1. Technical Field
The present disclosure relates to a temperature test system for testing reliability of an electronic device under different temperatures.
2. Description of Related Art
Temperature test is an important test for determining the reliability of an electronic device. The functions of the electronic device are tested under different temperatures, in a test chamber. However, a typical test chamber cannot detect temperatures of different positions in the test chamber, which may have an influence on precision of the test.
Therefore there is a need for improvement in the art.
Many aspects of the embodiments can be better understood with references to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
The disclosure is illustrated by way of example and not by way of limitation in the figures of the accompanying drawings in which like references indicate similar elements. It should be noted that references to “an” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean at least one.
The detecting module 300 includes a plurality of temperature sensors C1-C9, a plurality of winding units M1-M9 and a plurality of switch units K1-K9. Each of the plurality of temperature sensors C1-C9 includes a first digital signal output terminal a0. The plurality of control signal output terminals PA2-PA7, PC0-PC2 are grounded via the plurality of winding units M1-M9. The first digital signal input terminal PC3 is electrically connected to the first digital signal output terminals a0 of the plurality of temperature sensors C1-C9 via the plurality of switch units K1-K9. In one embodiment, the plurality of switch units K1-K9 are normally open switches.
The display module 500 includes a plurality of eight-segment numeral tubes D0-D4. Each of the plurality of eight-segment numeral tubes D0-D4 includes a plurality of second digital signal input terminals c1-c8. The plurality of second digital signal input terminals c1-c8 of the plurality of eight-segment numeral tubes D0-D4 are electrically connected to the plurality of second digital signal output terminals b1-b8 of the plurality of registers U0-U4.
In a working state, the plurality of temperature sensors C1-C9 are placed in different positions of the test chamber 600 to detect the temperature signals of these positions. The button switch S0 is pressed to start up the system. The plurality of button switches S1-S9 are corresponding to the plurality of temperature sensors C1-C9. One of the plurality of button switches S1-S9 is pressed to select one of the plurality of temperature sensors C1-C9 to receive the temperature signal. The micro controller Q outputs a high voltage level control signal at one of the plurality of control signal output terminals PA2-PA7, PC0-PC2. One of the plurality of winding units M1-M9 receives the high voltage level control signal and is powered on. One of the plurality of switch units K1-K9 is closed. The one of the plurality of temperature sensors C1-C9 selected by the one of the plurality of button switches S1-S9 transmits the temperature signal to the micro controller Q. The micro controller Q converts the temperature signal to a serial data which is transmitted to the decoding module 400. The decoding module 400 decodes the serial data to an eight-bit high voltage level and low voltage level signal which is transmitted to the plurality of eight-segment numeral tubes D0-D4. The plurality of eight-segment numeral tubes D0-D4 display the temperature value of the position corresponding to the one of the plurality of temperature sensors C1-C9 which is selected by the one of the plurality of button switches S1-S9.
In one embodiment, the eight-segment numeral tube D0 is used for indicating the temperature value of which one of the plurality of temperature sensors C1-C9 is displayed on the plurality of eight-segment numeral tubes D0-D4. The eight-segment numeral tube D3 includes a decimal point to precisely indicate the temperature value.
Even though numerous characteristics and advantages of the present disclosure have been set forth in the foregoing description, together with details of the structure and function of the disclosure, the disclosure is illustrative only, and changes may be made in detail, especially in the matters of shape, size, and arrangement of parts within the principles of the disclosure to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Number | Date | Country | Kind |
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201110429325.8 | Dec 2011 | CN | national |