Number | Date | Country | Kind |
---|---|---|---|
8921561 | Sep 1989 | GBX |
Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/GB90/01451 | 9/20/1990 | 4/23/1992 | 4/23/1992 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO91/04498 | 4/4/1991 |
Number | Name | Date | Kind |
---|---|---|---|
4527115 | Mehrotra et al. | Jul 1985 | |
4843312 | Hartman et al. | Jun 1989 | |
4894605 | Ringleb et al. | Jan 1990 | |
5012185 | Ohfuji | Apr 1991 | |
5057775 | Hall | Oct 1991 |
Number | Date | Country |
---|---|---|
8202603 | Dec 1981 | EPX |
0223714 | May 1987 | EPX |
62-69671 | Mar 1987 | JPX |
WO8402580 | Jul 1984 | WOX |
Entry |
---|
Proceedings of the IEEE 1989 Custom Integrated Circuits Conference 15-18 May 1989, San Diego, Calif. IEE. Nigh et al. "A Self-Testing ALU Using Built-In Current Sensing" see pp. 2211-2214. |
Optical Engineering, vol. 21, No. 5 Sep.-Oct. 1982 Dereniak et al. "Microprocessor-Based Charge Coupled Device (CCD) Test Console." see pp. 942-944. |
Asano, Solid State Sensors Continue to Improve Their Image, 11-1988, pp. 64-67, JEE.-Journal of Electronic Engineering No. 263, Tokyo, Japan. |