Modular tester

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CPC
G01R31/31907

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31907Modular tester

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Patents Grantslast 30 patents

Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Multi-modal memory apparatuses and systems
- Patent number 12,072,381
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Kenneth M. Curewitz
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 12,038,472
- Issue date Jul 16, 2024
- Advantest Corporation
- Naoya Toyota
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device interface board supporting devices with multiple different s...
- Patent number 11,860,229
- Issue date Jan 2, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,828,802
- Issue date Nov 28, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method of measuring a device under test
- Patent number 11,821,948
- Issue date Nov 21, 2023
- Rohde & Schwarz GmbH & Co. KG
- Philipp Weigell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 11,808,812
- Issue date Nov 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Selective redistribution and replenishment of utility scale battery...
- Patent number 11,762,030
- Issue date Sep 19, 2023
- Inventus Holdings, LLC
- Rachana Vidhi
- G01 - MEASURING TESTING
Information Patent Grant
Functional tester for printed circuit boards, and associated system...
- Patent number 11,686,759
- Issue date Jun 27, 2023
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing single DUT through multiple cores in p...
- Patent number 11,686,768
- Issue date Jun 27, 2023
- Test Research, Inc.
- Ching-Chih Lin
- G01 - MEASURING TESTING
Information Patent Grant
Automated verification code generation based on a hardware design a...
- Patent number 11,579,195
- Issue date Feb 14, 2023
- Micron Technology, Inc.
- Benjamin Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,506,712
- Issue date Nov 22, 2022
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,415,628
- Issue date Aug 16, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for sending data according to a signal timing
- Patent number 11,409,689
- Issue date Aug 9, 2022
- Infineon Technologies AG
- Siak Pin Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment using an on-chip-system test controller
- Patent number 11,385,285
- Issue date Jul 12, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Functional tester for printed circuit boards, and associated system...
- Patent number 11,262,396
- Issue date Mar 1, 2022
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a test apparatus and a test apparatus
- Patent number 11,243,254
- Issue date Feb 8, 2022
- Advantest Corporation
- Wolfgang Horn
- G01 - MEASURING TESTING
Information Patent Grant
Non-standard sector size system support for SSD testing
- Patent number 11,237,202
- Issue date Feb 1, 2022
- Advantest Corporation
- Duane Champoux
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquisition of test data
- Patent number 11,041,907
- Issue date Jun 22, 2021
- Advantest Corporation
- Ben Rogel-Favila
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture with an FPGA based test board to simulate a DUT o...
- Patent number 11,009,550
- Issue date May 18, 2021
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Securing and controlling remote access of a memory-mapped device ut...
- Patent number 11,012,333
- Issue date May 18, 2021
- Marvell Asia Pte, Ltd.
- Thomas Kniplitsch
- G01 - MEASURING TESTING
Information Patent Grant
Universal automated testing of embedded systems
- Patent number 10,997,045
- Issue date May 4, 2021
- Y Soft Corporation, a.s.
- Jiri Kyzlink
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deterministic concurrent test program executor for an automated tes...
- Patent number 10,990,513
- Issue date Apr 27, 2021
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for temporal signal measurement of device under t...
- Patent number 10,989,758
- Issue date Apr 27, 2021
- AEM SINGAPORE PTE. LTD.
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing semiconductor packages
- Patent number 10,962,581
- Issue date Mar 30, 2021
- Samsung Electronics Co., Ltd.
- Ji Nyeong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method of creating program for measurement system, measurement syst...
- Patent number 10,956,180
- Issue date Mar 23, 2021
- Keysight Technologies, Inc.
- Tomonori Ura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart and efficient protocol logic analyzer configured within autom...
- Patent number 10,955,461
- Issue date Mar 23, 2021
- Advantest Corporation
- Linden Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Command recording arrangement and command recording method
- Patent number 10,877,094
- Issue date Dec 29, 2020
- Rohde & Schwarz GmbH & Co. KG
- Wolfgang Wendler
- G01 - MEASURING TESTING
Information Patent Grant
Streaming networks efficiency using data throttling
- Patent number 10,775,436
- Issue date Sep 15, 2020
- Mentor Graphics Corporation
- Jean-Francois Cote
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS
- Publication number 20240369632
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Kenneth M. Curewitz
- G01 - MEASURING TESTING
Information Patent Application
STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM
- Publication number 20240329137
- Publication date Oct 3, 2024
- International Business Machines Corporation
- Brent William YARDLEY
- G01 - MEASURING TESTING
Information Patent Application
SELF-RESET TESTING SYSTEMS AND METHODS
- Publication number 20240201251
- Publication date Jun 20, 2024
- Advantest Corporation
- Camilo Montenegro
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS
- Publication number 20240125851
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Kenneth M. Curewitz
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS
- Publication number 20240103077
- Publication date Mar 28, 2024
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...
- Publication number 20240094293
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20240044980
- Publication date Feb 8, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20230314512
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
- Publication number 20230152374
- Publication date May 18, 2023
- Advantest Corporation
- Matthias SAUER
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20230079002
- Publication date Mar 16, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND APPARATUS FOR DETECTION OF COUNTERFEIT PARTS, COMPROMI...
- Publication number 20220341990
- Publication date Oct 27, 2022
- PALITRONICA INC.
- CARLOS MORENO
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...
- Publication number 20220236315
- Publication date Jul 28, 2022
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF MEASURING A DEVICE UNDER TEST
- Publication number 20220155369
- Publication date May 19, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Philipp Weigell
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20220137129
- Publication date May 5, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...
- Publication number 20210278462
- Publication date Sep 9, 2021
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
Vector Eyes
- Publication number 20210223314
- Publication date Jul 22, 2021
- Richard C. Carmichael
- G11 - INFORMATION STORAGE
Information Patent Application
AUTOMATED TEST EQUIPMENT USING AN ON-CHIP-SYSTEM TEST CONTROLLER
- Publication number 20210025938
- Publication date Jan 28, 2021
- Olaf PÖPPE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SENDING DATA ACCORDING TO A SIGNAL TIMING
- Publication number 20200355743
- Publication date Nov 12, 2020
- INFINEON TECHNOLOGIES AG
- Siak Pin Lim
- G01 - MEASURING TESTING
Information Patent Application
NON-STANDARD SECTOR SIZE SYSTEM SUPPORT FOR SSD TESTING
- Publication number 20200292609
- Publication date Sep 17, 2020
- Duane CHAMPOUX
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE REDISTRIBUTION AND REPLENISHMENT OF UTILITY SCALE BATTERY...
- Publication number 20200209322
- Publication date Jul 2, 2020
- Inventus Holdings, LLC
- Rachana Vidhi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECURING AND CONTROLLING REMOTE ACCESS OF A MEMORY-MAPPED DEVICE UT...
- Publication number 20200169489
- Publication date May 28, 2020
- Marvell Asia Pte., Ltd.
- Thomas KNIPLITSCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED VERIFICATION CODE GENERATION BASED ON A HARDWARE DESIGN A...
- Publication number 20200158781
- Publication date May 21, 2020
- Micron Technology, Inc.
- Benjamin Ting
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TEMPORAL SIGNAL MEASUREMENT OF DEVICE UNDER T...
- Publication number 20200096568
- Publication date Mar 26, 2020
- AEM SINGAPORE PTE. LTD.
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Application
COMMAND RECORDING ARRANGEMENT AND COMMAND RECORDING METHOD
- Publication number 20200064403
- Publication date Feb 27, 2020
- Rohde& Schwarz GmbH & Co. KG
- Wolfgang Wendler
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA
- Publication number 20200033408
- Publication date Jan 30, 2020
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...
- Publication number 20200033396
- Publication date Jan 30, 2020
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20200003835
- Publication date Jan 2, 2020
- T-MOBILE USA, INC.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
SMART AND EFFICIENT PROTOCOL LOGIC ANALYZER CONFIGURED WITHIN AUTOM...
- Publication number 20190353696
- Publication date Nov 21, 2019
- Advantest Corporation
- Linden HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILTER COMPRISING PRINTED CIRCUIT BOARD AND BUSBARS
- Publication number 20190246493
- Publication date Aug 8, 2019
- Schaffner EMV AG
- Alessandro AMADUCCI
- G01 - MEASURING TESTING
Information Patent Application
Expanded Detail Graphical Display for Spectrum Analyzers
- Publication number 20190162764
- Publication date May 30, 2019
- Research Electronics International, LLC
- Bruce R. Barsumian
- G01 - MEASURING TESTING

Modular tester

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Modular wireless communication device testing system

Multi-modal memory apparatuses and systems

Test apparatus

Automated test equipment for testing one or more devices under test...

Device interface board supporting devices with multiple different s...

Modular wireless communication device testing system

Measurement system and method of measuring a device under test

Passive carrier-based device delivery for slot-based high-volume se...

Selective redistribution and replenishment of utility scale battery...

Functional tester for printed circuit boards, and associated system...

System and method of testing single DUT through multiple cores in p...

Automated verification code generation based on a hardware design a...

Modular wireless communication device testing system

Automated test equipment for testing one or more devices under test...

Method and device for sending data according to a signal timing

Automated test equipment using an on-chip-system test controller

Functional tester for printed circuit boards, and associated system...

Method for operating a test apparatus and a test apparatus

Non-standard sector size system support for SSD testing

Method and system for acquisition of test data

Test architecture with an FPGA based test board to simulate a DUT o...

Securing and controlling remote access of a memory-mapped device ut...

Universal automated testing of embedded systems

Deterministic concurrent test program executor for an automated tes...

System and method for temporal signal measurement of device under t...

Apparatus for testing semiconductor packages

Method of creating program for measurement system, measurement syst...

Smart and efficient protocol logic analyzer configured within autom...

Command recording arrangement and command recording method

Streaming networks efficiency using data throttling

Patents Applicationslast 30 patents

MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS

STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM

SELF-RESET TESTING SYSTEMS AND METHODS

MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS

METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS

SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

A METHOD AND APPARATUS FOR DETECTION OF COUNTERFEIT PARTS, COMPROMI...

FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...

MEASUREMENT SYSTEM AND METHOD OF MEASURING A DEVICE UNDER TEST

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...

Vector Eyes

AUTOMATED TEST EQUIPMENT USING AN ON-CHIP-SYSTEM TEST CONTROLLER

METHOD AND DEVICE FOR SENDING DATA ACCORDING TO A SIGNAL TIMING

NON-STANDARD SECTOR SIZE SYSTEM SUPPORT FOR SSD TESTING

SELECTIVE REDISTRIBUTION AND REPLENISHMENT OF UTILITY SCALE BATTERY...

SECURING AND CONTROLLING REMOTE ACCESS OF A MEMORY-MAPPED DEVICE UT...

AUTOMATED VERIFICATION CODE GENERATION BASED ON A HARDWARE DESIGN A...

SYSTEM AND METHOD FOR TEMPORAL SIGNAL MEASUREMENT OF DEVICE UNDER T...

COMMAND RECORDING ARRANGEMENT AND COMMAND RECORDING METHOD

METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA

FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

SMART AND EFFICIENT PROTOCOL LOGIC ANALYZER CONFIGURED WITHIN AUTOM...

FILTER COMPRISING PRINTED CIRCUIT BOARD AND BUSBARS

Expanded Detail Graphical Display for Spectrum Analyzers