TEST APPARATUS AND TEST METHOD

Abstract

A test apparatus adapted for testing different electronic devices is provided. The apparatus provides a standard interface for operating with the different electronic devices. The interface provides an optional interface region, an optional test command region, and a selected test command region. The optional interface region is for displaying optional interfaces. The optional test command region is for displaying optional test commands relating to an interface selected in the optional interface region. The selected test command region is for displaying test commands selected from the optional test command region. In response to a selection on the user interface, the apparatus recognizes the interface and the test commands selected, and transmits instruction sets corresponding to the test commands through the interface recognized to the corresponding electronic device, thereby driving the electronic device performing required tests.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a hardware infrastructure of a test apparatus adapted for testing different electronic devices connected thereto in accordance with a preferred embodiment of the present invention;

FIG. 2 is a schematic diagram showing a user interface of the test apparatus of FIG. 1; and

FIG. 3 is a flowchart of a preferred test method by utilizing the test apparatus of FIG. 1.

Claims

1. A test apparatus adapted for testing different electronic devices, the apparatus comprising: a plurality of interfaces configured for communicating with the electronic devices, wherein each interface employs a different protocol and is assigned with an interface number for identification;a storage unit for storing an interface number list and a test command list, wherein the interface number list records the interfaces and the associated interface numbers, and the test command list records test commands relating to the interfaces and instruction sets each corresponding to a test command;an interface module configured for displaying the interfaces and the test commands allowable to be selective through a user interface, and obtaining a selected interface and associated test commands in response to a selection; anda processing unit configured for parsing information of the selected interface and associated test commands from the interface module to obtain the interface number corresponding to the selected interface and the instruction sets corresponding to the selected test commands according to the interface number list and the test command list, and transmitting the instruction sets obtained to the corresponding interface according to the interface number obtained, thereby driving the electronic device connected thereto performing required tests according to the instruction sets.

2. The apparatus according to claim 1, wherein the interface is selected from the group consisting of an RS232 interface, an I2C interface, and a USB interface.

3. The apparatus according to claim 1, wherein the user interface provides an optional interface region and an optional test command region, the optional interface region configured for displaying the interfaces allowable to be selective, and the optional test command region configured for displaying the test commands relating to an interface selected in the optional interface region.

4. The apparatus according to claim 3, wherein the user interface further provides a selected test command region configured for displaying the test commands selected from the optional test command region.

5. A test method used in a test apparatus for testing different electronic devices, wherein the test apparatus includes a plurality of interfaces configured for communicating with the electronic devices, the method comprising the steps of: displaying a user interface providing an optional interface region and an optional test command region, wherein the optional interface region is configured for displaying optional interfaces allowable to be selective, and the optional test command region is configured for displaying optional test commands relating to an interface selected in the optional interface region, the test commands allowable to be selective and each corresponding to an instruction set;obtaining information of the interface and the test commands selected from the user interface;parsing the information of the interface and the test commands selected to obtain the instruction sets corresponding to the test commands selected; andtransmitting the instruction sets obtained to the corresponding electronic device through the interface selected to drive the electronic device performing required tests.

6. The method according to claim 5, wherein the user interface further provides a selected test command region configured for displaying the test commands selected from the optional test command region.

7. The method according to claim 6, wherein the interfaces is selected from the group consisting of an RS232 interface, an I2C interface, and a USB interface.