to a controller for at least one of a laser and a positioning device for said sample plate, said controller being operable to perform at least one of a plurality of functions comprising directing said laser at said samples on said plate and moving said sample plate relative to said laser in accordance with said position data.
- 13. A method as claimed in claim 12, wherein said laser and said controller are in a mass spectrometer further comprising an optical device having a field of view comprising said at least part of said sample plate, said generating step for generating an image comprising the step of obtaining an output signal generated via said optical device.
- 14. A method as claimed in claim 13, wherein said optical device is selected from the group consisting of a camera and a scanner.
- 15. A method as claimed in claim 12, wherein said image is characterized by a grid of coordinates selected from the group consisting of Cartesian coordinates and polar coordinates, said position data comprising coordinates in said grid that substantially coincide with said samples on said sample plate.
- 16. A method as claimed in claim 12, wherein said position data is defined as coordinates and said providing step comprises the step of storing said coordinates in a file having a file format that is compatible with a mass spectrometry apparatus, said mass spectrometry apparatus being operable to move at least one of said sample plate and said laser to impinge said sample plate at locations corresponding to said coordinates provided in said file.
- 17. A method as claimed in claim 12, wherein said image comprises pixels, said pixels being characterized by respective values corresponding to different levels of brightness, said determining step comprising the steps of:
determining which of said pixels have values above a selected threshold to represent a selected one of said samples; discarding the remaining said pixels; locating clusters of said pixels; and filtering said clusters of said pixels to discard said clusters that do not meet a selected threshold relating to a minimum area of mass.
- 18. A method as claimed in claim 12, wherein said image comprises pixels and each of said samples is characterized by a crystalline structure, said selecting step comprising the step of performing at least one of a plurality of image processing operations comprising erosion and dilation to locate groups of pixels corresponding to said crystalline structure selected from the group consisting of a thin crystal, a hair-like crystal, and a crystal having at least one finger-like appendage.
- 19. A method for processing images of samples deposited on a sample plate, comprising the steps of:
generating at least a partial image of said plate; locating said samples on said plate in said image; analyzing the structure of each of said samples in said image; selecting areas on said samples in said image at which to direct laser radiation depending on the structure of said samples; generating location data corresponding to said areas; and providing said location data to a controller for at least one of a laser and a positioning device for said sample plate, said controller being operable to perform at least one of a plurality of functions comprising directing said laser and moving said sample plate relative to said laser in accordance with said location data.
- 20. A method as claimed in claim 19, wherein said locating comprises the step of performing thresholding of said image to eliminate groups of pixels therein that do not meet a selected threshold.
- 21. A method as claimed in claim 19, wherein said locating step comprises the step of identifying selected markers in said image.
- 22. A method as claimed in claim 21, wherein said identifying step comprises the step of performing at least one dilation to locate samples in said image having finger-like structure
- 23. A method as claimed in claim 19, wherein said locating step comprises the step of applying a particle filter to said image to eliminate groups of pixels in said image having an area of mass that is less than a selected value.
- 24. A method as claimed in claim 19, wherein said generating step for said image comprises the steps of varying lighting used to generate said image using a plurality of scans and combining results of said scans to obtain an average value for each crystal in said image.
- 25. A mass spectrometry apparatus comprising:
a laser for emitting a laser beam; a controller for directing said laser beam toward a plurality of samples on a sample plate for mass spectrometry analysis; an image generating device for generating at least one image of at least part of said sample plate; and an image processing device configured to receive said image from said image generating device and to generate control signals for use by said controller to direct the manner in which said laser beam impinges said sample plate, said image processing device being operable to identify positions of said samples relative to a reference framework and provide position data relating to said positions in said control signals.
- 26. A mass spectrometry apparatus as claimed in claim 25, further comprising a monitor for said image and an input device for providing said data relating to said positions to said controller.
- 27. A mass spectrometry apparatus as claimed in claim 25, wherein said samples are characterized by crystal structures, said image processing device being operable to identify points on said samples at which to direct said laser, said points varying among said samples depending on their respective structures, said image processing device providing data relating to said points in said control signals.
- 28. A mass spectrometry apparatus as claimed in claim 27, further comprising an input device for providing said position data relating to said points to said controller.
- 29. A mass spectrometry apparatus as claimed in claim 25, wherein said controller is operable to use said control signals to move said sample plate relative to said laser.
- 30. A mass spectrometry apparatus as claimed in claim 29, wherein said reference framework corresponds to coordinates defined for said sample plate and selected from the group consisting of Cartesian coordinates and polar coordinates.
- 31. A mass spectrometry apparatus as claimed in claim 25, wherein said mass spectrometry apparatus is operated in conjunction with a frame grabber and has a monitor for displaying an output signal generated by said image generating device, said mass spectrometry device providing an output from said monitor to said frame grabber to facilitate generating said image.
- 32. A mass spectrometry apparatus as claimed in claim 25, wherein image generating device comprises a frame grabber configured to receive an output signal from one of a camera and a scanner, said frame grabber being operable to generate said image from said output signal and provide said image to said image processing device
- 33. A mass spectrometry apparatus as claimed in claim 25, wherein said position data is defined as coordinates, said image processing device being operable to store said coordinates in a file having a file format that is compatible with said mass spectrometry apparatus, said controller being operable to move at least one of said sample plate and said laser to impinge said sample plate at locations corresponding to said coordinates provided in said file.
- 34. A mass spectrometry apparatus as claimed in claim 25, wherein said image generating device is an optical device selected from the group consisting of a camera and a scanner.
- 35. A mass spectrometry apparatus as claimed in claim 34, further comprising a monitor operable to receive an output signal from said image generating device, and a frame grabber connected to said monitor to generate said image and provide said image to said image processing device.
- 36. A mass spectrometry apparatus as claimed in claim 34, further comprising a monitor operable to receive an output signal from said image processing device and display said samples in said image.
CROSS-REFERENCE TO RELATED APPLICATION
[0001] Related subject matter is disclosed and claimed in U.S. patent application Ser. No. 09/644,780, filed Aug. 24, 2000, the entire content of said application being expressly incorporated herein by reference.