Claims
- 1. In a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, a device providing feedback to the instrument operator as to the relative position of the cantilever probe comprising:
a knob; means, such as a rotary position encoder, by which a change in the position of said knob varies a performance parameter of said instrument, such as the voltage applied by the instrument's peizo or the setpoint of the instrument's closed loop positioner: and means, such as a motor, by which a torque may be applied to said knob that is a function of another performance parameter of said instrument, such as the deflection of the cantilever probe.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims priority of U.S. Provisional Application No. 60/332,650, filed on Nov. 5, 2001, the disclosures of which are incorporated fully herein by reference.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60332650 |
Nov 2001 |
US |