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3-4186 | Jan 1991 | JP |
Entry |
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IEEE Standard 1149 and 1149.1a (‘IEEE Standard Test Access and Boundary-Scan Architecture’, IEEE Std. 1149.1-1990, 1993).* |
J. Leenstra and L. Spaanenburg, “Using hierarchy in macro cell test assembly”, Proceedings of the 1st European Test Conference, 1989, pp.: 63-70. |