Patent Application
20130135003
The present invention relates to the field of liquid crystal display, in particular to a test connector, a transmission wire, a test system, and a using method.
Thin film transistor liquid crystal displays (TFT LCD) have already become the important displaying platforms of modern IT and video products. The thin film transistor liquid crystal displays have the following main working principle: liquid crystal molecules are deflected under voltage by loading appropriate voltage between liquid crystal layers combined by an array glass substrate and a color filter (CF) glass substrate; different penetration rates can be obtained by different voltage controls to realize display.
In a TFT LCD factory, products often need to be tested and products and signal sources need to be connected by the low voltage differential signal transmission (LVDS) wire. In prior art, the connection of one end of the low voltage differential signal transmission (LVDS) wire is directly inserted into the PCB plate of a product and the other end of the LVDS wire is inserted into a signal source. When a sample is replaced and tested, the connection inserting into the PCB needs to be pulled and inserted into another sample again. Because many tests are carried out every day, the low voltage differential signal transmission (LVDS) wire needs to be inserted and pulled frequently so that the low voltage differential signal transmission (LVDS) wire often becomes invalid due to connection damage.
The aim of the present invention is to provide a test connector, a transmission wire, a test system and a using method, which can extend the service life of the low voltage differential signal transmission (LVDS) wire.
The aim of the present invention is achieved by the following technical schemes:
A test connector for a low voltage differential signal transmission wire comprises a signal wire interface matching with the low voltage differential signal transmission wire, and a PCB interface matching with a PCB plate to be tested, and the signal wire interface is electrically connected with the PCB interface.
Preferably both ends of the PCB interface are provided with through holes. The through holes provide convenience for mechanized operation and manipulators can block the through holes on both sides for pulling and inserting the test connector.
Preferably the middle part of the PCB interface is provided with a flange and the extended length of the flange is consistent with the height of a pin for the test connector connected with the PCB plate to be tested. The flange is around a pin in the flange and can prevent the pin from being polluted by outside sundries to cause loose contact or short circuit; the extended length of the flange is consistent with the height of a pin for the test connector connected with the PCB plate to be tested, and positioning can be conducted by the flange and the end faces of the PCB interface on both sides of the flange after the test connector and the PCB plate to be tested are completely connected.
Preferably the signal wire interface is provided with a groove holding the low voltage differential signal transmission wire and both sides of the groove are provided with positioning bumps; after the connection of the low voltage differential signal transmission wire is inserted into the groove, the bumps can support the connection to avoid dropping, simultaneously ensure contact strength and promote the reliability of signal connection.
The connection of a low voltage differential signal transmission wire is connected with the test connector for a low voltage differential signal transmission wire.
A low voltage differential signal test system comprises the low voltage differential signal transmission wire.
Preferably the low voltage differential signal test system comprises a power supply, one end of the low voltage differential signal transmission wire corresponding to the connection is provided with an interface and the power supply is connected with the low voltage differential signal by the interface. Interface connection provides convenience for disassembly.
A using method for the low voltage differential signal transmission wire comprises the following steps:
Step A: test whether the PCB interface of the test connector for a low voltage differential signal transmission wire is normal; if normal, the PCB interface is connected with the PCB plate to be tested and start to test normally; if abnormal, turn to Step B;
Step B: the signal wire interface of the test connector for a low voltage differential signal transmission wire is removed from the low voltage differential signal transmission wire; the signal wire interface of a new test connector for a low voltage differential signal transmission wire is connected to the low voltage differential signal transmission wire and turn to Step A.
The research of the inventor of the present invention shows that the connection of the low voltage differential signal transmission wire is directly inserted into the PCB plate to be tested. Because replacing a test sample needs inserting and pulling the low voltage differential signal transmission (LVDS) wire once, the connection of the low voltage differential signal transmission (LVDS) wire is easy to damage. Once the low voltage differential signal transmission (LVDS) connection damages, the LVDS wire becomes invalid. In the present invention, the test connector is inserted or pulled instead of the low voltage differential signal transmission (LVDS) connection; when damaged, only the test connector needs to be replaced, and the service life of the low voltage differential signal transmission (LVDS) wire is extended greatly. Because the cost of the test connector is only less than 10% of that of the LVDS wire, loss cost can be reduced.
Wherein: 1. PCB plate to be tested, 2. test connector, 3. connection, 4. wire, 5. interface, 6. power supply. 7. signal wire interface, 8. PCB interface, 81. through holes, 82. flange.
The present invention is further described by figures and the preferred embodiments as follows.
As shown in
As shown in
A using method for the low voltage differential signal transmission wire comprises the following steps:
Step A: test whether the PCB interface of the test connector for a low voltage differential signal transmission wire is normal; if normal, the PCB interface is connected with the PCB plate to be tested and start to test normally; if abnormal, turn to Step B;
Step B: the signal wire interface of the test connector for a low voltage differential signal transmission wire is removed from the low voltage differential signal transmission wire; the signal wire interface of a new test connector for a low voltage differential signal transmission wire is connected to the low voltage differential signal transmission wire and turn to Step A.
The present invention is described in detail in accordance with the above contents with the specific preferred embodiments. However, this invention is not limited to the specific embodiments. For the ordinary technical personnel of the technical field of the present invention, on the premise of keeping the concept of the present invention, the technical personnel can also make simple deductions or replacements, and all of which should be considered to belong to the protection scope of the present invention.
| Number | Date | Country | Kind |
|---|---|---|---|
| 201110386586.6 | Nov 2011 | CN | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/CN2011/083424 | 12/3/2011 | WO | 00 | 12/22/2011 |
