by means of functional tests

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CPC
G01R31/2803

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2803by means of functional tests

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method, arrangement and computer program product for debugging a pr...
- Patent number 12,025,651
- Issue date Jul 2, 2024
- Jtag Technologies B.V.
- Petrus Marinus Cornelis Maria Van Den Eijnden
- G01 - MEASURING TESTING
Information Patent Grant
Functional test head for printed circuit boards
- Patent number 11,940,480
- Issue date Mar 26, 2024
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Grant
Failure detection system for integrated circuit components
- Patent number 11,867,746
- Issue date Jan 9, 2024
- Hamilton Sundstrand Corporation
- Thomas P. Joyce
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 11,782,085
- Issue date Oct 10, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical and logic isolation for systems on a chip
- Patent number 11,774,487
- Issue date Oct 3, 2023
- Texas Instruments Incorporated
- Jose Luis Flores
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maximization of side-channel sensitivity for trojan detection
- Patent number 11,579,185
- Issue date Feb 14, 2023
- University of Florida Research Foundation, Inc.
- Prabhat Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable infield scan coverage for multi-chip module for functional...
- Patent number 11,506,702
- Issue date Nov 22, 2022
- Intel Corporation
- Asad Azam
- G11 - INFORMATION STORAGE
Information Patent Grant
Compensation device for compensating for leakage currents
- Patent number 11,320,494
- Issue date May 3, 2022
- Dr. Ing. h.c. F. Porsche Aktiengesellschaft
- Tim Pfizenmaier
- G01 - MEASURING TESTING
Information Patent Grant
Display device and testing method for display panel
- Patent number 11,275,108
- Issue date Mar 15, 2022
- HKC CORPORATION LIMITED
- Wei Chen
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Inspection data output device, display system, and inspection data...
- Patent number 11,067,598
- Issue date Jul 20, 2021
- DENSO TEN Limited
- Sakatoshi Machimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-check system and method thereof
- Patent number 10,890,616
- Issue date Jan 12, 2021
- Nuvoton Technology Corporation
- Chih-Kai Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Monitoring accesses to a region of an integrated circuit chip
- Patent number 10,866,279
- Issue date Dec 15, 2020
- UltraSoc Technologies Limited
- Gajinder Singh Panesar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable infield scan coverage for multi-chip module for functional...
- Patent number 10,845,407
- Issue date Nov 24, 2020
- Intel Corporation
- Asad Azam
- G01 - MEASURING TESTING
Information Patent Grant
Granular dynamic test systems and methods
- Patent number 10,545,189
- Issue date Jan 28, 2020
- NVIDIA Corporation
- Milind Sonawane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for generating validation tests
- Patent number 10,503,854
- Issue date Dec 10, 2019
- Cadence Design Systems, Inc.
- Meir Ovadia
- G01 - MEASURING TESTING
Information Patent Grant
Multi-chip package capable of testing internal signal lines
- Patent number 10,497,670
- Issue date Dec 3, 2019
- Samsung Electronics Co., Ltd.
- Dae-hoon Na
- G11 - INFORMATION STORAGE
Information Patent Grant
Test interface with access across isolation barrier
- Patent number 10,488,456
- Issue date Nov 26, 2019
- Silicon Laboratories Inc.
- Ernest T. Stroud
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic independent test partition clock
- Patent number 10,473,720
- Issue date Nov 12, 2019
- NVIDIA Corporation
- Pavan Kumar Datla Jagannadha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for dynamic standard test access (DSTA) for a log...
- Patent number 10,451,676
- Issue date Oct 22, 2019
- NVIDIA Corporation
- Milind Sonawane
- G01 - MEASURING TESTING
Information Patent Grant
Independent test partition clock coordination across multiple test...
- Patent number 10,444,280
- Issue date Oct 15, 2019
- NVIDIA Corporation
- Dheepakkumaran Jayaraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for finite difference time domain simulation of...
- Patent number 10,380,292
- Issue date Aug 13, 2019
- Cadence Design Systems, Inc.
- Kenneth Robert Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan cell selection for partial scan designs
- Patent number 10,372,855
- Issue date Aug 6, 2019
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Designs for multiple perpendicular magnetic recording (PMR) writers...
- Patent number 10,366,713
- Issue date Jul 30, 2019
- Headway Technologies, Inc.
- Yuhui Tang
- B24 - GRINDING POLISHING
Information Patent Grant
Scan system interface (SSI) module
- Patent number 10,317,463
- Issue date Jun 11, 2019
- NVIDIA Corporation
- Milind Sonawane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test partition external input/output interface control for test par...
- Patent number 10,281,524
- Issue date May 7, 2019
- NVIDIA Corporation
- Sailendra Chadalavda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling a test run on a device under test without directly cont...
- Patent number 10,254,335
- Issue date Apr 9, 2019
- International Business Machines Corporation
- Steve L. LeClerc
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method
- Patent number 10,241,146
- Issue date Mar 26, 2019
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Smart blinds PCB test apparatus
- Patent number 10,215,797
- Issue date Feb 26, 2019
- Hall Labs LLC
- David R. Hall
- G01 - MEASURING TESTING
Information Patent Grant
System and computer program product for performing comprehensive fu...
- Patent number 10,161,991
- Issue date Dec 25, 2018
- HUNTRON, INC.
- Alan Howard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL AND LOGIC ISOLATION FOR SYSTEMS ON A CHIP
- Publication number 20240027515
- Publication date Jan 25, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Jose Luis Flores
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUNCTIONAL TEST HEAD FOR PRINTED CIRCUIT BOARDS
- Publication number 20230120501
- Publication date Apr 20, 2023
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION SYSTEM FOR INTEGRATED CIRCUIT COMPONENTS
- Publication number 20230090583
- Publication date Mar 23, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Thomas P. Joyce
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ASSESSING PRINTED CIRCUIT BOARDS
- Publication number 20230021965
- Publication date Jan 26, 2023
- SIEMENS AKTIENGESELLSCHAFT
- Jochen Bönig
- G01 - MEASURING TESTING
Information Patent Application
METHOD, ARRANGEMENT AND COMPUTER PROGRAM PRODUCT FOR DEBUGGING A PR...
- Publication number 20220404412
- Publication date Dec 22, 2022
- JTAG Technologies B.V.
- Petrus Marinus Cornelis Maria VAN DEN EIJNDEN
- G01 - MEASURING TESTING
Information Patent Application
Electrical and Logic Isolation for Systems on a Chip
- Publication number 20210208189
- Publication date Jul 8, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Jose Luis Flores
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE CAUSE OF A FAULT IN AN ELECTR...
- Publication number 20210165035
- Publication date Jun 3, 2021
- SIEMENS AKTIENGESELLSCHAFT
- Andrés Botero Halblaub
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20210156904
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ONLINE TEST DATA RECORD AND OFFLINE DATA CONVERSION ANALYSIS SYSTEM...
- Publication number 20210072305
- Publication date Mar 11, 2021
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yong-Jun SHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPENSATION DEVICE FOR COMPENSATING FOR LEAKAGE CURRENTS
- Publication number 20210048484
- Publication date Feb 18, 2021
- Dr. Ing. h.c.F. Porsche Aktiengesellschaft
- Tim Pfizenmaier
- G01 - MEASURING TESTING
Information Patent Application
SCALABLE INFIELD SCAN COVERAGE FOR MULTI-CHIP MODULE FOR FUCTIONAL...
- Publication number 20210003629
- Publication date Jan 7, 2021
- Intel Corporation
- Asad Azam
- G11 - INFORMATION STORAGE
Information Patent Application
MAXIMIZATION OF SIDE-CHANNEL SENSITIVITY FOR TROJAN DETECTION
- Publication number 20210003630
- Publication date Jan 7, 2021
- University of Florida Research Foundation, Inc.
- PRABHAT KUMAR MISHRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DATA OUTPUT DEVICE, DISPLAY SYSTEM, AND INSPECTION DATA...
- Publication number 20200309817
- Publication date Oct 1, 2020
- DENSO TEN LIMITED
- Sakatoshi MACHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-CHECK SYSTEM AND METHOD THEREOF
- Publication number 20200110130
- Publication date Apr 9, 2020
- NUVOTON TECHNOLOGY CORPORATION
- CHIH-KAI HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING ACCESSES TO A REGION OF AN INTEGRATED CIRCUIT CHIP
- Publication number 20190277912
- Publication date Sep 12, 2019
- UltraSoC Technologies Limited
- Gajinder Singh Panesar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCALABLE INFIELD SCAN COVERAGE FOR MULTI-CHIP MODULE FOR FUCTIONAL...
- Publication number 20190049513
- Publication date Feb 14, 2019
- Intel Corporation
- Asad Azam
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD
- Publication number 20180313889
- Publication date Nov 1, 2018
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
Smart Blinds PCB Test Apparatus
- Publication number 20180292451
- Publication date Oct 11, 2018
- David R. Hall
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND COMPUTER PROGRAM PRODUCT FOR PERFORMING COMPREHENSIVE FU...
- Publication number 20180059169
- Publication date Mar 1, 2018
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR TESTING COMPONENTS OF AN AEROSOL DELIVE...
- Publication number 20170156405
- Publication date Jun 8, 2017
- RAI STRATEGIC HOLDINGS, INC.
- Michael Ryan Galloway
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Application
TEST PARTITION EXTERNAL INPUT/OUTPUT INTERFACE CONTROL
- Publication number 20170115338
- Publication date Apr 27, 2017
- Sailendra Chadalavda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP, STACK CHIP INCLUDING THE SAME, AND TESTING METH...
- Publication number 20150177320
- Publication date Jun 25, 2015
- SK HYNIX INC.
- Tae Yong LEE
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD TESTING SYSTEM
- Publication number 20150168485
- Publication date Jun 18, 2015
- Primax Electronics Ltd.
- Pei-Ming Chang
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-READABLE MEDIUM STORING ANALYSIS-SUPPORT PROGRAM, ANALYSIS...
- Publication number 20150106042
- Publication date Apr 16, 2015
- Fujitsu Limited
- Shogo Fujimori
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROVIDING FAULT PREDICTION
- Publication number 20150061707
- Publication date Mar 5, 2015
- Wisconsin Alumni Research Foundation
- Raghuraman Balasubramanian
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING LAYOUT OF POWER PIN OF INTEGRATED CHI...
- Publication number 20140347090
- Publication date Nov 27, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- GUANG-FENG OU
- G01 - MEASURING TESTING
Information Patent Application
Correlation of Device Manufacturing Defect Data with Device Electri...
- Publication number 20140115551
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Armagan Akar
- G01 - MEASURING TESTING

by means of functional tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method, arrangement and computer program product for debugging a pr...

Functional test head for printed circuit boards

Failure detection system for integrated circuit components

Semiconductor test device and system and test method using the same

Electrical and logic isolation for systems on a chip

Integrated circuit profiling and anomaly detection

Maximization of side-channel sensitivity for trojan detection

Scalable infield scan coverage for multi-chip module for functional...

Compensation device for compensating for leakage currents

Display device and testing method for display panel

Inspection data output device, display system, and inspection data...

Self-check system and method thereof

Monitoring accesses to a region of an integrated circuit chip

Scalable infield scan coverage for multi-chip module for functional...

Granular dynamic test systems and methods

Method and system for generating validation tests

Multi-chip package capable of testing internal signal lines

Test interface with access across isolation barrier

Dynamic independent test partition clock

Method and system for dynamic standard test access (DSTA) for a log...

Independent test partition clock coordination across multiple test...

Systems and methods for finite difference time domain simulation of...

Scan cell selection for partial scan designs

Designs for multiple perpendicular magnetic recording (PMR) writers...

Scan system interface (SSI) module

Test partition external input/output interface control for test par...

Controlling a test run on a device under test without directly cont...

Test system and method

Smart blinds PCB test apparatus

System and computer program product for performing comprehensive fu...

Patents Applicationslast 30 patents

ELECTRICAL AND LOGIC ISOLATION FOR SYSTEMS ON A CHIP

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

FUNCTIONAL TEST HEAD FOR PRINTED CIRCUIT BOARDS

FAILURE DETECTION SYSTEM FOR INTEGRATED CIRCUIT COMPONENTS

METHODS AND SYSTEMS FOR ASSESSING PRINTED CIRCUIT BOARDS

METHOD, ARRANGEMENT AND COMPUTER PROGRAM PRODUCT FOR DEBUGGING A PR...

Electrical and Logic Isolation for Systems on a Chip

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

METHOD AND DEVICE FOR DETERMINING THE CAUSE OF A FAULT IN AN ELECTR...

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

ONLINE TEST DATA RECORD AND OFFLINE DATA CONVERSION ANALYSIS SYSTEM...

COMPENSATION DEVICE FOR COMPENSATING FOR LEAKAGE CURRENTS

SCALABLE INFIELD SCAN COVERAGE FOR MULTI-CHIP MODULE FOR FUCTIONAL...

MAXIMIZATION OF SIDE-CHANNEL SENSITIVITY FOR TROJAN DETECTION

INSPECTION DATA OUTPUT DEVICE, DISPLAY SYSTEM, AND INSPECTION DATA...

SELF-CHECK SYSTEM AND METHOD THEREOF

MONITORING ACCESSES TO A REGION OF AN INTEGRATED CIRCUIT CHIP

SCALABLE INFIELD SCAN COVERAGE FOR MULTI-CHIP MODULE FOR FUCTIONAL...

TEST SYSTEM AND METHOD

Smart Blinds PCB Test Apparatus

SYSTEM AND COMPUTER PROGRAM PRODUCT FOR PERFORMING COMPREHENSIVE FU...

APPARATUSES AND METHODS FOR TESTING COMPONENTS OF AN AEROSOL DELIVE...

TEST PARTITION EXTERNAL INPUT/OUTPUT INTERFACE CONTROL

SEMICONDUCTOR CHIP, STACK CHIP INCLUDING THE SAME, AND TESTING METH...

CIRCUIT BOARD TESTING SYSTEM

COMPUTER-READABLE MEDIUM STORING ANALYSIS-SUPPORT PROGRAM, ANALYSIS...

INTEGRATED CIRCUIT PROVIDING FAULT PREDICTION

SYSTEM AND METHOD FOR TESTING LAYOUT OF POWER PIN OF INTEGRATED CHI...

Correlation of Device Manufacturing Defect Data with Device Electri...