Number | Name | Date | Kind |
---|---|---|---|
4173736 | Adams | Nov 1979 | |
4429271 | Doubek et al. | Jan 1984 | |
4443756 | Lightbody | Apr 1984 | |
4565966 | Burr et al. | Jan 1986 | |
4646299 | Schinabeck | Feb 1987 | |
4661768 | Carusillo | Apr 1987 | |
4908576 | Jackson | Mar 1990 | |
5187430 | Marek et al. | Feb 1993 | |
5266901 | Woo | Nov 1993 | |
5274334 | Mills | Dec 1993 | |
5357191 | Grace | Oct 1994 | |
5363048 | Modlin et al. | Nov 1994 | |
5402072 | Chiang et al. | Mar 1995 | |
5438272 | Craig et al. | Aug 1995 |
Entry |
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IBM Technical Disclosure Bulletin, Jun., 1995 vol. 38 No. 6, pp. 507-508 J. Boyette and J. C. Mahlbacher Method for Eliminating Common Defects from Capacitance Opens Shorts Data. |