Claims
- 1. A temperature probe for monitoring the temperature of a large surface comprising at least two elongated electrical conductors, spaced from each other and connected through a semiconducting substance, said two conductors and said semiconducting substance defining a sensor means for monitoring the temperature along the length of said conductors, and a protecting tube mounted in surrounding relation to said sensor means and spaced therefrom to define a gap void of any structure between said tube and said sensor means, said gap being filled with a dry gas.
- 2. Temperature probe as defined in claim 1, wherein the gas is noble gas.
- 3. Temperature probe as defined in claim 2, wherein the gas is helium.
- 4. Temperature probe as defined in claim 1, wherein the protecting tube consists of high-grade steel or Inconel.
- 5. Temperature probe as defined in claim 1, wherein the protecting tube is seamlessly annealed.
- 6. Temperature probe as defined in claim 1, wherein the wall thickness of the protecting tube is 0.5 mm through 1 mm, and the outer diameter of the protecting tube is preferably 6 mm.
- 7. Temperature probe as defined in claim 1, wherein said sensor means is fitted with a tail piece for permitting easy handling during introduction into the protecting tube.
- 8. Temperature probe as defined in claim 1, wherein said protecting tube is at one end tightly connected with a plug tube and at the other end is sealed with a plug.
- 9. A temperature probe for monitoring the temperature of a large surface comprising an inner conductor in form of a wire coaxially and at a distance surrounded by an outer tube-shaped conductor, semiconductor material filled in the space between said inner conductor and said outer conductor, said inner and outer conductors and said semiconductor material defining a sensor means for monitoring the temperature along the common length of said conductors, and a protecting tube mounted in surrounding relation to said outer conductor and spaced therefrom to define a gap void of any structure between said protecting tube and said outer conductor, said gap being filled with a dry gas.
- 10. Temperature probe as defined in claim 9, wherein the gas is a noble gas.
- 11. Temperature probe as defined in claim 10, wherein the gas is helium.
- 12. Temperature probe as defined in claim 9, wherein the protecting tube is seamlessly annealed.
- 13. Temperature probe as defined in claim 9, wherein the wall thickness of the protecting tube is 0.5 mm through 1 mm, and the outer diameter of the protecting tube is preferably 6 mm.
- 14. Temperature probe as defined in claim 9, wherein said sensor means is fitted with a tail piece for permitting easy handling during introduction into the protecting tube.
- 15. Temperature probe as defined in claim 9, wherein said protecting tube is at one end tightly connected with a plug tube and at the other end is sealed with a plug.
Priority Claims (1)
Number |
Date |
Country |
Kind |
3929993 |
Sep 1989 |
DEX |
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Parent Case Info
This is a continuation of application Ser. No. 570,733, filed on Aug. 22, 1990, now abandoned.
US Referenced Citations (11)
Foreign Referenced Citations (4)
Number |
Date |
Country |
0078675 |
Oct 1989 |
EPX |
0208316 |
Jan 1908 |
DE2 |
1773577 |
Apr 1972 |
DEX |
0314427 |
Dec 1988 |
JPX |
Continuations (1)
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Number |
Date |
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Parent |
570733 |
Aug 1990 |
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